Abstract: Disclosed herein is a probe for detecting structural integrity of a part. The probe comprises an outer shield, having a hollow tubular shape, defining a first interior channel, and comprising a part-engagement end. The probe also comprises an inner shield, within the first interior channel, having a hollow tubular shape, spaced apart from the outer shield, and comprising a first end portion and a second end portion, opposite the first end portion. The first end portion of the inner shield is closer to the part-engagement end of the outer shield than the second end portion of the inner shield. The first end portion of the inner shield comprises a wall extension, protruding in a direction extending from the second end portion of the inner shield to the first end portion of the inner shield and circumferentially extending about less than an entire circumference of the inner shield.

Abstract: Disclosed herein is a probe for detecting structural integrity of a part. The probe comprises an outer shield, having a hollow tubular shape, defining a first interior channel, and comprising a part-engagement end. The probe also comprises an inner shield, within the first interior channel, having a hollow tubular shape, spaced apart from the outer shield, and comprising a first end portion and a second end portion, opposite the first end portion. The first end portion of the inner shield is closer to the part-engagement end of the outer shield than the second end portion of the inner shield. The first end portion of the inner shield comprises a wall extension, protruding in a direction extending from the second end portion of the inner shield to the first end portion of the inner shield and circumferentially extending about less than an entire circumference of the inner shield.

Abstract: A switching device includes a first electrode at least partially disposed within a sealed chamber. The sealed chamber encloses a plasma phase change material. The switching device includes a second electrode at least partially disposed within the sealed chamber. The second electrode is physically separated from the first electrode. When subjected to a signal that satisfies a threshold, the plasma phase change material forms a plasma within the sealed chamber. The first electrode is electrically coupled to the second electrode via the plasma when the plasma is formed. The first electrode is electrically isolated from the second electrode when the plasma is not formed. The switching device includes a first connector electrically coupled to the first electrode and a second connector electrically coupled to the second electrode. The first connector, the second connector, or both, are configured to receive the signal.

Abstract: A switching device includes a first electrode at least partially disposed within a sealed chamber. The sealed chamber encloses a plasma phase change material. The switching device includes a second electrode at least partially disposed within the sealed chamber. The second electrode is physically separated from the first electrode. When subjected to a signal that satisfies a threshold, the plasma phase change material forms a plasma within the sealed chamber. The first electrode is electrically coupled to the second electrode via the plasma when the plasma is formed. The first electrode is electrically isolated from the second electrode when the plasma is not formed. The switching device includes a first connector electrically coupled to the first electrode and a second connector electrically coupled to the second electrode. The first connector, the second connector, or both, are configured to receive the signal.

Abstract: A method of evaluating material volatility characteristics. A pulse of current flux is delivered through a material sample to simulate a lightning strike. A pressure produced by the sample during the pulse is measured. The measured pressure is used to measure volatility of the material. An apparatus for evaluating the volatility of materials includes a pulse power supply and a test cell through which a pulse is delivered and in which pressure produced by a sample during the pulse is measured. This apparatus and method can reduce the costs of material selection and can shorten development time for new products.