Abstract: A burn-in board and a method for thermally testing the burn-in board determines if the burn-in board is defective. The burn-in board includes components on a front side of the burn-in board and thermal tape on the back side of the burn-in board. Power and ground are supplied to the burn-in board and the thermal tape changes color indicating a hot spot if the burn-in board contains one or more problem areas.

Abstract: A multi-layered pin grid array interposer used in a test socket for testing and converting a package having a non-pin grid array footprint to a pin grid array footprint. The multi-layered pin grid array interposer test socket includes a multi-layered pin grid array interposer, a semiconductor device mounted on a package having a non-grid array footprint and a fastener. The multi-layered pin grid array interposer includes a top signal layer having bonding pads on an upper surface, a bottom signal layer having a pin grid array footprint on a bottom surface, at least one power layer between ground layers, the ground layers being between the top signal layer and bottom signal layer, and a links for connecting the plurality of bonding pads to the pins of the pin grid array footprint. The fastener presses the package against the multi-layered pin grid array interposer connecting the leads of the package with the bonding pads.