Abstract: A field effect transistor (FET) engager, for example, includes electrically coupling a gate driver to a gate of a FET for testing the FET. The FET engager further includes providing a probe pad for test instrument measurement of the FET without test instrument capacitance impacting operation of the FET. The FET engager can electrically couple to the gate of the FET hold the gate of the FET at a low voltage while the source and drains are stress tested. The FET engager provides fail-safe mechanisms against accidental turn-on of the FET during operation. The FET engager can provide a second probe pad for selective test instrument turn-on of a second FET. The FET engager can allow test instrument measurement of gate current of the FET without test instrument capacitance impacting operation of the FET.

Abstract: A field effect transistor (FET) engager, for example, includes electrically coupling a gate driver to a gate of a FET for testing the FET. The FET engager further includes providing a probe pad for test instrument measurement of the FET without test instrument capacitance impacting operation of the FET. The FET engager can electrically couple to the gate of the FET hold the gate of the FET at a low voltage while the source and drains are stress tested. The FET engager provides fail-safe mechanisms against accidental turn-on of the FET during operation. The FET engager can provide a second probe pad for selective test instrument turn-on of a second FET. The FET engager can allow test instrument measurement of gate current of the FET without test instrument capacitance impacting operation of the FET.

Abstract: A testing system includes: a substrate having a probe pad and having a supply input; driver circuitry having a driver output; a transistor having a gate, a source, and a drain; and a field effect transistor (FET) engager. The gate of the transistor is coupled to the driver output, and the drain of the transistor is coupled to the supply input. The FET engager is configured to couple the probe pad to the gate of the transistor and provide test instrument measurement of gate current of the transistor without test instrument probe capacitance impacting operation of the transistor.

Abstract: A field effect transistor (FET) engager, for example, includes electrically coupling a gate driver to a gate of a FET for testing the FET. The FET engager further includes providing a probe pad for test instrument measurement of the FET without test instrument capacitance impacting operation of the FET. The FET engager can electrically couple to the gate of the FET hold the gate of the FET at a low voltage while the source and drains are stress tested. The FET engager provides fail-safe mechanisms against accidental turn-on of the FET during operation. The FET engager can provide a second probe pad for selective test instrument turn-on of a second FET. The FET engager can allow test instrument measurement of gate current of the FET without test instrument capacitance impacting operation of the FET.

Abstract: A field effect transistor (FET) engager, for example, includes electrically coupling a gate driver to a gate of a FET for testing the FET. The FET engager further includes providing a probe pad for test instrument measurement of the FET without test instrument capacitance impacting operation of the FET. The FET engager can electrically couple to the gate of the FET hold the gate of the FET at a low voltage while the source and drains are stress tested. The FET engager provides fail-safe mechanisms against accidental turn-on of the FET during operation. The FET engager can provide a second probe pad for selective test instrument turn-on of a second FET. The FET engager can allow test instrument measurement of gate current of the FET without test instrument capacitance impacting operation of the FET.

Abstract: A DPI circuit reduces noise effects in an ESD circuit when coupled between an ESD circuit and a protected pin. The DPI circuit includes an NMOS transistor coupled between an output node and a lower rail and a charge pump coupled between the input node and the gate of the first NMOS transistor. A resistor is coupled between the gate of the first NMOS transistor and the lower rail.

Abstract: A field effect transistor (FET) engager, for example, includes electrically coupling a gate driver to a gate of a FET for testing the FET. The FET engager further includes providing a probe pad for test instrument measurement of the FET without test instrument capacitance impacting operation of the FET. The FET engager can electrically couple to the gate of the FET hold the gate of the FET at a low voltage while the source and drains are stress tested. The FET engager provides fail-safe mechanisms against accidental turn-on of the FET during operation. The FET engager can provide a second probe pad for selective test instrument turn-on of a second FET. The FET engager can allow test instrument measurement of gate current of the FET without test instrument capacitance impacting operation of the FET.

Abstract: A thermal shutdown circuit for protecting a main FET that conducts a load current ILOAD. A reference circuit provides a temperature current proportional to temperature. A thermal sensor circuit has a resistor and generates an output signal signaling thermal shutdown when the voltage generated across the resistor by the temperature current exceeds a predetermined value. A sense FET having a size smaller than the main FET conducts a sense current ISENSE proportionately smaller than ILOAD. A current mirror mirrors a scaled current proportional to ISENSE to be conducted through the resistor, the scaled current being scaled so as to cause the voltage generated across the resistor to exceed the predetermined value when ILOAD exceeds a predetermined value.