Patents by Inventor Benjamin P. Bayer

Benjamin P. Bayer has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8101093
    Abstract: The invention provides methods of polishing a noble metal-containing substrate with one of two chemical-mechanical polishing compositions. The first chemical-mechanical polishing composition comprises (a) an abrasive comprising ?-alumina, (b) about 0.05 to about 50 mmol/kg of ions of calcium, strontium, barium, or mixtures thereof, and (c) a liquid carrier comprising water. The second chemical-mechanical polishing composition comprises (a) an abrasive selected from the group consisting of ?-alumina, ?-alumina, ?-alumina, ?-alumina, diamond, boron carbide, silicon carbide, tungsten carbide, titanium nitride, and mixtures thereof, (b) about 0.05 to about 3.5 mmol/kg of ions of calcium, strontium, barium, magnesium, zinc, or mixtures thereof, and (c) a liquid carrier comprising water.
    Type: Grant
    Filed: February 26, 2009
    Date of Patent: January 24, 2012
    Assignee: Cabot Microelectronics Corporation
    Inventors: Francesco de Rege Thesauro, Kevin J. Moeggenborg, Vlasta Brusic, Benjamin P. Bayer
  • Patent number: 7563383
    Abstract: The invention provides a method of polishing a substrate comprising contacting a substrate comprising a noble metal on a surface of the substrate with a chemical-mechanical polishing system comprising (a) a polishing component selected from the group consisting of an abrasive, a polishing pad, and a combination thereof, (b) an oxidizing agent, (c) an ethylene-oxide containing polymer, and (d) a liquid carrier, and abrading at least a portion of the noble metal with the chemical-mechanical polishing system to polish the substrate.
    Type: Grant
    Filed: October 12, 2004
    Date of Patent: July 21, 2009
    Assignee: Cabot Mircroelectronics Corporation
    Inventors: Francesco de Rege Thesauro, Benjamin P. Bayer
  • Publication number: 20090152240
    Abstract: The invention provides methods of polishing a noble metal-containing substrate with one of two chemical-mechanical polishing compositions. The first chemical-mechanical polishing composition comprises (a) an abrasive comprising ?-alumina, (b) about 0.05 to about 50 mmol/kg of ions of calcium, strontium, barium, or mixtures thereof, and (c) a liquid carrier comprising water. The second chemical-mechanical polishing composition comprises (a) an abrasive selected from the group consisting of ?-alumina, ?-alumina, ?-alumina, ?-alumina, diamond, boron carbide, silicon carbide, tungsten carbide, titanium nitride, and mixtures thereof, (b) about 0.05 to about 3.5 mmol/kg of ions of calcium, strontium, barium, magnesium, zinc, or mixtures thereof, and (c) a liquid carrier comprising water.
    Type: Application
    Filed: February 26, 2009
    Publication date: June 18, 2009
    Applicant: Cabot Microelectronics Corporation
    Inventors: Francesco de Rege Thesauro, Kevin J. Moeggenborg, Vlasta Brusic, Benjamin P. Bayer
  • Patent number: 7288021
    Abstract: The invention provides a method for polishing a substrate comprising a metal in an oxidized form, the method comprising the steps of: (a) providing a substrate comprising a metal in an oxidized form, (b) contacting a portion of the substrate with a chemical-mechanical polishing system comprising: (i) a polishing component, (ii) a reducing agent, and (iii) a liquid carrier, and (c) abrading at least a portion of the metal in an oxidized form to polish the substrate. The reducing agent can be selected from the group consisting of 3-hydroxy-4-pyrones, ?-hydroxy-?-butyrolactones, ascorbic acid, borane, borohydrides, dialkylamine boranes, formaldehyde, formic acid, hydrogen, hydroquinones, hydroxylamine, hypophosphorous acid, phosphorous acid, a metal or metal ions in an oxidation state having a standard redox potential that is less than the standard redox potential of the metal in an oxidized form, trihydroxybenzenes, solvated electrons, sulfurous acid, salts thereof, and mixtures thereof.
    Type: Grant
    Filed: January 7, 2004
    Date of Patent: October 30, 2007
    Assignee: Cabot Microelectronics Corporation
    Inventors: Francesco De Rege Thesauro, Vlasta Brusic, Benjamin P. Bayer
  • Patent number: 7160807
    Abstract: The invention provides a method of polishing a substrate comprising (i) contacting a substrate comprising a noble metal layer with a chemical-mechanical polishing system comprising (a) a polishing component, (b) an oxidizing agent, and (c) a liquid carrier, and (ii) abrading at least a portion of the noble metal layer to polish the substrate. The polishing component is selected from the group consisting of an abrasive, a polishing pad, or a combination thereof, and the oxidizing agent is selected from the group consisting of bromates, bromites, hypobromites, chlorates, chlorites, hypochlorites, perchlorates, iodates, hypoiodites, periodates, peroxyacetic acid, organo-halo-oxy compounds, salts thereof, and combinations thereof. The chemical-mechanical polishing system has a pH of about 9 or less, and the oxidizing agent does not produce a substantial amount of elemental halogen.
    Type: Grant
    Filed: June 30, 2003
    Date of Patent: January 9, 2007
    Assignee: Cabot Microelectronics Corporation
    Inventors: Francesco De Rege Thesauro, Vlasta Brusic, Benjamin P. Bayer
  • Patent number: 7161247
    Abstract: The invention provides a polishing composition and a method of chemically-mechanically polishing a substrate comprising a noble metal, the polishing composition comprising (a) an oxidizing agent that oxidizes a noble metal, (b) an anion selected from the group consisting of sulfate, borate, nitrate, and phosphate, and (c) a liquid carrier. The invention further provides a polishing composition and a method of chemically-mechanically polishing a substrate comprising ruthenium, the polishing composition comprising (a) an oxidizing agent that oxidizes ruthenium above the +4 oxidation state, (b) a polishing additive selected from the group consisting of metal sequestering polymers, metal chelators, organic thiols, compounds that reduce ruthenium tetraoxide, lactones, and ?-hydroxycarbonyl compounds.
    Type: Grant
    Filed: July 28, 2004
    Date of Patent: January 9, 2007
    Assignee: Cabot Microelectronics Corporation
    Inventors: Francesco De Rege Thesauro, Vlasta Brusic, Christopher C. Thompson, Benjamin P. Bayer
  • Patent number: 7097541
    Abstract: The invention provides a method of polishing a substrate comprising a noble metal comprising (i) contacting the substrate with a CMP system and (ii) abrading at least a portion of the substrate to polish the substrate. The CMP system comprises an abrasive and/or polishing pad, a liquid carrier, and a sulfonic acid compound.
    Type: Grant
    Filed: February 27, 2003
    Date of Patent: August 29, 2006
    Assignee: Cabot Microelectronics Corporation
    Inventors: Francesco DeRege Thesauro, Vlasta Brusic, Benjamin P. Bayer
  • Publication number: 20040266196
    Abstract: The invention provides a method of polishing a substrate comprising (i) contacting a substrate comprising a noble metal layer with a chemical-mechanical polishing system comprising (a) a polishing component, (b) an oxidizing agent, and (c) a liquid carrier, and (ii) abrading at least a portion of the noble metal layer to polish the substrate. The polishing component is selected from the group consisting of an abrasive, a polishing pad, or a combination thereof, and the oxidizing agent is selected from the group consisting of bromates, bromites, hypobromites, chlorates, chlorites, hypochlorites, perchlorates, iodates, hypoiodites, periodates, peroxyacetic acid, organo-halo-oxy compounds, salts thereof, and combinations thereof. The chemical-mechanical polishing system has a pH of about 9 or less, and the oxidizing agent does not produce a substantial amount of elemental halogen.
    Type: Application
    Filed: June 30, 2003
    Publication date: December 30, 2004
    Applicant: Cabot Microelectronics Corporation
    Inventors: Francesco De Rege Thesauro, Vlasta Brusic, Benjamin P. Bayer
  • Publication number: 20030181142
    Abstract: The invention provides a method of polishing a substrate comprising a noble metal comprising (i) contacting the substrate with a CMP system and (ii) abrading at least a portion of the substrate to polish the substrate. The CMP system comprises an abrasive and/or polishing pad, a liquid carrier, and a sulfonic acid compound.
    Type: Application
    Filed: February 27, 2003
    Publication date: September 25, 2003
    Applicant: Cabot Microelectronics Corporation
    Inventors: Francesco De Rege Thesauro, Vlasta Brusic, Benjamin P. Bayer