Abstract: A multipurpose spacer having a spacer body with a ground lead, an inner electrical connection, and an outer electrical connection. The multipurpose spacer provides grounding, securing, and low thermal conductivity advantages. The multipurpose spacer is mounted and connected in an assembly in high-frequency electronics testing devices. The multipurpose spacer provides a substantial reduction in error signal modulation bandwidth and improved high-frequency performance.

Abstract: A probe head with a cylindrical portion and an oblique truncated portion angled downward toward a high-powered electronic device under testing. The probe head has a proximal end comprising an oblique truncated cone portion angled relative to the longitudinal axis at an input angle and has an analog signal input. The probe head has a digital signal output provided on the distal end of the housing.