Patents by Inventor Benoit PERRON

Benoit PERRON has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9080844
    Abstract: There is provided a method for analyzing at least one object under a first microscope and a second microscope concurrently by linking the two microscopes together. Movement of one microscope will result in movement of the other. This is done by computing a transformation to link a first coordinate system and a second coordinate system and generating guidance data when one of the two microscopes is displaced, the guidance data corresponding to a set of operations to be applied to the other microscope to follow movement of the microscope that is displaced.
    Type: Grant
    Filed: May 2, 2011
    Date of Patent: July 14, 2015
    Assignee: ULTRA ELECTRONICS FORENSIC TECHNOLOGY INC.
    Inventors: Alain Beauchamp, Danny Roberge, Benoit Perron
  • Patent number: 8817016
    Abstract: There is provided a method for generating a 3D representation of an object, comprising: acquiring 3D topographic data representative of at least one portion of the object having a macroscopic form and microscopic features; separating the 3D topographic data into microscopic data representative of the microscopic features and macroscopic data representative of the macroscopic form; independently scaling one of the microscopic data and the macroscopic data in order to enhance the microscopic features with respect to the macroscopic form, thereby obtaining scaled topographic data; and generating a 3D image using the scaled topographic data, thereby obtaining a modified representation having enhanced microscopic features for the at least one portion of the object.
    Type: Grant
    Filed: April 6, 2011
    Date of Patent: August 26, 2014
    Assignee: Forensic Technology WAI, Inc.
    Inventors: Alain Beauchamp, Danny Roberge, Benoit Perron
  • Publication number: 20110286090
    Abstract: There is provided a method for analyzing at least one object under a first microscope and a second microscope concurrently by linking the two microscopes together. Movement of one microscope will result in movement of the other. This is done by computing a transformation to link a first coordinate system and a second coordinate system and generating guidance data when one of the two microscopes is displaced, the guidance data corresponding to a set of operations to be applied to the other microscope to follow movement of the microscope that is displaced.
    Type: Application
    Filed: May 2, 2011
    Publication date: November 24, 2011
    Applicant: FORENSIC TECHNOLOGY WAI INC.
    Inventors: Alain BEAUCHAMP, Danny ROBERGE, BenoƮt PERRON
  • Publication number: 20110248990
    Abstract: There is provided a method for generating a 3D representation of an object, comprising: acquiring 3D topographic data representative of at least one portion of the object having a macroscopic form and microscopic features; separating the 3D topographic data into microscopic data representative of the microscopic features and macroscopic data representative of the macroscopic form; independently scaling one of the microscopic data and the macroscopic data in order to enhance the microscopic features with respect to the macroscopic form, thereby obtaining scaled topographic data; and generating a 3D image using the scaled topographic data, thereby obtaining a modified representation having enhanced microscopic features for the at least one portion of the object.
    Type: Application
    Filed: April 6, 2011
    Publication date: October 13, 2011
    Inventors: Alain BEAUCHAMP, Danny ROBERGE, Benoit PERRON