Patents by Inventor Bernabe J. Arruza
Bernabe J. Arruza has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 10384238Abstract: A debris collection and metrology system for collecting and analyzing debris from a tip used in nanomachining processes, the system including an irradiation source, an irradiation detector, an actuator, and a controller. The irradiation source is operable to direct incident irradiation onto the tip, and the irradiation detector is operable to receive a sample irradiation from the tip, the sample irradiation being generated as a result of the direct incident irradiation being applied onto the tip. The controller is operatively coupled to an actuator system and the irradiation detector, and the controller is operable to receive a first signal based on a first response of the irradiation detector to the sample irradiation, and the controller is operable to effect relative motion between the tip and at least one of the irradiation source and the irradiation detector based on the first signal.Type: GrantFiled: May 20, 2016Date of Patent: August 20, 2019Assignee: RAVE LLCInventors: Tod Evan Robinson, Bernabe J. Arruza, Kenneth Gilbert Roessler, David Brinkley, Jeffrey E. Leclaire
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Patent number: 10330581Abstract: A debris collection and metrology system for collecting and analyzing debris from a tip used in nanomachining processes, the system including an irradiation source, an irradiation detector, an actuator, and a controller. The irradiation source is operable to direct incident irradiation onto the tip, and the irradiation detector is operable to receive a sample irradiation from the tip, the sample irradiation being generated as a result of the direct incident irradiation being applied onto the tip. The controller is operatively coupled to an actuator system and the irradiation detector, and the controller is operable to receive a first signal based on a first response of the irradiation detector to the sample irradiation, and the controller is operable to effect relative motion between the tip and at least one of the irradiation source and the irradiation detector based on the first signal.Type: GrantFiled: May 20, 2016Date of Patent: June 25, 2019Assignee: RAVE LLCInventors: Tod Evan Robinson, Bernabe J. Arruza, Kenneth Gilbert Roessler, David Brinkley, Jeffrey E. Leclaire
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Publication number: 20160263632Abstract: A debris collection and metrology system for collecting and analyzing debris from a tip used in nanomachining processes, the system including an irradiation source, an irradiation detector, an actuator, and a controller. The irradiation source is operable to direct incident irradiation onto the tip, and the irradiation detector is operable to receive a sample irradiation from the tip, the sample irradiation being generated as a result of the direct incident irradiation being applied onto the tip. The controller is operatively coupled to an actuator system and the irradiation detector, and the controller is operable to receive a first signal based on a first response of the irradiation detector to the sample irradiation, and the controller is operable to effect relative motion between the tip and at least one of the irradiation source and the irradiation detector based on the first signal.Type: ApplicationFiled: May 20, 2016Publication date: September 15, 2016Inventors: TOD EVAN ROBINSON, BERNABE J. ARRUZA, KENNETH GILBERT ROESSLER, DAVID BRINKLEY, JEFFREY E. LECLAIRE
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Publication number: 20160266165Abstract: A debris collection and metrology system for collecting and analyzing debris from a tip used in nanomachining processes, the system including an irradiation source, an irradiation detector, an actuator, and a controller. The irradiation source is operable to direct incident irradiation onto the tip, and the irradiation detector is operable to receive a sample irradiation from the tip, the sample irradiation being generated as a result of the direct incident irradiation being applied onto the tip. The controller is operatively coupled to an actuator system and the irradiation detector, and the controller is operable to receive a first signal based on a first response of the irradiation detector to the sample irradiation, and the controller is operable to effect relative motion between the tip and at least one of the irradiation source and the irradiation detector based on the first signal.Type: ApplicationFiled: May 20, 2016Publication date: September 15, 2016Inventors: TOD EVAN ROBINSON, BERNABE J. ARRUZA, KENNETH GILBERT ROESSLER, DAVID BRINKLEY, JEFFREY E. LECLAIRE
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Publication number: 20140176922Abstract: A system for removing debris from a surface of a photolithographic mask is provided. The system includes an atomic force microscope with a tip supported by a cantilever. The tip includes a surface and a nanometer-scaled coating disposed thereon. The coating has a surface energy lower than the surface energy of the photolithographic mask.Type: ApplicationFiled: February 28, 2014Publication date: June 26, 2014Inventors: Tod Evan Robinson, Bernabe J. Arruza, Kenneth Gilbert Roessler
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Patent number: 8696818Abstract: A system for removing debris from a surface of a photolithographic mask is provided. The system includes an atomic force microscope with a tip supported by a cantilever. The tip includes a surface and a nanometer-scaled coating disposed thereon. The coating has a surface energy lower than the surface energy of the photolithographic mask.Type: GrantFiled: October 15, 2012Date of Patent: April 15, 2014Assignee: Rave LLCInventors: Tod Evan Robinson, Bernabe J. Arruza, Kenneth Gilbert Roessler
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Patent number: 8287653Abstract: A method of debris removal is provided. The method includes positioning a nanometer-scaled tip adjacent to a piece of debris on a substrate. The method also includes adhering the piece of debris to the tip. In addition, the method also includes removing the piece of debris from the substrate by moving the tip away from the substrate.Type: GrantFiled: September 17, 2007Date of Patent: October 16, 2012Assignee: Rave, LLCInventors: Tod Evan Robinson, Bernabe J. Arruza, Kenneth Gilbert Roessler
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Patent number: 7829360Abstract: A method of nanomachining is provided. The method includes plunging a nanometer-scaled tip into a surface of a substrate at a first location in a first direction that is substantially perpendicular to the surface, thereby displacing a first portion of the substrate with the tip. The method also includes withdrawing the tip from the substrate in a second direction that is substantially opposite to the first direction. The method further includes moving at least one of the tip and the substrate laterally relative to each other. In addition, the method also includes plunging the tip into the substrate at a second location in a third direction that is substantially parallel to the first direction, thereby displacing a second portion of the substrate with the tip and withdrawing the tip from the substrate in a fourth direction that is substantially opposite to the third direction.Type: GrantFiled: September 17, 2007Date of Patent: November 9, 2010Assignee: Rave, LLCInventors: Bernabe J. Arruza, Ronald Bozak, Kenneth Gilbert Roessler, Andrew Dinsdale, Tod Evan Robinson, David Brinkley
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Publication number: 20090070979Abstract: A method of nanomachining is provided. The method includes plunging a nanometer-scaled tip into a surface of a substrate at a first location in a first direction that is substantially perpendicular to the surface, thereby displacing a first portion of the substrate with the tip. The method also includes withdrawing the tip from the substrate in a second direction that is substantially opposite to the first direction. The method further includes moving at least one of the tip and the substrate laterally relative to each other. In addition, the method also includes plunging the tip into the substrate at a second location in a third direction that is substantially parallel to the first direction, thereby displacing a second portion of the substrate with the tip and withdrawing the tip from the substrate in a fourth direction that is substantially opposite to the third direction.Type: ApplicationFiled: September 17, 2007Publication date: March 19, 2009Inventors: Bernabe J. Arruza, Ronald Bozak, Kenneth Gilbert Roessler, Andrew Dinsdale, Tod Evan Robinson, David Brinkley
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Publication number: 20090071506Abstract: A method of debris removal is provided. The method includes positioning a nanometer-scaled tip adjacent to a piece of debris on a substrate. The method also includes adhering the piece of debris to the tip. In addition, the method also includes removing the piece of debris from the substrate by moving the tip away from the substrate.Type: ApplicationFiled: September 17, 2007Publication date: March 19, 2009Inventors: Tod Evan Robinson, Bernabe J. Arruza, Kenneth Gilbert Roessler
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Patent number: 5838316Abstract: A computer program product for presenting animated display objects to a user for selection on a graphical user interface of a data processing system is provided. A plurality of animated display objects are simultaneously displayed by a graphical user interface on a display device of the data processing system, thus allowing the user to view all of the plurality of animated display objects and make a selection of one of the plurality of animated display objects. One of the displayed animated display objects is selected, and a multimedia presentation associated with the selected animated display object is played.Type: GrantFiled: January 26, 1996Date of Patent: November 17, 1998Assignee: International Business Machines CorporationInventor: Bernabe J. Arruza