Abstract: An ion source is described, including a source of neutral particles which arrive at an ionization support positioned inside a chamber which is closed by a cap and which includes lateral walls. The cap includes an outlet orifice opposite which a plate defines a main ionization active surface. An electric field is applied between said device and by an electrode place downstream from the orifice in the direction of ion emission and fitted with a corresponding opening. Overall, the ionization support defines, by virtue of its active surface, and by virtue of holes surrounding said central active surface, a baffle assembly which prevents neutral atoms from passing directly to the outlet orifice, and which contributes to a high degree of ionization.

Abstract: A sample (EC) is mounted on a sample carrier (PO). Vertically thereabove a common optical portion (5) receives a beam of primary ions derived from an ion source (S10) together with a beam of primary electrons derived from an electron source (S30). The secondary electrons and ions due to the sample (EC) being bombarded by said primary ions and electrons are retrieved by said common optical portion (5). The electrons are detected by electron detection means (D40). The secondary optical system (2) transmits the secondary ions to a mass spectrometer (SP20). This instrument is capable of providing ion and electron images of a single sample simultaneously.

Abstract: Between the electrostatic sector (SE 23) and the magnetic sector (SM 30) of a mass spectrometer, there is provided a quadrupole (QP 26) which applies parallel beams to the magnetic sector whose inclination depends on the energy dispersion of the particles. A slotted lens (LF 27) corrects the divergence of the quadrupole in the perpendicular plane. A suitable relationship between the angle of the inlet face of the magnetic sector (SM 30) and the deflection angle provided thereby ensures that the second order aperture aberrations of the magnetic sector are corrected. The chromatic aberrations may be corrected by means of a hexapole (HP 25) centered on the focus of the quadrupole (QP 26). Another hexapole (HP 22) placed upstream from the electrostatic sector (SE 23) level with a constriction in vertical section of the particle beam serves to correct second order aperture aberrations related to the electrostatic sector (SE 23).

Abstract: A spectrograph usable more particularly in the far ultraviolet range. It comprises along the Rowland circle measuring blocks including photo-detectors. Said measuring blocks are movably mounted along a guiding rail materializing the Rowland circle. Motion means are provided for the displacement of the various measuring blocks along the guiding rail. Transmission means between the motion means and a measuring block constantly direct the latter towards the diffraction grating.

Abstract: An in vacuo spark generator for the spectral analysis in the ultraviolet of a sample acting as an anode, with a coaxial annular cathode cooperating with the anode and an electrode for the formation of initiation sparks the operative portion of which is disposed opposite the outer side surface of the cathode and set back relative the frontal face of the cathode, the cathode frontal face being rounded and the opposite portions of the cathode and the initiation electrode being provided each with removable snap-rings slightly protruding relative to the body of the cathode and initiation electrode; said snap-rings are housed in a semicircular groove provided in the body of the cathode and the initiation electrode.