Patents by Inventor Bernard Deconihout

Bernard Deconihout has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8247766
    Abstract: A wide spectral band laser pulse generating device capable of covering a spectrum formed of given wavelengths is provided, including: a monochromatic laser light source whose intensity is adjustable; non-linear optical means, a photonic crystal or a microstructured optical fiber for example, for carrying out spectral widening of the wave emitted by the light source; the light source and the non-linear optical means are configured and arranged so as to create a white supercontinuum whose continuous spectrum contains the wavelengths considered. The invention relates to the general field of the analysis of the composition of material specimens, and in particular to laser tomographic atom probes.
    Type: Grant
    Filed: June 9, 2009
    Date of Patent: August 21, 2012
    Assignees: Cameca, Centre National de la Recherche Scientifique (CNRS)
    Inventors: Bernard Deconihout, François Vurpillot, Angela Vella
  • Patent number: 8074292
    Abstract: The present invention concerns the enhancing of the mass resolution of wide angle tomographic atom probes. The invention consists of an atom probe also comprising a sample-holding device and a detector which are separated from one another by a distance L and enclosed in a chamber, an “Einzel” type electrostatic lens consisting of three electrodes arranged inside the chamber between the sample and the detector, to which electrical potentials are applied so as to form an electrical field that strongly focuses the beam of ions emitted by the sample under test when the probe is operating. According to the invention, the geometry of the electrodes is defined precisely so as to greatly limit the effects of the spherical aberration that affects the “Einzel” lens on the beam of ions, said spherical aberration being clearly sensitive when the lens is greatly polarized. The invention applies more particularly to the atom probes known as 3D atom probes.
    Type: Grant
    Filed: October 8, 2008
    Date of Patent: December 6, 2011
    Assignee: Cameca
    Inventors: Alain Bostel, Mikhail Yavor, Ludovic Renaud, Bernard Deconihout
  • Publication number: 20110210245
    Abstract: A wide spectral band laser pulse generating device capable of covering a spectrum formed of given wavelengths is provided, including: a monochromatic laser light source whose intensity is adjustable; non-linear optical means, a photonic crystal or a microstructured optical fiber for example, for carrying out spectral widening of the wave emitted by the light source; the light source and the non-linear optical means are configured and arranged so as to create a white supercontinuum whose continuous spectrum contains the wavelengths considered. The invention relates to the general field of the analysis of the composition of material specimens, and in particular to laser tomographic atom probes.
    Type: Application
    Filed: June 9, 2009
    Publication date: September 1, 2011
    Applicants: CAMECA, CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE
    Inventors: Bernard Deconihout, François Vurpillot, Angela Vella
  • Publication number: 20100223698
    Abstract: The present invention concerns the enhancing of the mass resolution of wide angle tomographic atom probes. The invention consists of an atom probe also comprising a sample-holding device and a detector which are separated from one another by a distance L and enclosed in a chamber, an “Einzel” type electrostatic lens consisting of three electrodes arranged inside the chamber between the sample and the detector, to which electrical potentials are applied so as to form an electrical field that strongly focuses the beam of ions emitted by the sample under test when the probe is operating. According to the invention, the geometry of the electrodes is defined precisely so as to greatly limit the effects of the spherical aberration that affects the “Einzel” lens on the beam of ions, said spherical aberration being clearly sensitive when the lens is greatly polarized. The invention applies more particularly to the atom probes known as 3D atom probes.
    Type: Application
    Filed: October 8, 2008
    Publication date: September 2, 2010
    Applicants: CAMECA, CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE
    Inventors: Alain Bostel, Mikhail Yavor, Ludovic Renaud, Bernard Deconihout
  • Patent number: 5969361
    Abstract: This detector comprises electron multiplication means (14) producing a cluster of electrons under the impact of each particle (2), a layer (6) that this cluster passes through, and which emits a light pulse by interaction with the layer, and transparent electron detection means (8) capable of determining the moment of impact of the particle and supplying information about the impact positions for each moment thus determined, so that these positions can be determined and correlated with the moments determined by the detection means.
    Type: Grant
    Filed: February 11, 1998
    Date of Patent: October 19, 1999
    Assignee: Centre National de la Recherche Scientifique
    Inventors: Didier Blavette, Alain Bostel, Bernard Deconihout