Abstract: An insulating glazing unit includes at least one spacer, which is shaped around the periphery to produce a spacer frame and delimits an inner region, a first glass pane, which is arranged on a first pane contact surface of the spacer frame, and a second glass pane, which is arranged on a second pane contact surface of the spacer frame, and the glass panes project beyond the spacer frame and an outer region is formed, which is filled at least in some sections, with a sealing element, wherein at least one RFID transponder is arranged in the outer region or in the outer edge region of the glass panes, and the RFID transponder contains a slot antenna.

Abstract: A method for determining scattering parameters using a calibration substrate having at least one calibration standard with at least two electrical connection points, each for one measurement gate of a vector network analyzer. At least one electrical connection point is formed of at least one calibration standard having a switch, wherein the switch has a first electrical contact electrically connected to an electrical connection point of the calibration standard, a second electrical contact designed for electrically connecting to a measurement gate of the vector network analyzer, and a third electrical contact, wherein the switch is designed such that an electrical contact is established either between the first and third electrical contact or between the first and second electrical contact.

Abstract: A measuring system for determining scatter parameters of an electrical measurement object on a substrate, having a measuring machine having at least one measuring channel and at least one measuring probe electrically connected to at least one measuring channel and designed for non-contacting or contacting connection to an electrical signal line of the electrical measurement in the electronic circuit. A first positioning device is provided for at least one measuring probe, wherein at least one sensor detects a position of at least one measuring probe and outputs a position signal.

Abstract: The invention relates to a contactless loop probe for the contactless decoupling of an HF signal for a contactless measuring system, comprising at least one coupling structure (10) and at least one first signal conductor (12) electrically connected to the coupling structure (10) by a first transition (20), said signal conductor being electrically connected by a second transition (22) to an output (14) for electrically connecting to the measuring system, wherein the coupling structure (10) is designed as an HF waveguide comprising at least one signal conductor (24; 30) and at least one reference conductor (26; 32).

Abstract: A method for determining scattering parameters using a calibration substrate having at least one calibration standard with at least two electrical connection points, each for one measurement gate of a vector network analyzer. At least one electrical connection point is formed of at least one calibration standard having a switch, wherein the switch has a first electrical contact electrically connected to an electrical connection point of the calibration standard, a second electrical contact designed for electrically connecting to a measurement gate of the vector network analyzer, and a third electrical contact, wherein the switch is designed such that an electrical contact is established either between the first and third electrical contact or between the first and second electrical contact.

Abstract: A calibration substrate having at least one calibration standard with at least two electrical connection points, each for one measurement gate of a vector network analyzer. At least one electrical connection point is formed of at least one calibration standard having a switch, wherein the switch has a first electrical contact electrically connected to an electrical connection point of the calibration standard, a second electrical contact designed for electrically connecting to a measurement gate of the vector network analyzer, and a third electrical contact, wherein the switch is designed such that an electrical contact is established either between the first and third electrical contact or between the first and second electrical contact.

Abstract: A measuring probe, particularly for a non-contacting vector network analysis system, having a housing and at least one coupling structure disposed on the housing and designed for coupling an HF signal from a signal line, such that at least one additional signal probe is disposed on the housing for coupling an electrical signal into the signal line.

Abstract: The invention relates to a contactless loop probe for the contactless decoupling of an HF signal for a contactless measuring system, comprising at least one coupling structure (10) and at least one first signal conductor (12) electrically connected to the coupling structure (10) by a first transition (20), said signal conductor being electrically connected by a second transition (22) to an output (14) for electrically connecting to the measuring system, wherein the coupling structure (10) is designed as an HF waveguide comprising at least one signal conductor (24; 30) and at least one reference conductor (26; 32).

Abstract: A calibration substrate having at least one calibration standard with at least two electrical connection points, each for one measurement gate of a vector network analyzer. At least one electrical connection point is formed of at least one calibration standard having a switch, wherein the switch has a first electrical contact electrically connected to an electrical connection point of the calibration standard, a second electrical contact designed for electrically connecting to a measurement gate of the vector network analyzer, and a third electrical contact, wherein the switch is designed such that an electrical contact is established either between the first and third electrical contact or between the first and second electrical contact.

Abstract: A measuring system for determining scatter parameters of an electrical measurement object on a substrate, having a measuring machine having at least one measuring channel and at least one measuring probe electrically connected to at least one measuring channel and designed for non-contacting or contacting connection to an electrical signal line of the electrical measurement in the electronic circuit. A first positioning device is provided for at least one measuring probe, wherein at least one sensor detects a position of at least one measuring probe and outputs a position signal.

Abstract: A measuring probe, particularly for a non-contacting vector network analysis system, having a housing and at least one coupling structure disposed on the housing and designed for coupling an HF signal from a signal line, such that at least one additional signal probe is disposed on the housing for coupling an electrical signal into the signal line.

Abstract: It is an object of the present invention to provide a high-quality printed image in a printing machine. To achieve this, a method for adjusting a fusing device 100 of a digital printing machine has been provided, in which case microwave signals of a specific frequency or frequency range are directed at a printing material 5, a change between the microwave signals reflected by the printing material and the emitted microwave signals is detected, and in which case the fusing device is adjusted based on the change between said microwave signals. Furthermore, a measuring device 20 for a printing machine is provided, said device preferably being used for carrying out the said method, whereby the measuring device is configured so as to detect a change between a microwave signal reflected by the printing material 5 and a microwave signal directed at said printing material.

Abstract: It is an object of the present invention to provide a high-quality printed image in a printing machine. To achieve this, a method for adjusting a fusing device 100 of a digital printing machine has been provided, in which case microwave signals of a specific frequency or frequency range are directed at a printing material 5, a change between the microwave signals reflected by the printing material and the emitted microwave signals is detected, and in which case the fusing device is adjusted based on the change between said microwave signals. Furthermore, a measuring device 20 for a printing machine is provided, said device preferably being used for carrying out the said method, whereby the measuring device is configured so as to detect a change between a microwave signal reflected by the printing material 5 and a microwave signal directed at said printing material.