Abstract: In a film projection system which contains a light source which emits a large amount of radiant energy and has means for advancing the film through a gate, there is a new and improved shutter comprising a high temperature rated, transmissive substrate having at least one area having a cold mirror coating affixed thereto and a second area with a hot mirror coating affixed thereto such that when the shutter rotates within the projector, the shutter area containing the cold mirror coating is placed in front of the light source when the film is moving through the gate and the shutter area containing the hot mirror coating is placed in front of the light source when the film is located within the gate, such that the thermal deformation of the film caused by the variations in the energy between the time the film is exposed and the time when the film is moving through the gate is minimized.

Abstract: The present invention is a system and method to quickly and accurately measure the luminance and luminance distribution of a light on the surface of an object so that the position of the lamp can be adjusted relative to the projector optics to obtain the best luminance available for that object. A scanning light receiver, which produces an optical image of the object whose luminance is to be tested, is set up so that it may view a substantial portion of the surface of the object. The light receiver is connected to a analyzer and control unit ("ACU") to which it sends an electronic image representing the reflected luminance of the surface during each scan. The reflected light that is detected by the light receiver is then analyzed by the ACU to determine the luminance levels and distribution across a substantial portion of the surface by measuring the voltage of each pixel detected by the light receiver measured against the voltage produced by a black level.