Abstract: A system and method for preparing epoxy chloropropane is provided in that by coupling three stages of high gravity reactors, the product epoxy chloropropane and water vapor are distilled from a reaction system in form of an azeotrope by adopting a water vapor steam stripping method. Further, by combining the azeotrope with the multiples stages of high gravity reactors, the gas phase mass transfer and the liquid phase mass transfer of the azeotrope are improved aiming at the features of the azeotrope in the reaction system, thus making the overall conversion rate higher. In addition, by combining steam stripping and high gravity, dichloropropanol and alkali solution are rapidly mixed for mass transfer, and the product epoxy chloropropane is rapidly distilled from the reaction system in the form of the azeotrope, such that the reaction proceeds continuously towards the direction of producing epoxy chloropropane, thus significantly improving the conversion rate.

Abstract: A CPU-based system 10 and method for testing embedded memory. The technique employs the on-chip CPU 20 itself to test the embedded memory 24. An assembly code program is loaded into the device under test (DUT) 12 to test the memories, determine a repair solution, and write out the repair solution and raw failure information to the tester for defect analysis. The test is driven by an external programmable clock that is provided by the tester to allow the DUT 12 to run up to its maximum input clock rate in order to maximize throughput. The test is not dependent on the pattern rate of the tester.

Abstract: A CPU-based system 10 and method for testing embedded memory. The technique employs the on-chip CPU 20 itself to test the embedded memory 24. An assembly code program is loaded into the device under test (DUT) 12 to test the memories, determine a repair solution, and write out the repair solution and raw failure information to the tester for defect analysis. The test is driven by an external programmable clock that is provided by the tester to allow the DUT 12 to run up to its maximum input clock rate in order to maximize throughput. The test is not dependent on the pattern rate of the tester.