Abstract: Apparatus and associated methods for actuating variable stiffness material (VSM) structures and achieving deformation of the structures. The apparatus and the associated methods use internal embedded actuation elements and/or externally attached elements to the VSM structures to achieve the desired deformation. In particular, the actuation can be changed due to the variable stiffness nature of the materials. That is, the invention provides the ability to control the deformation of structures using local stiffness control over subregions of the component in addition to or in substitution for actuation. Furthermore, the invention exploits the variable stiffness properties of the VSM structures to enable new functionalities impossible to realize with conventional constant stiffness materials.

Abstract: A metrology system includes a laser, a position sensitive detector array, a first collimator, a second collimator, and a mirror. The position sensitive detector array and the first collimator are positioned at a reference point. The second collimator and the mirror are positioned at a point target at a distance from the reference point. A laser beam is alternately provided to the first collimator and the second collimator by optical fiber. The position sensitive detector array measures position data from a first laser crosshair generated by the first collimator and from a second laser crosshair generated by the second collimator. By alternating the activation of the first collimator and the second collimator it is possible to measure 5 degrees-of-freedom for the point target. A metrology system processing unit provides analog data processing. The metrology system that is suitable for, but not limited to, facilitating active compensation of large spacecraft structures.