Patents by Inventor Birol Akdemir

Birol Akdemir has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Functional ASIC verification using initialization microcode sequence
    Patent number: 9470760
    Abstract: A method of wafer-level testing of a register programmable integrated circuit may be provided. The method may comprise transforming a microcode instruction and related data from an initializing processor format into tester format data, and applying the tester format data to the integrated circuit on a wafer.
    Type: Grant
    Filed: March 16, 2012
    Date of Patent: October 18, 2016
    Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Birol Akdemir, Onur Keles
  • Testing an integrated circuit
    Patent number: 9354275
    Abstract: Testing an integrated circuit in a test environment that includes a virtual test engine and a test system with an integrated circuit tester. The integrated circuit is connected to the virtual test engine via the integrated circuit tester, and the integrated circuit tester is connected to the integrated circuit via an interface. The virtual test engine communicates with the integrated circuit tester via a command interface to perform functional test during functional test mode and to perform non-functional test during non-functional test mode.
    Type: Grant
    Filed: May 20, 2014
    Date of Patent: May 31, 2016
    Assignee: GLOBALFOUNDRIES INC.
    Inventors: Birol Akdemir, Thomas Gentner, Oliver Marquardt
  • TESTING AN INTEGRATED CIRCUIT
    Publication number: 20140351664
    Abstract: Testing an integrated circuit in a test environment that includes a virtual test engine and a test system with an integrated circuit tester. The integrated circuit is connected to the virtual test engine via the integrated circuit tester, and the integrated circuit tester is connected to the integrated circuit via an interface.
    Type: Application
    Filed: May 20, 2014
    Publication date: November 27, 2014
    Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Birol Akdemir, Thomas Gentner, Oliver Marquardt
  • FUNCTIONAL ASIC VERIFICATION USING INITIALIZATION MICROCODE SEQUENCE
    Publication number: 20120253731
    Abstract: A method of wafer-level testing of a register programmable integrated circuit may be provided. The method may comprise transforming a microcode instruction and related data from an initializing processor format into tester format data, and applying the tester format data to the integrated circuit on a wafer.
    Type: Application
    Filed: March 16, 2012
    Publication date: October 4, 2012
    Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Birol Akdemir, Onur Keles