Patents by Inventor Björn Debaillie

Björn Debaillie has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8711904
    Abstract: A method of determining non-ideality characteristics introduced on a signal by a transceiver is disclosed. The transceiver has an up-conversion transmitter and a down-conversion receiver. In one aspect, the method includes: a) generating a signal comprising at least one known training symbol, b) up-converting this signal with a first frequency to a first signal in the transmitter, c) transferring the first signal from the transmitter to the receiver, d) down-converting with a second frequency this transferred first signal to a second signal in the receiver, the second frequency being different from but linked to the first frequency, e) detecting at least one of the training symbols in the second signal; and f) separating, in the frequency domain, at least one of the components of at least one of the detected training symbols for determining the non-ideality characteristics.
    Type: Grant
    Filed: September 18, 2009
    Date of Patent: April 29, 2014
    Assignees: IMEC, Samsung Electronics Co., Ltd.
    Inventor: Björn Debaillie
  • Publication number: 20100128764
    Abstract: A method of determining non-ideality characteristics introduced on a signal by a transceiver is disclosed. The transceiver has an up-conversion transmitter and a down-conversion receiver. In one aspect, the method includes: a) generating a signal comprising at least one known training symbol, b) up-converting this signal with a first frequency to a first signal in the transmitter, c) transferring the first signal from the transmitter to the receiver, d) down-converting with a second frequency this transferred first signal to a second signal in the receiver, the second frequency being different from but linked to the first frequency, e) detecting at least one of the training symbols in the second signal; and f) separating, in the frequency domain, at least one of the components of at least one of the detected training symbols for determining the non-ideality characteristics.
    Type: Application
    Filed: September 18, 2009
    Publication date: May 27, 2010
    Applicants: IMEC, SAMSUNG Electronics Co., Ltd.
    Inventor: Björn Debaillie