Abstract: A system performs adaptive thermal ceiling control at runtime. The system includes computing circuits and a thermal management module. When detecting a runtime condition change that affects power consumption in the system, the thermal management module determines an adjustment to the thermal ceiling of a computing circuit, and increases the thermal ceiling of the computing circuit according to the adjustment.

Abstract: The present disclosure relates to a semiconductor module. The semiconductor module includes an excitable element located on a first side of a substrate. A first ground structure is disposed between the first side of the substrate and the excitable element. The first ground structure includes a conductive via extending through the substrate and an interconnect disposed over a topmost surface of the conductive via facing away from the substrate. A second ground structure is located on a second side of the substrate, opposing the first side, and electrically coupled to the first ground structure.

Abstract: A system performs adaptive thermal ceiling control at runtime. The system includes computing circuits and a thermal management module. When detecting a runtime condition change that affects power consumption in the system, the thermal management module determines an adjustment to the thermal ceiling of a computing circuit, and increases the thermal ceiling of the computing circuit according to the adjustment.

Abstract: The present disclosure relates to a semiconductor module. The semiconductor module includes an excitable element located on a first side of a substrate. A first ground structure is disposed between the first side of the substrate and the excitable element. The first ground structure includes a conductive via extending through the substrate and an interconnect disposed over a topmost surface of the conductive via facing away from the substrate. A second ground structure is located on a second side of the substrate, opposing the first side, and electrically coupled to the first ground structure.

Abstract: The present disclosure relates to an integrated antenna structure. The integrated antenna structure includes a radiator and a ground plane disposed between a semiconductor substrate and the radiator. A conductive structure is separated from the ground plane by the semiconductor substrate. The conductive structure is electrically coupled to the ground plane. The semiconductor substrate has a thickness of less than approximately 100 microns.

Abstract: The present disclosure relates to an integrated antenna structure. The integrated antenna structure includes a radiator and a ground plane disposed between a semiconductor substrate and the radiator. A conductive structure is separated from the ground plane by the semiconductor substrate. The conductive structure is electrically coupled to the ground plane. The semiconductor substrate has a thickness of less than approximately 100 microns.

Abstract: The present disclosure, in some embodiments, relates to an integrated antenna structure. The structure includes an excitable element and a first ground plane. The first ground plane is disposed between a first surface of a semiconductor substrate and the excitable element. A first line that is normal to the first surface of the semiconductor substrate extends through both the first ground plane and the excitable element. A second ground plane is separated from the first ground plane by the semiconductor substrate. The second ground plane is electrically coupled to the first ground plane.

Abstract: The present disclosure, in some embodiments, relates to an integrated antenna structure. The structure includes an excitable element and a first ground plane. The first ground plane is disposed between a first surface of a semiconductor substrate and the excitable element. A first line that is normal to the first surface of the semiconductor substrate extends through both the first ground plane and the excitable element. A second ground plane is separated from the first ground plane by the semiconductor substrate. The second ground plane is electrically coupled to the first ground plane.

Abstract: Some embodiments relate to a semiconductor module having an integrated antenna structure. The semiconductor module has an excitable element and a first ground plane disposed between a substrate and the excitable element. A second ground plane is separated from the first ground plane by the substrate. The second ground plane is coupled to the first ground plane by one or more through-substrate vias (TSVs) that extend through the substrate.

Abstract: The invention provides an inverter. The inverter includes a first converter and a second converter. The first converter is coupled between a supply voltage and an output node of the inverter. The second converter is coupled between the output node of the inverter and a ground voltage. The first converter, the second converter, or both include diode-connected transistors. The propagation delay time of the inverter is substantially a linear function of the temperature of the inverter.

Abstract: A ring oscillator includes a plurality of inverters. A closed loop structure is formed by cascading the inverters. The inverter includes at least one sensitive inverter with a diode-connected transistor. A variation in an MOSFET (Metal Oxide Semiconductor Field Effect Transistor) threshold voltage of the ring oscillator is detected by analyzing the oscillation frequency of the ring oscillator.

Abstract: A method for distributing power in the layout of an integrated circuit is provided. The integrated circuit includes at least one macro block. A first physical layout of the macro block is obtained, wherein the macro block includes a plurality of standard cells. The first physical layout is divided into a plurality of partitions according to an IR simulation result of the first physical layout. A plurality of power isolation cells are inserted between the partitions. A second physical layout is obtained according to the partitions and the power isolation cells. A macro placement of the macro block is obtained according to the second physical layout. Each of the partitions further includes a low drop out (LDO) regulator.

Abstract: A monitor circuit for monitoring a CUT (Circuit Under Test) is provided. The monitor circuit includes a power switch and a current meter. The power switch is coupled between a supply voltage and the CUT. The current meter is coupled in parallel with the power switch. The current meter is configured to detect a current through the CUT.

Abstract: Some embodiments relate to a semiconductor module having an integrated antenna structure. The semiconductor module has an excitable element and a first ground plane disposed between a substrate and the excitable element. A second ground plane is separated from the first ground plane by the substrate. The second ground plane is coupled to the first ground plane by one or more through-substrate vias (TSVs) that extend through the substrate.

Abstract: Some embodiments relate to a semiconductor module comprising a low-cost integrated antenna that uses a conductive backside structure in conjunction with a ground metal layer to form a large ground plane with a small silicon area. In some embodiments, the integrated antenna structure has an excitable element that radiates electromagnetic radiation. An on-chip ground plane, located on a first side of an interposer substrate, is positioned below the excitable element. A compensation ground plane, located on an opposing side of the interposer substrate, is connected to the ground plane by one or more through-silicon vias (TSVs) that extend through the interposer substrate. The on-chip ground plane and the compensation ground collectively act to reflect the electromagnetic radiation generated by the excitable element, so that the compensation ground improves the performance of the on-chip ground plane.

Abstract: A method for performing contactless signal testing includes receiving, with a testing pad of an integrated circuit, a signal within a beam. The method further includes converting, with a number of diodes connected to a positive voltage supply, an electrical current signal created by the electron beam to a voltage signal, wherein the number of diodes includes a diode stack of multiple diodes. The method further includes extracting, with a digital inverter, a test signal from the voltage signal.

Abstract: A ring oscillator includes a plurality of inverters. A closed loop structure is formed by cascading the inverters. The inverter includes at least one sensitive inverter with a diode-connected transistor. A variation in an MOSFET (Metal Oxide Semiconductor Field Effect Transistor) threshold voltage of the ring oscillator is detected by analyzing the oscillation frequency of the ring oscillator.

Abstract: A method for performing contactless signal testing includes receiving, with a testing pad of an integrated circuit, a signal within a beam. The method further includes converting, with a number of diodes connected to a positive voltage supply, an electrical current signal created by the electron beam to a voltage signal, wherein the number of diodes includes a diode stack of multiple diodes. The method further includes extracting, with a digital inverter, a test signal from the voltage signal.

Abstract: A capacitor structure includes first and second interdigitated conductive elements formed over different portions of a semiconductor substrate, and a dielectric layer formed between the first and second interdigitated conductive elements. The first interdigitated conductive element that is formed includes a first base portion and a plurality of first protrusion portions. The second interdigitated conductive element includes a second base portion and a plurality of second protrusion portions. The second protrusion portions of the second interdigitated conductive element are interleaved with the first protrusion portions of the first interdigitated conductive element.

Abstract: A sensing circuit includes a delay chain and a decoder. The delay chain includes at least one delay unit, at least one cascading switch, and at least one feedback switch. The delay unit generates a delay signal according to an input signal and a reset signal. The cascading switch selectively passes the delay signal according to a control signal. The feedback switch selectively forms a feedback path of the delay unit according to the control signal. The decoder generates an output signal according to the delay signal. The delay unit is supplied by a work voltage. If the work voltage has noise, the noise will be detectable by analyzing the output signal of the decoder.