Abstract: A semiconductor device comprises a burn-in test circuit configured to receive a flag signal for a burn-in test, generate a toggled output enable signal, and drive a first input/output line to toggle a signal on the first input/output line, and a switching device connected between a bit line and a second input/output line for transferring a signal on the bit line to the second input/output line in response to the output enable signal.

Abstract: A semiconductor device comprises a burn-in test circuit configured to receive a flag signal for a burn-in test, generate a toggled output enable signal, and drive a first input/output line to toggle a signal on the first input/output line, and a switching device connected between a bit line and a second input/output line for transferring a signal on the bit line to the second input/output line in response to the output enable signal.

Abstract: A burn-in test apparatus and a semiconductor device using the same are disclosed. The burn-in test apparatus includes a flag signal generating unit configured to receive an external input signal and an external address externally inputted for a burn-in test and generate a flag signal, and a burn-in test unit configured to receive the flag signal, generate a toggled output enable signal, and drive an input/output line to toggle a signal on the input/output line.

Abstract: A burn-in test apparatus and a semiconductor device using the same are disclosed. The burn-in test apparatus includes a flag signal generating unit configured to receive an external input signal and an external address externally inputted for a burn-in test and generate a flag signal, and a burn-in test unit configured to receive the flag signal, generate a toggled output enable signal, and drive an input/output line to toggle a signal on the input/output line.

Abstract: A device for controlling a temperature compensated self-refresh period clamps a self-refresh signal at high temperature over a specific temperature to maintain the self-refresh period, thereby removing dependency on temperature. In the device, an oscillating signal having a period varied depending on temperature change is generated below a specific temperature, and a period of a first period signal is compared with that of the oscillating signal applied from a temperature compensated self-refresh circuit unit over the specific temperature. When the period of the oscillating signal is shorter than that of the first signal, a pulse width of an oscillating strobe signal generated in response to a plurality of division signals each obtained by dividing the period of the oscillating signal at a predetermined ratio is controlled, so that an oscillating period of the temperature compensated self-refresh circuit unit is kept at a fixed state.