Patents by Inventor Bongtae Han

Bongtae Han has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7230722
    Abstract: A method for measuring deformation in specimens is provided. The method includes providing a shadow moiré system, the shadow moiré system including an illumination source, a reference grating and an image capture device and providing a specimen. The method further includes determining a selected distance between the specimen and the reference grating, and illuminating the specimen with light from the illumination source directed through the reference grating onto the specimen, thereby forming shadow moiré fringes onto the specimen. The method further includes capturing an image of the shadow moiré fringes by the image capture device.
    Type: Grant
    Filed: October 19, 2005
    Date of Patent: June 12, 2007
    Assignee: University of Maryland
    Inventors: Bongtae Han, Changwoon Han
  • Publication number: 20070086020
    Abstract: A method for measuring deformation in specimens is provided. The method includes providing a shadow moire system, the shadow moiré system including an illumination source, a reference grating and an image capture device and providing a specimen. The method further includes determining a selected distance between the specimen and the reference grating, and illuminating the specimen with light from the illumination source directed through the reference grating onto the specimen, thereby forming shadow moiré fringes onto the specimen. The method further includes capturing an image of the shadow moiré fringes by the image capture device.
    Type: Application
    Filed: October 19, 2005
    Publication date: April 19, 2007
    Inventors: Bongtae Han, Changwoon Han
  • Patent number: 5898486
    Abstract: A moire interferometer which is both portable and shielded from the environment, as well as a corresponding moire interferometric method, are disclosed.
    Type: Grant
    Filed: March 25, 1994
    Date of Patent: April 27, 1999
    Assignee: International Business Machines Corporation
    Inventors: James Francis Chesko, Sr., Yifan Guo, Bongtae Han, Chun Kil Lim