Patents by Inventor Brendon James Hickson

Brendon James Hickson has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Spatially resolved temperature measurement and irradiance control
    Patent number: 6534752
    Abstract: A method, apparatus and system for producing a desired spatial temperature distribution across a workpiece. The method includes irradiating a plurality of areas on a surface of the workpiece to create localized heating of the workpiece in those areas, to produce the desired spatial temperature distribution in the workpiece, and the apparatus includes means for carrying out the method. The system includes a locator for locating the workpiece in a desired position relative to an energy source, and an irradiance system for carrying out the method. The system further includes a processor circuit in communication with the irradiance system, and a radiation-absorbing environment. The irradiance system includes a measuring system and at least one energy source for directing radiation to the surface of the workpiece.
    Type: Grant
    Filed: June 12, 2001
    Date of Patent: March 18, 2003
    Assignee: Vortek Industries Ltd.
    Inventors: David Malcolm Camm, Marcel Edmond Lefrancois, Brendon James Hickson
  • Spatially resolved temperature measurement and irradiance control
    Publication number: 20010036219
    Abstract: A method, apparatus and system for producing a desired spatial temperature distribution across a workpiece. The method includes irradiating a plurality of areas on a surface of the workpiece to create localized heating of the workpiece in those areas, to produce the desired spatial temperature distribution in the workpiece, and the apparatus includes means for carrying out the method. The system includes a locator for locating the workpiece in a desired position relative to an energy source, and an irradiance system for carrying out the method. The system further includes a processor circuit in communication with the irradiance system, and a radiation-absorbing environment. The irradiance system includes a measuring system and at least one energy source for directing radiation to the surface of the workpiece.
    Type: Application
    Filed: June 12, 2001
    Publication date: November 1, 2001
    Inventors: David Malcolm Camm, Marcel Edmond Lefrancois, Brendon James Hickson
  • Spatially resolved temperature measurement and irradiance control
    Patent number: 6303411
    Abstract: A method, apparatus and system for producing a desired spatial temperature distribution across a workpiece. The method includes irradiating a plurality of areas on a surface of the workpiece to create localized heating of the workpiece in those areas, to produce the desired spatial temperature distribution in the workpiece, and the apparatus includes means for carrying out the method. The system includes a locator for locating the workpiece in a desired position relative to an energy source, and an irradiance system for carrying out the method. The system further includes a processor circuit in communication with the irradiance system, and a radiation-absorbing environment. The irradiance system includes a measuring system and at least one energy source for directing radiation to the surface of the workpiece.
    Type: Grant
    Filed: May 3, 1999
    Date of Patent: October 16, 2001
    Assignee: Vortek Industries Ltd.
    Inventors: David Malcolm Camm, Marcel Edmond Lefrancois, Brendon James Hickson