Patents by Inventor Brian C. Gaudet

Brian C. Gaudet has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6529571
    Abstract: An apparatus for and method of generating a signal for equalizing propagation delay among parts of a transceiver are disclosed. The parts each have a plurality of channels, and each channel is configured to receive the signal. The apparatus includes a master circuit and a dummy channel circuit. The master circuit is configured to receive and lock to a reference clock signal, and in accordance therewith generate a reference delay signal and an adjusted clock signal. The dummy channel circuit is configured to receive the adjusted clock signal, the reference delay signal and a dummy data signal, and in accordance therewith generate an intermediate data signal, the dummy data signal and one or more control signals. The control signals correspond to a delay between the adjusted clock signal and the intermediate data signal. In this manner a uniform delay may be provided to all parts and channels.
    Type: Grant
    Filed: September 28, 1999
    Date of Patent: March 4, 2003
    Assignee: National Semiconductor Corporation
    Inventor: Brian C. Gaudet
  • Patent number: 6229469
    Abstract: Differences between samples are optimally quantized in such a way that the maximum possible difference between samples is equal to the full range of an analog-to-digital converter (ADC). The differential analog-to-digital conversion uses fewer bits in an integrated ADC architecture than prior-art solutions for a given level of quantization noise, thereby enabling faster implementations with both lower power consumption and smaller layout area.
    Type: Grant
    Filed: April 13, 1999
    Date of Patent: May 8, 2001
    Assignee: Agere Systems Guardian Corp.
    Inventor: Brian C. Gaudet
  • Patent number: 5633606
    Abstract: A scan flip-fop is designed to hold the state of the slave latch during scan shifting. This allows an ATPG tool to develop robust delay path tests using combinational scan flip-flop models. Combinational scan flip-flop models suffice because the launch can be done in the cycle before test enable goes active and capture can be performed during the cycle in which test enable is active. Thus, multiple clocks during the capture cycle are not necessary and, therefore, sequential delay path ATPG is not necessary. It is only necessary for the ATPG tool to store the last parallel vector in a buffer. The dynamic latch used for the scan slave latch is made small and slow, thereby increasing the delay along the data path during shifting, making the cell immune to hold time violation for any reasonable amount of clock skew.
    Type: Grant
    Filed: July 20, 1995
    Date of Patent: May 27, 1997
    Assignee: National Semiconductor Corporation
    Inventors: Brian C. Gaudet, Rajendran Sharma, Ronald Pasqualini