Patents by Inventor Brian D. Guenther

Brian D. Guenther has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Reflectometer, spectrophotometer, ellipsometer and polarimeter system with a super continuum laser source of a beam of electromagnetism, and improved detector system
    Patent number: 11675208
    Abstract: Reflectometer, spectrophotometer, ellipsometer, and polarimeter systems having a supercontinuum laser source of coherent electromagnetic radiation over a range of between 400 nm to between 4400 nm and 18000 nm, and another source of wavelengths to provide between 400 nm and as high as at least 50000 nm; a stage for supporting a sample and a detector of electromagnetic radiation, wherein the source provides a beam of electromagnetic radiation which interacts with a sample and enters a detector system optionally incorporating a wavelength modifier, where the detector system can be functionally incorporated with combinations of gratings and/or combination dichroic beam splitter-prisms, which can be optimized as regards wavelength dispersion characteristics to direct wavelengths in various ranges to various detectors that are well suited to detect them.
    Type: Grant
    Filed: March 5, 2021
    Date of Patent: June 13, 2023
    Assignee: J.A. WOOLLAM CO., INC.
    Inventors: Stefan Schoeche, Martin M. Liphardt, Ping He, Jeremy A Van Derslice, Craig M. Herzinger, Jeffrey S. Hale, Brian D. Guenther, Duane E. Meyer, John A Woollam, James D. Welch
  • Reflectometer, spectrophotometer, ellipsometer and polarimeter systems including a wavelength modifier
    Publication number: 20220244169
    Abstract: Ellipsometer, polarimeter, reflectometer and spectrophotometer systems including one or more wavelength modifiers which convert wavelengths provided by a source of electromagnetic radiation to different wavelengths for use in investigating a sample, and/or which a detector thereof can detect.
    Type: Application
    Filed: September 16, 2021
    Publication date: August 4, 2022
    Applicant: J.A. WOOLLAM CO., INC.
    Inventors: Ping He, Martin M. Liphardt, Jeremy A. Van Derslice, Craig M. Herzinger, Jeffrey S. Hale, Brian D. Guenther, Duane E. Meyer, Stefan Schoeche, James D. Welch
  • Ellipsometer or polarimeter system having at least one rotating element which is driven by a motor comprising air bearing
    Patent number: 10775298
    Abstract: Ellipsometers and polarimeters and the like having at least one rotating element which is driven by a motor that comprises air bearings.
    Type: Grant
    Filed: May 6, 2019
    Date of Patent: September 15, 2020
    Assignee: J.A. WOOLLAM CO., INC.
    Inventors: Christopher D. Hassler, Galen L. Pfeiffer, Jeffrey S. Hale, Craig M. Herzinger, Brian D. Guenther, Brooks A. Hitt
  • In line ellipsometer system and method of use
    Patent number: 9347768
    Abstract: A system for monitoring, in real time, relatively large samples as they are caused to pass by an ellipsometer or the like system, and method of its use.
    Type: Grant
    Filed: March 6, 2012
    Date of Patent: May 24, 2016
    Assignee: J.A. WOOLLAM CO., INC
    Inventors: Galen L. Pfeiffer, Blaine D. Johs, Brian D. Guenther, Martin M. Liphardt, Jeffrey S. Hale
  • Beam chromatic shifting and directing means
    Patent number: 7535566
    Abstract: An electromagnetic beam chromatic shifting and directing means for use in reflectively directing a spectroscopic beam of electromagnetic radiation while simultaneously de-emphasizing intensity in a first range of wavelengths, (eg. the Visible wavelengths), and simultaneously relatively emphasizing intensity in another wavelength range, (eg. UV wavelengths).
    Type: Grant
    Filed: June 15, 2006
    Date of Patent: May 19, 2009
    Assignee: J.A. Woollam Co., Inc.
    Inventors: Blaine D. Johs, Galen L. Pfeiffer, Jeffrey S. Hale, Christopher A. Goeden, Brian D. Guenther, Martin M. Liphardt, Ping He
  • Spectrophotometer, ellipsometer, polarimeter and the like systems
    Patent number: 7327456
    Abstract: Disclosed are improvements in ellipsometer and the like systems capable of operating in the Vacuum-Ultra-Violet (VUV) to Near Infrared (NIR) wavelength range, and methodology of use.
    Type: Grant
    Filed: June 6, 2005
    Date of Patent: February 5, 2008
    Assignee: J.A. Woollam Co., Inc.
    Inventors: John A. Woollam, Steven E. Green, Ping He, Blaine D. Johs, Craig M. Herzinger, Galen L. Pfeiffer, Brian D. Guenther, Martin M. Liphardt, Gerald T. Cooney
  • Sample entry purge system in spectrophotometer, ellipsometer, polarimeter and the like systems
    Patent number: 7274450
    Abstract: A sample sequestering system which allows access to a subspace in a chamber encompassed generally enclosed space, for use in entering and removing a sample when the subspace is opened to atmosphere. Sufficient purge gas is flowed from within the generally enclosed space into the subspace discourage atmospheric contaminates from entering into the subspace. Contained within the generally enclosed space is a spectrophotometer, ellipsometer or polarimeter or the like system which operates at wavelengths, (eg. UV), which are adversely affected, (eg. absorbed), by typical atmospheric contents.
    Type: Grant
    Filed: May 28, 2004
    Date of Patent: September 25, 2007
    Assignee: J.A. Woollam Co., Inc
    Inventors: Steven E. Green, Ping He, Galen L. Pfeiffer, Brian D. Guenther, Gerald T. Cooney, John A. Woollam, Martin M. Liphardt, Blaine D. Johs, Craig M. Herzinger
  • Alignment of ellipsometer beam to sample surface
    Patent number: 7136162
    Abstract: Disclosed is a system and method of aligning, preferably by an automated procedure, a beam of electromagnetic radiation provided by a source thereof so that it approaches a sample at a specific location upon its surface, at a known angle, then reflects therefrom and enters a data detector.
    Type: Grant
    Filed: October 12, 2003
    Date of Patent: November 14, 2006
    Assignee: J.A. Woollam Co., Inc.
    Inventors: Martin M. Liphardt, Craig M. Herzinger, Brian D. Guenther, Steven E. Green, Galen L. Pfeiffer, Ping He
  • Spectrophotometer, ellipsometer, polarimeter and the like systems
    Patent number: 6982792
    Abstract: Disclosed are improvements in ellipsometer and the like systems capable of operating in the Vacuum-Ultra-Violet (VUV) to Near Infrared (NIR) wavelength range, and methodology of use.
    Type: Grant
    Filed: February 28, 2003
    Date of Patent: January 3, 2006
    Assignee: J.A. Woollam Co. INC
    Inventors: John A. Woollam, Steven E. Green, Ping He, Blaine D. Johs, Craig M. Herzinger, Galen L. Pfeiffer, Brian D. Guenther, Martin M. Liphardt