Abstract: A phase-contrast imaging detector includes a plurality of pixels. Each pixel includes a detection material that generates a measurable parameter in response to X-ray photons. Each pixel also includes a plurality of sub-pixel resolution readout structures. The sub-pixel resolution readout structures are in an alternating pattern with a spacing therebetween that is larger than a frequency of a phase-contrast interference pattern but small enough to enable charge sharing between adjacent sub-pixel resolution readout structures when an X-ray photon hits between the adjacent sub-pixel resolution readout structures. The phase-contrast imaging detector also includes readout circuitry configured to read out signals from the plurality of sub-pixel readout structures. The plurality of sub-pixel resolution readout structures includes two or more electrodes having alternating arms that form an interleaved comb structure.

Abstract: A phase-contrast imaging detector includes a plurality of pixels. Each pixel includes a detection material that generates a measurable parameter in response to X-ray photons. Each pixel also includes a plurality of sub-pixel resolution readout structures. The sub-pixel resolution readout structures are in an alternating pattern with a spacing therebetween that is larger than a frequency of a phase-contrast interference pattern but small enough to enable charge sharing between adjacent sub-pixel resolution readout structures when an X-ray photon hits between the adjacent sub-pixel resolution readout structures. The phase-contrast imaging detector also includes readout circuitry configured to read out signals from the plurality of sub-pixel readout structures. The plurality of sub-pixel resolution readout structures includes two or more electrodes having alternating arms that form an interleaved comb structure.

Abstract: An X-ray detector is provided. The X-ray detector includes multiple detector sub-modules. Each detector sub-module includes a semiconductor layer and multiple detector elements. A plurality of detector elements is disposed on the semiconductor layer. Wiring traces extending from the plurality of detector elements to readout circuitry, where each detector element is coupled to a respective wiring trace. One or more of the wiring traces extend over one or more detector elements of the plurality of detector elements. Processing circuitry is configured to perform coincidence detection to determine which detector element of the plurality of detector elements is associated with a location of an X-ray hit when the X-ray coincidently hits one of the detector elements of the plurality of detector elements and one or more of the wiring traces coupled to respective detector elements of the plurality of detector elements.

Abstract: A phase-contrast imaging detector includes a plurality of pixels. Each pixel includes a detection material that generates a measurable parameter in response to X-ray photons. Each pixel also includes a plurality of sub-pixel resolution readout structures. The sub-pixel resolution readout structures are in an alternating pattern with a spacing therebetween that is larger than a frequency of a phase-contrast interference pattern but small enough to enable charge sharing between adjacent sub-pixel resolution readout structures when an X-ray photon hits between the adjacent sub-pixel resolution readout structures. The phase-contrast imaging detector also includes readout circuitry configured to read out signals from the plurality of sub-pixel readout structures. The plurality of sub-pixel resolution readout structures includes two or more electrodes having alternating arms that form an interleaved comb structure.

Abstract: An X-ray detector is provided. The X-ray detector includes multiple detector sub-modules. Each detector sub-module includes a semiconductor layer and multiple detector elements. A plurality of detector elements is disposed on the semiconductor layer. Wiring traces extending from the plurality of detector elements to readout circuitry, where each detector element is coupled to a respective wiring trace. The wiring traces are routed within a gap between adjacent detector elements of the plurality of detector elements. Processing circuitry is configured to perform coincidence detection to determine which detector element of the plurality of detector elements is associated with a location of an X-ray hit when the X-ray coincidently hits one of the detector elements of the plurality of detector elements and one or more of the wiring traces coupled to respective detector elements of the plurality of detector elements.

Abstract: An X-ray detector is provided. The X-ray detector includes multiple detector sub-modules. Each detector sub-module includes a semiconductor layer and multiple detector elements. A plurality of detector elements is disposed on the semiconductor layer. Wiring traces extending from the plurality of detector elements to readout circuitry, where each detector element is coupled to a respective wiring trace. The wiring traces are routed within a gap between adjacent detector elements of the plurality of detector elements. Processing circuitry is configured to perform coincidence detection to determine which detector element of the plurality of detector elements is associated with a location of an X-ray hit when the X-ray coincidently hits one of the detector elements of the plurality of detector elements and one or more of the wiring traces coupled to respective detector elements of the plurality of detector elements.

Abstract: An X-ray detector is provided. The X-ray detector includes multiple detector sub-modules. Each detector sub-module includes a semiconductor layer and multiple detector elements. A first detector element of the multiple detector elements includes a first electrode disposed on a first doped implant and a second detector element of the multiple detector elements includes a second electrode disposed on a second doped implant. The first and second detector elements are disposed on the semiconductor layer adjacent to each other with a gap therebetween. Each detector sub-module also includes wiring traces extending from one or more detector elements of the multiple detector elements to readout circuitry. The wiring traces are routed within the gap between the first and second electrodes. The first doped implant extends underneath a portion of the wiring traces is configured to shield the wiring traces from electrical activity occurring underneath due to absorption of an X-ray.

Abstract: An X-ray detector is provided. The X-ray detector includes multiple detector sub-modules. Each detector sub-module includes a semiconductor layer and multiple detector elements. A first detector element of the multiple detector elements includes a first electrode disposed on a first doped implant and a second detector element of the multiple detector elements includes a second electrode disposed on a second doped implant. The first and second detector elements are disposed on the semiconductor layer adjacent to each other with a gap therebetween. Each detector sub-module also includes wiring traces extending from one or more detector elements of the multiple detector elements to readout circuitry. The wiring traces are routed within the gap between the first and second electrodes. The first doped implant extends underneath a portion of the wiring traces is configured to shield the wiring traces from electrical activity occurring underneath due to absorption of an X-ray.

Abstract: The present disclosure relates to fabrication and use of a phase-contrast imaging detector that includes sub-pixel resolution electrodes or photodiodes spaced to correspond to a phase-contrast interference pattern. A system using such a detector may employ fewer gratings than are typically used in a phase-contrast imaging system, with certain functionality typically provided by a detector-side analyzer grating being performed by sub-pixel resolution structures (e.g., electrodes or photodiodes) of the detector. Measurements acquired using the detector may be used to determine offset, amplitude, and phase of a phase-contrast interference pattern without multiple acquisitions at different phase steps.

Abstract: The present disclosure relates to fabrication and use of a phase-contrast imaging detector that includes sub-pixel resolution electrodes or photodiodes spaced to correspond to a phase-contrast interference pattern. A system using such a detector may employ fewer gratings than are typically used in a phase-contrast imaging system, with certain functionality typically provided by a detector-side analyzer grating being performed by sub-pixel resolution structures (e.g., electrodes or photodiodes) of the detector. Measurements acquired using the detector may be used to determine offset, amplitude, and phase of a phase-contrast interference pattern without multiple acquisitions at different phase steps.

Abstract: Methods and systems are provided for coherent scattered imaging using a computed tomography system with segmented detector arrays. In one embodiment, a method includes imaging a region of interest with an x-ray source and a segmented photon-counting detector array, detecting a position of an object of interest in the region of interest, selectively scanning, via the x-ray source and the segmented photon-counting detector array, the object of interest, detecting a coherent scatter signal from the object of interest with the segmented photon-counting detector array, and determining a material of the object of interest based on the detected coherent scatter signal. In this way, the coherent scatter signal may be used to identify and investigate lesions or other objects of interest within an imaged volume.

Abstract: There is provided an x-ray detector having a number of x-ray detector sub-modules. Each detector sub-module is an edge-on detector sub-module having an array of detector elements extending in at least two directions, wherein one of the directions has a component in the direction of incoming x-rays. The detector sub-modules are stacked one after the other and/or arranged side-by-side. For at least part of the detector sub-modules, the detector sub-modules are arranged for providing a gap between adjacent detector sub-modules, where at least part of the gap is not directed linearly towards the x-ray focal point of an x-ray source.

Abstract: Methods and systems are provided for coherent scattered imaging using a computed tomography system with segmented detector arrays. In one embodiment, a method includes imaging a region of interest with an x-ray source and a segmented photon-counting detector array, detecting a position of an object of interest in the region of interest, selectively scanning, via the x-ray source and the segmented photon-counting detector array, the object of interest, detecting a coherent scatter signal from the object of interest with the segmented photon-counting detector array, and determining a material of the object of interest based on the detected coherent scatter signal. In this way, the coherent scatter signal may be used to identify and investigate lesions or other objects of interest within an imaged volume.

Abstract: The present approach relates to the use of detector elements (i.e., reference detector pixels) positioned under septa of an anti-scatter collimator. Signals detected by the reference detector pixels may be used to correct for charging-sharing events with adjacent pixels and/or to characterize or correct for focal spot misalignment either in real time or as a calibration step.

Abstract: A method for imaging an object to be reconstructed includes acquiring projection data corresponding to the object. Furthermore, the method includes generating a measured sinogram based on the acquired projection data and formulating a forward model, where the forward model is representative of a characteristic of the imaging system. In addition, the method includes generating an estimated sinogram based on an estimated image of the object and the forward model and formulating a statistical model based on at least one of pile-up characteristics and dead time characteristics of a detector of the imaging system. Moreover, the method includes determining an update corresponding to the estimated image based on the statistical model, the measured sinogram, and the estimated sinogram and updating the estimated image based on the determined update to generate an updated image of the object. Additionally, the method includes outputting a final image of the object.

Abstract: Various approaches are discussed for using four-side buttable CMOS tiles to fabricate detector panels, including large-area detector panels. Fabrication may utilize pads and interconnect structures formed on the top or bottom of the CMOS tiles. Electrical connection and readout may utilize readout and digitization circuitry provided on the CMOS tiles themselves such that readout of groups or sub-arrays of pixels occurs at the tile level, while tiles are then readout at the detector level such that readout operations are tiered or multi-level.

Abstract: A method for imaging an object to be reconstructed includes acquiring projection data corresponding to the object. Furthermore, the method includes generating a measured sinogram based on the acquired projection data and formulating a forward model, where the forward model is representative of a characteristic of the imaging system. In addition, the method includes generating an estimated sinogram based on an estimated image of the object and the forward model and formulating a statistical model based on at least one of pile-up characteristics and dead time characteristics of a detector of the imaging system. Moreover, the method includes determining an update corresponding to the estimated image based on the statistical model, the measured sinogram, and the estimated sinogram and updating the estimated image based on the determined update to generate an updated image of the object. Additionally, the method includes outputting a final image of the object.

Abstract: The present approach relates to scatter correction of signals acquired using radiation detectors on a pixel-by-pixel basis. In certain implementations, the systems and methods disclosed herein facilitate scatter correction for signals generated using a detector having segmented detector elements, such as may be present in an energy-resolving, photon-counting CT imaging system.

Abstract: A detector is described having readout electronics integrated in the photodetector layer. The detector may be configured to acquire both energy-integrated and photon-counting data. In one implementation, the detector is also configured with control logic to select between the jointly generated photon-counting and energy-integrated data.

Abstract: There is provided an x-ray detector having a number of x-ray detector sub-modules. Each detector sub-module is an edge-on detector sub-module having an array of detector elements extending in at least two directions, wherein one of the directions has a component in the direction of incoming x-rays. The detector sub-modules are stacked one after the other and/or arranged side-by-side. For at least part of the detector sub-modules, the detector sub-modules are arranged for providing a gap between adjacent detector sub-modules, where at least part of the gap is not directed linearly towards the x-ray focal point of an x-ray source.