Patents by Inventor Brian Halvorson
Brian Halvorson has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 10928423Abstract: The test system provides an array of test probes. The probes pass through a first or upper probe guide retainer which has a plurality of slot sized to receive the probes in a way that they cannot rotate. A plurality of flex circuits at the different heights engage bottom probe ends at their respective height levels and flex circuits continue the electrical connection from the probes to a load board. The test probes are bonded to the flex circuits by ring shaped flowable conductive material. The flex circuits are biased against a load board by an elastomeric pad of spaced part conical projections.Type: GrantFiled: September 4, 2018Date of Patent: February 23, 2021Assignee: Johnstech International CorporationInventors: John DeBauche, Dan Campion, Michael Andres, Steve Rott, Jeffrey Sherry, Brian Halvorson, Brian Eshult
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Patent number: 10330702Abstract: A testing device for wafer level testing of IC circuits is disclosed. An upper and lower pin (22, 62) are configured to slide relatively to each other and are held in electrically biased contact by an elastomer (80). To prevent rotation of the pins in the pin guide, a walled recess in the bottom of the pin guide engages flanges on the pins. In another embodiment, the pin guide maintains rotational alignment by being fitted around the pin profile or having projections abutting the pin. The pin guide (12) is maintained in alignment with the retainer 14 by establishing a registration corner (506) and driving the guide into the corner by elastomers in at least one diagonally opposite corner.Type: GrantFiled: September 18, 2018Date of Patent: June 25, 2019Assignee: Johnstech International CorporationInventors: Jathan Edwards, Charles Marks, Brian Halvorson
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Publication number: 20190041429Abstract: A testing device for wafer level testing of IC circuits is disclosed. An upper and lower pin (22, 62) are configured to slide relatively to each other and are held in electrically biased contact by an elastomer (80). To prevent rotation of the pins in the pin guide, a walled recess in the bottom of the pin guide engages flanges on the pins. In another embodiment, the pin guide maintains rotational alignment by being fitted around the pin profile or having projections abutting the pin. The pin guide (12) is maintained in alignment with the retainer 14 by establishing a registration corner (506) and driving the guide into the corner by elastomers in at least one diagonally opposite corner.Type: ApplicationFiled: September 18, 2018Publication date: February 7, 2019Inventors: Jathan Edwards, Charles Marks, Brian Halvorson
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Publication number: 20190004093Abstract: The test system provides an array of test probes. The probes pass through a first or upper probe guide retainer which has a plurality of slot sized to receive the probes in a way that they cannot rotate. A plurality of flex circuits at the different heights engage bottom probe ends at their respective height levels and flex circuits continue the electrical connection from the probes to a load board. The test probes are bonded to the flex circuits by ring shaped flowable conductive material. The flex circuits are biased against a load board by an elastomeric pad of spaced part conical projections.Type: ApplicationFiled: September 4, 2018Publication date: January 3, 2019Inventors: John DeBauche, Dan Campion, Michael Andres, Steve Rott, Jeffrey Sherry, Brian Halvorson, Brian Eshult
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Patent number: 10078101Abstract: A testing device for wafer level testing of IC circuits is disclosed. An upper and lower pin (22, 62) are configured to slide relatively to each other and are held in electrically biased contact by an elastomer (80). To prevent rotation of the pins in the pin guide, a walled recess in the bottom of the pin guide engages flanges on the pins. In another embodiment, the pin guide maintains rotational alignment by being fitted around the pin profile or having projections abutting the pin. The pin guide (12) is maintained in alignment with the retainer 14 by establishing a registration corner (506) and driving the guide into the corner by elastomers in at least one diagonally opposite corner.Type: GrantFiled: March 10, 2015Date of Patent: September 18, 2018Assignee: Johnstech International CorporationInventors: Jathan Edwards, Charles Marks, Brian Halvorson
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Patent number: 10067164Abstract: The test system provides an array of test probes. The probes pass through a first or upper probe guide retainer which has a plurality of slot sized to receive the probes in a way that they cannot rotate. A plurality of flex circuits at the different heights engage bottom probe ends at their respective height levels and flex circuits continue the electrical connection from the probes to a load board. The test probes are bonded to the flex circuits by ring shaped flowable conductive material. The flex circuits are biased against a load board by an elastomeric pad of spaced part conical projections.Type: GrantFiled: August 24, 2016Date of Patent: September 4, 2018Assignee: Johnstech International CorporationInventors: John DeBauche, Dan Campion, Michael Andres, Steve Rott, Jeffrey Sherry, Brian Halvorson, Brian Eshult
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Patent number: 9817026Abstract: A testing device for wafer level testing of IC circuits is disclosed. An upper and lower pin (22, 62) are configured to slide relatively to each other and are held in electrically biased contact by an elastomer (80). The elastomer is precompressed from its natural rest state between a top (22) plate and a bottom (70). Pre compression improves the resilient response of the pins. The pin crowns (40) are maintained relatively coplanar by the engagement of at least one flange (44a-b) against an up-stop surface 90 of plate 20, thereby insuring coplanarity of the crowns. The pin guide (12) is maintained in alignment with the retainer 14 by establishing a registration corner (506) and driving the guide into the corner by elastomers in at least one diagonally opposite corner.Type: GrantFiled: February 15, 2016Date of Patent: November 14, 2017Assignee: Johnstech International CorporationInventors: Jathan Edwards, Charles Marks, Brian Halvorson
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Patent number: 9696347Abstract: The test system provides an array of test probes having a cross beam. The probes pass through a first or upper probe guide retainer which has a plurality of slot sized to receive the probes in a way that they cannot rotate. The probes are biased upwardly through the retainer by an elastomeric block having a similar array of slots. The elastomer is then capped at its bottom by a second or lower retainer with like slots to form a sandwich with the elastomer therebetween. The bottom ends of the probes are group by probe height. A plurality of flex circuits at the different heights engage bottom probe ends at their respective height levels and take continue the circuits to a probe card where test signals originate.Type: GrantFiled: July 10, 2014Date of Patent: July 4, 2017Assignee: Johnstech International CorporationInventors: John DeBauche, Dan Campion, Michael Andres, Steve Rott, Jeffrey Sherry, Brian Halvorson, Brian Eshult
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Publication number: 20170074926Abstract: A testing device for wafer level testing of IC circuits is disclosed. An upper and lower pin (22, 62) are configured to slide relatively to each other and are held in electrically biased contact by an elastomer (80). To prevent rotation of the pins in the pin guide, a walled recess in the bottom of the pin guide engages flanges on the pins. In another embodiment, the pin guide maintains rotational alignment by being fitted around the pin profile or having projections abutting the pin. The pin guide (12) is maintained in alignment with the retainer 14 by establishing a registration corner (506) and driving the guide into the corner by elastomers in at least one diagonally opposite corner.Type: ApplicationFiled: March 10, 2015Publication date: March 16, 2017Inventors: Jathan Edwards, Charles Marks, Brian Halvorson
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Publication number: 20170059616Abstract: The test system provides an array of test probes. The probes pass through a first or upper probe guide retainer which has a plurality of slot sized to receive the probes in a way that they cannot rotate. A plurality of flex circuits at the different heights engage bottom probe ends at their respective height levels and flex circuits continue the electrical connection from the probes to a load board. The test probes are bonded to the flex circuits by ring shaped flowable conductive material. The flex circuits are biased against a load board by an elastomeric pad of spaced part conical projections.Type: ApplicationFiled: August 24, 2016Publication date: March 2, 2017Inventors: John DeBauche, Dan Campion, Michael Andres, Steve Rott, Jeffrey Sherry, Brian Halvorson, Brian Eshult
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Publication number: 20160161528Abstract: A testing device for wafer level testing of IC circuits is disclosed. An upper and lower pin (22, 62) are configured to slide relatively to each other and are held in electrically biased contact by an elastomer (80). The elastomer is precompressed from its natural rest state between a top (22) plate and a bottom (70). Pre compression improves the resilient response of the pins. The pin crowns (40) are maintained relatively coplanar by the engagement of at least one flange (44a-b) against an up-stop surface 90 of plate 20, thereby insuring coplanarity of the crowns. The pin guide (12) is maintained in alignment with the retainer 14 by establishing a registration corner (506) and driving the guide into the corner by elastomers in at least one diagonally opposite corner.Type: ApplicationFiled: February 15, 2016Publication date: June 9, 2016Inventors: Jathan Edwards, Charles Marks, Brian Halvorson
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Patent number: 9261537Abstract: A testing device for wafer level testing of IC circuits is disclosed. An upper and lower pin (22, 62) are configured to slide relatively to each other and are held in electrically biased contact by an elastomer (80). The elastomer is precompressed from its natural rest state between a top (22) plate and a bottom (70). Pre compression improves the resilient response of the pins. The pin crows (40) are maintained relatively coplanar by the engagement of at least one flang (44a-b) against an up-stop surface 90 of plate 20, thereby insuring coplanarity of the crowns. The pin guide (12) is maintained in alignment with the retainer 14 by establishing a registration corner (506) and driving the guide into the corner by elastomers in at least one diagonally opposite corner.Type: GrantFiled: June 19, 2013Date of Patent: February 16, 2016Assignee: Johnstech International CorporationInventors: Jathan Edwards, Charles Marks, Brian Halvorson
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Publication number: 20150015287Abstract: The test system provides an array of test probes having a cross beam. The probes pass through a first or upper probe guide retainer which has a plurality of slot sized to receive the probes in a way that they cannot rotate. The probes are biased upwardly through the retainer by an elastomeric block having a similar array of slots. The elastomer is then capped at its bottom by a second or lower retainer with like slots to form a sandwich with the elastomer therebetween. The bottom ends of the probes are group by probe height. A plurality of flex circuits at the different heights engage bottom probe ends at their respective height levels and take continue the circuits to a probe card where test signals originate.Type: ApplicationFiled: July 10, 2014Publication date: January 15, 2015Inventors: John DeBauche, Dan Campion, Michael Andres, Steve Rott, Jeffrey Sherry, Brian Halvorson, Brian Eshult
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Publication number: 20130342233Abstract: A testing device for wafer level testing of IC circuits is disclosed. An upper and lower pin (22, 62) are configured to slide relatively to each other and are held in electrically biased contact by an elastomer (80). The elastomer is precompressed from its natural rest state between a top (22) plate and a bottom (70). Pre compression improves the resilient response of the pins. The pin crows (40) are maintained relatively coplanar by the engagement of at least one flang (44a-b) against an up-stop surface 90 of plate 20, thereby insuring coplanarity of the crowns. The pin guide (12) is maintained in alignment with the retainer 14 by establishing a registration corner (506) and driving the guide into the corner by elastomers in at least one diagonally opposite corner.Type: ApplicationFiled: June 19, 2013Publication date: December 26, 2013Inventors: Jathan Edwards, Charles Marks, Brian Halvorson