Patents by Inventor Brian P. Phillips

Brian P. Phillips has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • LPA receptor antagonists and uses thereof
    Patent number: 11939318
    Abstract: The present disclosure relates generally to compounds that bind to Lysophosphatidic Acid Receptor 1 (LPAR1) and act as antagonists of LPAR1. The disclosure further relates to the use of the compounds for the preparation of a medicament for the treatment of diseases and/or conditions through binding of LPAR1, including fibrosis and liver diseases such as non-alcoholic steatohepatitis (NASH), interstitial lung disease (ILD), or chronic kidney disease (CKD).
    Type: Grant
    Filed: December 6, 2022
    Date of Patent: March 26, 2024
    Assignee: Gilead Sciences, Inc.
    Inventors: Brian P. Bestvater, Joshua A. Kaplan, Barton W. Phillips, Kin S. Yang, Anna Zagorska
  • MICRO ASSEMBLY USING MICRO MULTI-TOOLS
    Publication number: 20190351516
    Abstract: Disclosed is a multi-tool assembly system and associated methods for threading small spheres or other objects with through-holes onto small diameter wire or fiber, trimming excess wire, and securing them in position with adhesive. The tools can precisely manipulate objects having diameters of less than 25 microns in a reliable, repeatable manner and may operate semi-autonomously, fully autonomously, or in a manual mode.
    Type: Application
    Filed: May 17, 2019
    Publication date: November 21, 2019
    Inventors: Brian P. Phillips, Richard J. Browne, Chris E. Barns, Shawn A. Boling, Derek Graham Aqui
  • Probe card system and method
    Patent number: 5506498
    Abstract: A semiconductor wafer probe test interface system (2) and method of operating the system. The wafer probe system includes a plurality of cassettes (302) adapted to hold wafer probe test cards (304). The cassettes are loaded into position for testing of semiconductor wafers with a transport assembly system (6). A memory device (316) on the cassette is used to store data regarding usage of the card such as number of wafer touchdowns. A smart controller (220) has the capability to "talk" to the prober and tester.
    Type: Grant
    Filed: March 9, 1995
    Date of Patent: April 9, 1996
    Assignee: Xandex, Inc.
    Inventors: James C. Anderson, Brian P. Phillips, Charles Honek
  • Probe card system
    Patent number: 5254939
    Abstract: A semiconductor wafer probe test interface system (2) and method of operating the system. The wafer probe system includes a plurality of cassettes (302) adapted to hold wafer probe test cards (304). The cassettes are loaded into position for testing of semiconductor wafers with a transport assembly system (6). A memory device (316) on the cassette is used to store data regarding usage of the card such as number of wafer touchdowns. A smart controller (220) has the capability to "talk" to the prober and tester.
    Type: Grant
    Filed: March 20, 1992
    Date of Patent: October 19, 1993
    Assignee: Xandex, Inc.
    Inventors: James C. Anderson, Brian P. Phillips, Charles Honek