Abstract: A method and apparatus for docking an electronic test head with a peripheral, which positions devices for testing. Exact-constraint alignment features, also sometimes known as kinematic features, are incorporated to provide repeatable positioning of the test head in three degrees of freedom with respect to the docking plane of the peripheral. A distinct alignment feature is used to provide planarity and to establish the required docked distance between the test head and the peripheral. The exact-constraint alignment features are mounted compliantly to enable them to position the test head in the plane while the test head is away from its final docked distance and to maintain that position as the test head is moved to its final docked position.

Abstract: A positioner, such as a test head carrier for a semiconductor wafer and device tester, includes a vertical support and a main arm for supporting a test head. The main arm is suspended for vernier movement by use of a counterbalancing force such as counterweights. The suspension of the main arm is performed at a mechanical advantage so that reduced counter-blancing force and correspondingly large movements on the counterblance side are used to effect the vernier movement. The vertical support may be adjusted with a non-compliant drive such as a ball screw mechanism. The vernier movement can also be used to sense collisions and other positioning errors and actuation of the drive for the vertical support can be controlled accordingly.

Abstract: A safety lock system prevents unlocking of a balanced loaded unit when the loaded unit becomes unbalanced. A plurality of calipers applies pressure on opposite sides of a guide rail. A lock block couples the load to at least one of the calipers for movement of the load along the guide rail. A rotatable handle is coupled to the calipers through a shaft. Rotation of the handle locks or unlocks the lock block against vertical movement. A safety block is coupled to the loaded unit and is moveable with the loaded unit for preventing rotation of the handle upon a preselected movement of the loaded unit relative to the lock block.

Abstract: A system is useful for positioning a load, such as a test head. The system includes an arm which supports the load and which moves along a first vertical axis. The system also includes a rotation unit for rotating the first vertical axis about a second vertical axis spaced apart from the first vertical axis.

Abstract: A positioner, such as a test head carrier for a semiconductor wafer and device tester, includes a vertical support and a main arm for supporting a test head. The main arm is suspended for vernier movement by use of a counterbalancing force such as counterweights. The suspension of the main arm is performed at a mechanical advantage so that reduced counter-blancing force and correspondingly large movements on the counterblance side are used to effect the vernier movement. The vertical support may be adjusted with a non-compliant drive such as a ball screw mechanism. The vernier movement can also be used to sense collisions and other positioning errors and actuation of the drive for the vertical support can be controlled accordingly.

Abstract: A portable door security mechanism which allows an existing door to be temporarily secured from the non-hinged side of the door without destruction or penetration of the door, the door frame or any existing components of the door, is disclosed. The device uses a cylindrical locking pin which is designed to slip underneath the door to be secured and rotated such that part of the locking pin protrudes upward to prevent the door from opening from the inside. The locking pin is secured to a base plate member and a cover plate which, when interlocked over a portion of the locking pin, is disposed to accept a conventional pad lock or similar device. The disclosed security mechanism can be folded through a hinge mechanism for convenience and can be applied or removed quickly without having access to the interior side of the door.

Abstract: A portable door security mechanism which allows an existing door to be temporarily secured from the non-hinged side of the door without destruction or penetration of the door, the door frame or any existing components of the door, is disclosed. The device uses a cylindrical locking pin which is designed to slip underneath the door to be secured and rotated such that part of the locking pin protrudes upward to prevent the door from opening from the inside. The locking pin is secured to a base plate member and a cover plate which, when interlocked over a portion of the locking pin, is disposed to accept a conventional pad lock or similar device. The disclosed security mechanism can be folded through a hinge mechanism for convenience and can be applied or removed quickly without having access to the interior side of the door.

Abstract: An electronic device testing system of the type in which a test head is mounted for pivotal movement about three orthogonal axes. A cable is introduced to the test head along an axis peripendicular to the horizontal axis extending through the means by which the test head is mounted for pivotal movement about the horizontal axis. The system also has a cable support attached at one end to the test head cabinet containing part of the electronics. The cable, extending between the test cabinet and the test head, is supported by the cable support. The cable support is arranged to adjust to changes in the spacing of its end and the orientation of its axis caused by changes in the position or orientation of the test head.