Abstract: A system includes a semiconductor die mounted on a packaging substrate, a signal redistribution layer that is formed within the packaging substrate, a power plane that is formed on a surface of the packaging substrate, and a ground plane that is formed within the packaging substrate. The power plane couples the semiconductor die to a capacitor disposed on the packaging substrate and the ground plane is disposed between the power plane and the signal redistribution layer. An advantage of the disclosed system is that loop inductance between power and ground paths to a packaged semiconductor die is reduced, thereby lowering the impedance of the packaged semiconductor die system and signal noise associated with the packaged semiconductor system.

Abstract: A system includes a semiconductor die mounted on a packaging substrate, a signal redistribution layer that is formed within the packaging substrate, a power plane that is formed on a surface of the packaging substrate, and a ground plane that is formed within the packaging substrate. The power plane couples the semiconductor die to a capacitor disposed on the packaging substrate and the ground plane is disposed between the power plane and the signal redistribution layer. An advantage of the disclosed system is that loop inductance between power and ground paths to a packaged semiconductor die is reduced, thereby lowering the impedance of the packaged semiconductor die system and signal noise associated with the packaged semiconductor system.

Abstract: A system includes a semiconductor die mounted on a packaging substrate, a signal redistribution layer that is formed within the packaging substrate, a power plane that is formed on a surface of the packaging substrate, and a ground plane that is formed within the packaging substrate. The power plane couples the semiconductor die to a capacitor disposed on the packaging substrate and the ground plane is disposed between the power plane and the signal redistribution layer. An advantage of the disclosed system is that loop inductance between power and ground paths to a packaged semiconductor die is reduced, thereby lowering the impedance of the packaged semiconductor die system and signal noise associated with the packaged semiconductor system.

Abstract: A device and method for providing access to a signal of a flip chip semiconductor die. A hole is bored into a semiconductor die to a test probe point. The hole is backfilled with a conductive material, electrically coupling the test probe point to a signal redistribution layer. A conductive bump of the signal redistribution layer is electrically coupled to a conductive contact of a package substrate. An external access point of the package substrate is electrically coupled to the conductive contact, such that signals of the flip chip semiconductor die are accessible for measurement at the external access point.

Abstract: A system includes a semiconductor die mounted on a packaging substrate, a signal redistribution layer that is formed within the packaging substrate, a power plane that is formed on a surface of the packaging substrate, and a ground plane that is formed within the packaging substrate. The power plane couples the semiconductor die to a capacitor disposed on the packaging substrate and the ground plane is disposed between the power plane and the signal redistribution layer. An advantage of the disclosed system is that loop inductance between power and ground paths to a packaged semiconductor die is reduced, thereby lowering the impedance of the packaged semiconductor die system and signal noise associated with the packaged semiconductor system.

Abstract: A device and method for providing access to a signal of a flip chip semiconductor die. A hole is bored into a semiconductor die to a test probe point. The hole is backfilled with a conductive material, electrically coupling the test probe point to a signal redistribution layer. A conductive bump of the signal redistribution layer is electrically coupled to a conductive contact of a package substrate. An external access point of the package substrate is electrically coupled to the conductive contact, such that signals of the flip chip semiconductor die are accessible for measurement at the external access point.

Abstract: A device and method for providing access to a signal of a flip chip semiconductor die. A hole is bored into a semiconductor die to a test probe point. The hole is backfilled with a conductive material, electrically coupling the test probe point to a signal redistribution layer. A conductive bump of the signal redistribution layer is electrically coupled to a conductive contact of a package substrate. An external access point of the package substrate is electrically coupled to the conductive contact, such that signals of the flip chip semiconductor die are accessible for measurement at the external access point.

Abstract: A device and method for providing access to a signal of a flip chip semiconductor die. A hole is bored into a semiconductor die to a test probe point. The hole is backfilled with a conductive material, electrically coupling the test probe point to a signal redistribution layer. A conductive bump of the signal redistribution layer is electrically coupled to a conductive contact of a package substrate. An external access point of the package substrate is electrically coupled to the conductive contact, such that signals of the flip chip semiconductor die are accessible for measurement at the external access point.