Patents by Inventor Bryan Edward Cole
Bryan Edward Cole has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
-
Patent number: 11921154Abstract: A test system for testing a device having a plurality of electrical contacts. The test system comprising: a device table operable to hold at least one device under test, a probe comprising at least one probe end for contacting electrical contacts of a device under test, a movement mechanism operable to move one or both of the device table and the probe so as to bring the at least one probe end into contact with at least one electrical contact of a device under test, and a profile determining system configured to determine a profile of the electrical contacts of a device under test.Type: GrantFiled: May 16, 2022Date of Patent: March 5, 2024Assignee: TeraView LimitedInventors: Bryan Edward Cole, Darius Sullivan, Simon Chandler
-
Publication number: 20230324452Abstract: A reflectometer for allowing a test of a device, the reflectometer comprising: a source of pulsed radiation; a first photoconductive element configured to output a pulse in response to irradiation from the pulsed source; a second photoconductive element configured to receive a pulse; and a transmission line arrangement configured to direct the pulse from the first photoconductive element to the device under test and to direct the pulse reflected from the device under test to the second photoconductive element. At least one of the first and second photoconductive elements is provided on a different substrate to that of the transmission line arrangement.Type: ApplicationFiled: June 15, 2023Publication date: October 12, 2023Applicant: TeraView LimitedInventor: Bryan Edward Cole
-
Patent number: 11726136Abstract: A reflectometer for allowing a test of a device, the reflectometer comprising: a source of pulsed radiation; a first photoconductive element configured to output a pulse in response to irradiation from the pulsed source; a second photoconductive element configured to receive a pulse; and a transmission line arrangement configured to direct the pulse from the first photoconductive element to the device under test and to direct the pulse reflected from the device under test to the second photoconductive element. At least one of the first and second photoconductive elements is provided on a different substrate to that of the transmission line arrangement.Type: GrantFiled: October 6, 2021Date of Patent: August 15, 2023Assignee: TeraView LimitedInventor: Bryan Edward Cole
-
Publication number: 20220268833Abstract: A test system for testing a device having a plurality of electrical contacts. The test system comprising: a device table operable to hold at least one device under test, a probe comprising at least one probe end for contacting electrical contacts of a device under test, a movement mechanism operable to move one or both of the device table and the probe so as to bring the at least one probe end into contact with at least one electrical contact of a device under test, and a profile determining system configured to determine a profile of the electrical contacts of a device under test.Type: ApplicationFiled: May 16, 2022Publication date: August 25, 2022Applicant: TeraView LimitedInventors: Bryan Edward Cole, Darius Sullivan, Simon Chandler
-
Patent number: 11366158Abstract: A test system for testing a device having a plurality of electrical contacts. The test system comprising: a device table operable to hold at least one device under test, a probe comprising at least one probe end for contacting electrical contacts of a device under test, a movement mechanism operable to move one or both of the device table and the probe so as to bring the at least one probe end into contact with at least one electrical contact of a device under test, and a profile determining system configured to determine a profile of the electrical contacts of a device under test.Type: GrantFiled: December 16, 2016Date of Patent: June 21, 2022Assignee: TeraView LimitedInventors: Bryan Edward Cole, Darius Sullivan, Simon Chandler
-
Publication number: 20220026482Abstract: A reflectometer for allowing a test of a device, the reflectometer comprising: a source of pulsed radiation; a first photoconductive element configured to output a pulse in response to irradiation from the pulsed source; a second photoconductive element configured to receive a pulse; and a transmission line arrangement configured to direct the pulse from the first photoconductive element to the device under test and to direct the pulse reflected from the device under test to the second photoconductive element. At least one of the first and second photoconductive elements is provided on a different substrate to that of the transmission line arrangement.Type: ApplicationFiled: October 6, 2021Publication date: January 27, 2022Inventor: Bryan Edward Cole
-
Patent number: 11169202Abstract: A reflectometer for allowing a test of a device. The reflectometer comprises a source of pulsed radiation, a first photoconductive element configured to output a pulse in response to irradiation from the pulsed source, a second photoconductive element configured to receive a pulse, a transmission line arrangement configured to direct the pulse from the first photoconductive element to the device under test and to direct the pulse reflected from the device under test to the second photoconductive element, and a termination resistance provided for the transmission line configured to match the impedance of the transmission line.Type: GrantFiled: May 29, 2018Date of Patent: November 9, 2021Assignee: TeraView LimitedInventor: Bryan Edward Cole
-
Publication number: 20180364301Abstract: A test system for testing a device having a plurality of electrical contacts. The test system comprising: a device table operable to hold at least one device under test, a probe comprising at least one probe end for contacting electrical contacts of a device under test, a movement mechanism operable to move one or both of the device table and the probe so as to bring the at least one probe end into contact with at least one electrical contact of a device under test, and a profile determining system configured to determine a profile of the electrical contacts of a device under test.Type: ApplicationFiled: December 16, 2016Publication date: December 20, 2018Applicant: TeraView LimitedInventors: Bryan Edward Cole, Darius Sullivan, Simon Chandler
-
Publication number: 20180275190Abstract: A reflectometer for allowing a test of a device. The reflectometer comprises a source of pulsed radiation, a first photoconductive element configured to output a pulse in response to irradiation from the pulsed source, a second photoconductive element configured to receive a pulse, a transmission line arrangement configured to direct the pulse from the first photoconductive element to the device under test and to direct the pulse reflected from the device under test to the second photoconductive element, and a termination resistance provided for the transmission line configured to match the impedance of the transmission line.Type: ApplicationFiled: May 29, 2018Publication date: September 27, 2018Inventor: Bryan Edward Cole
-
Patent number: 10076261Abstract: A range of technique for investigating a sample such as obtaining images and/or spectral information are described. The techniques include a method for deriving structural information about a sample as a continuous function of the depth below the surface of the sample, a method for evaluating a part of the structure of a sample located between two interfaces within the sample, and a contrast enhancing method and apparatus which has a quick image acquisition time.Type: GrantFiled: March 5, 2001Date of Patent: September 18, 2018Assignee: TeraView LimitedInventors: Donald Dominic Arnone, Bryan Edward Cole, Craig Michael Ciesla
-
Patent number: 10006960Abstract: A reflectometer for allowing a test of a device, the reflectometer comprising: a source of pulsed radiation; a first photoconductive element configured to output a pulse in response to irradiation from said pulsed source; a second photoconductive element configured to receive a pulse; a transmission line arrangement configured to direct the pulse from the first photoconductive element to the device under test and to direct the pulse reflected from the device under test to the second photoconductive element; and a termination resistance provided for said transmission line configured to match the impedance of the transmission line.Type: GrantFiled: February 13, 2012Date of Patent: June 26, 2018Assignee: TeraView LimitedInventor: Bryan Edward Cole
-
Patent number: 9006660Abstract: A THz radiation probe (1) for examining an object (8), the probe comprising a first portion configured to be inserted into an opening of said object in a first direction (5), said probe further comprising at least one THz emitter (15), directing means (7) for directing THz radiation emitted from said emitter to said object via an aperture (2) located at said first portion and subsequently from said object to at least one THz detector (17) and, means for scanning said emitted THz radiation across said object in a scan direction, said scan direction having a component in said first direction (5).Type: GrantFiled: August 28, 2008Date of Patent: April 14, 2015Assignee: TeraView LimitedInventors: Bryan Edward Cole, Vincent Patrick Wallace, Michael John Withers, John Baker, Brian Robertson
-
Publication number: 20140021963Abstract: A reflectometer for allowing a test of a device, the reflectometer comprising: a source of pulsed radiation; a first photoconductive element configured to output a pulse in response to irradiation from said pulsed source; a second photoconductive element configured to receive a pulse; a transmission line arrangement configured to direct the pulse from the first photoconductive element to the device under test and to direct the pulse reflected from the device under test to the second photoconductive element; and a termination resistance provided for said transmission line configured to match the impedance of the transmission line.Type: ApplicationFiled: February 13, 2012Publication date: January 23, 2014Applicant: TERAVIEW LIMITEDInventor: Bryan Edward Cole
-
Publication number: 20110028824Abstract: A THz radiation probe (1) for examining an object (8), the probe comprising a first portion configured to be inserted into an opening of said object in a first direction (5), said probe further comprising at least one THz emitter (15), directing means (7) for directing THz radiation emitted from said emitter to said object via an aperture (2) located at said first portion and subsequently from said object to at least one THz detector (17) and, means for scanning said emitted THz radiation across said object in a scan direction, said scan direction having a component in said first direction (5).Type: ApplicationFiled: August 28, 2008Publication date: February 3, 2011Inventors: Bryan Edward Cole, Vincent Patrick Wallace, Michael John Withers, John Baker, Brian Robertson
-
Patent number: 7335883Abstract: A method of imaging a sample, the method comprising: (a) irradiating a sample with a pulse of electromagnetic radiation, said pulse having a plurality of frequencies in the range from 25 GHz to 100 THz; (b) determining a first parameter related to the amplitude of the radiation, which is either reflected from and/or transmitted by the sample, in the time domain; (c) calculating the value of the first parameter at a first time value relative to the value of the first parameter at a second time value which coincides with a physical feature of the dataset of the first parameter with respect to time; and (d) generating an image by plotting the value calculated in step (c) for different points of the sample.Type: GrantFiled: July 29, 2002Date of Patent: February 26, 2008Assignee: Teraview LimitedInventors: Vincent Patrick Wallace, Ruth Mary Woodward, Donald Dominic Arnone, Bryan Edward Cole
-
Patent number: 7315175Abstract: A probe for examining a sample (5), the probe including an emitter (1) for emitting radiation, a detector (1) for detecting radiation and a dielectric member (3) configured to direct radiation from the emitter (1) to the sample (5) and to direct radiation reflected by the sample (5) to the detector (1), wherein in use, the dielectric member (3) occupies at least half of the radiation path length from the emitter (1) to the sample (5) to the detector (1).Type: GrantFiled: January 30, 2002Date of Patent: January 1, 2008Assignee: TeraView LimitedInventor: Bryan Edward Cole
-
Patent number: 7214940Abstract: An apparatus for investigating a sample comprising a source of a beam of radiation, a detector for detecting a beam of radiation reflected by or transmitted through a sample to be imaged, an optical subsystem for manipulating the beam between the source and detector and means for translating the optical subsystem along a first translation axis relative to the source and detector to scan the beam across the sample, wherein the source and the detector are on opposite sides of the subsystem and the beam from the source and the beam reflected or transmitted each enter and exit the subsystem in a direction parallel to the first direction of translation. The apparatus is also suitable for maintaining the relative phase of two beams of radiation, during translation of an optical subsystem.Type: GrantFiled: January 16, 2002Date of Patent: May 8, 2007Assignee: TeraView LimitedInventors: Julian Alexander Cluff, Bryan Edward Cole, Donald Dominic Arnone
-
Patent number: 7174037Abstract: An apparatus and method for imaging a sample, the apparatus including a source for irradiating a sample with a beam of substantially continuous electromagnetic radiation having a frequency in the range 25 GHz to 100 THz; means for subdividing an area of the sample which is to be imaged into a two dimensional array of pixels; means for detecting radiation from each pixel wherein the detector is configured to detect a phase dependent quantity of the detected radiation which is measured relative to the radiation which irradiates the sample.Type: GrantFiled: February 28, 2001Date of Patent: February 6, 2007Assignee: Teraview LimitedInventors: Donald Dominic Arnone, Craig Michael Ciesla, Bryan Edward Cole
-
Patent number: 7152007Abstract: A system for investigating a sample, the system including a detector having non-linear current voltage characteristics and being configured to mix two radiation signals having frequencies in the range from 25 GHz to 100 THz, one of the signals being a local oscillator signal and the other signal being a sample signal carrying information about the sample being investigated, the system further having a quantum cascade laser for providing at least the local oscillator signal.Type: GrantFiled: December 9, 2003Date of Patent: December 19, 2006Assignee: Tera View LimitedInventors: Donald Dominic Arnone, Craig Michael Ciesla, Bryan Edward Cole, Stefano Barbieri
-
Patent number: 6865014Abstract: An apparatus for investigating a sample, the apparatus comprising an emitter (1) for irradiating the sample (27) with a beam of emitted electromagnetic radiation; and a detector (49) for detecting the radiation reflected from the sample, wherein there is an optically non-linear member (15) which functions as both an active part of the emitter and an active part of the detector, said emitter and detector using the same part of the optically non-linear member (15). The electromagnetic radiation is primarily intended to be in the terahertz (THz) frequency range.Type: GrantFiled: March 29, 2001Date of Patent: March 8, 2005Assignee: Teraview LimitedInventors: Craig Michael Ciesla, Bryan Edward Cole, Donald Dominic Arnone