Abstract: A technical problem to be achieved by the present disclosure is to provide an adhesive resin composition for a conductor, which contains inorganic fillers having different average particle diameters and has enhanced thermal conductivity as a result of controlling the content of the inorganic fillers, and an adhesive film for a semiconductor produced using the same.

Abstract: A test apparatus for generating a test case based on a fault injection technique and a method of controlling the same are disclosed. The method includes identifying at least one function in a program to be tested based on a software detailed design, generating a test design document based on fault location that can be generated in connection with the identified at least one function and a fault type to be injected into the fault location, searching for the fault location to be injected based on the generated test design document and source code of the program, determining a fault injection scheme and the fault type, and predicting a result by applying a fault injection corresponding to the fault injection scheme and the fault type into the searched location to generate a test case.

Abstract: A technical problem to be achieved by the present disclosure is to provide an adhesive resin composition for a conductor, which contains inorganic fillers having different average particle diameters and has enhanced thermal conductivity as a result of controlling the content of the inorganic fillers, and an adhesive film for a semiconductor produced using the same.

Abstract: A test apparatus for generating a test case based on a fault injection technique and a method of controlling the same are disclosed. The method includes identifying at least one function in a program to be tested based on a software detailed design, generating a test design document based on fault location that can be generated in connection with the identified at least one function and a fault type to be injected into the fault location, searching for the fault location to be injected based on the generated test design document and source code of the program, determining a fault injection scheme and the fault type, and predicting a result by applying a fault injection corresponding to the fault injection scheme and the fault type into the searched location to generate a test case.

Abstract: In a method of analyzing a fault and/or error of an electronic system according to some example embodiments, a system call that accesses a hardware is replaced with a hooking system call including a code that executes the system call and a code that obtains monitoring information, the monitoring information including system call execution information and hardware performance information is obtained by executing the hooking system call when the hooking system call is called instead of the system call, and the monitoring information is recorded to analyze the fault/error of the electronic system based on the monitoring information.

Abstract: The present invention relates to a system test apparatus. The system test apparatus includes an insertion module configured to insert a test agent into a process control block, a hooking module configured to hook a test target to a test code using the test agent when an event related to the test target occurs, a scanning module configured to collect pieces of test information about a process in which the event related to the test target has occurred when the test target is hooked, and a logging module configured to store the pieces of test information collected by the scanning module.

Abstract: In a method of analyzing a fault and/or error of an electronic system according to some example embodiments, a system call that accesses a hardware is replaced with a hooking system call including a code that executes the system call and a code that obtains monitoring information, the monitoring information including system call execution information and hardware performance information is obtained by executing the hooking system call when the hooking system call is called instead of the system call, and the monitoring information is recorded to analyze the fault/error of the electronic system based on the monitoring information.

Abstract: The present invention relates to an exception handling test apparatus and method. The exception handling test apparatus includes a generation module configured to generate a modified device driver based on a defect model and information obtained from the device manager, a hooking module configured to hook the device driver using the modified device driver, a scanning module configured to collect test information returned from the hooked modified device driver to the application while the application operates, and an analysis module configured to analyze the collected test information.

Abstract: The present invention relates to a communication test apparatus. The communication test apparatus includes an insertion module configured to insert a test agent into the process control block, a hooking module configured to hook a test target to a test code using the test agent when an event-related to communication occurs between the plurality of processes, a scanning module configured to collect pieces of test information about communication between the plurality of processes when the test target is hooked to the test code, and a logging module configured to store the pieces of test information collected by the scanning module.

Abstract: A method and a system that checks software and includes a hooking module that collects process control block (PCB) information corresponding to each process on a kernel by being executed at the time of booting a system. In addition, the system includes a safety service module that searches and defends the defects of the process by being inserted into a memory region of the process based on the collected PCB information.

Abstract: The present invention features an operational system test method, comprising defining a fault model, inserting a test agent, hooking a test location, collecting test information, and removing the test agent. The invention also features an operational system test method, comprising defining a fault model, inserting a test agent, identifying a memory area according to a test location, hooking the identified memory area, collecting test information, and removing the test agent.

Abstract: The present invention relates to a communication test apparatus. The communication test apparatus includes an insertion module configured to insert a test agent into the process control block, a hooking module configured to hook a test target to a test code using the test agent when an event-related to communication occurs between the plurality of processes, a scanning module configured to collect pieces of test information about communication between the plurality of processes when the test target is hooked to the test code, and a logging module configured to store the pieces of test information collected by the scanning module.

Abstract: The present invention relates to an exception handling test apparatus and method. The exception handling test apparatus includes a generation module configured to generate a modified device driver based on a defect model and information obtained from the device manager, a hooking module configured to hook the device driver using the modified device driver, a scanning module configured to collect test information returned from the hooked modified device driver to the application while the application operates, and an analysis module configured to analyze the collected test information.

Abstract: The present invention relates to a system test apparatus. The system test apparatus includes an insertion module configured to insert a test agent into a process control block, a hooking module configured to hook a test target to a test code using the test agent when an event related to the test target occurs, a scanning module configured to collect pieces of test information about a process in which the event related to the test target has occurred when the test target is hooked, and a logging module configured to store the pieces of test information collected by the scanning module.

Abstract: Provided is an apparatus and method for automatically extracting an interface of embedded software. The method defines an interface of embedded software as a test item for test of the interface of the embedded software, and generates an interface symbol corresponding to the defined test item. The location of the interface symbol is determined, and a test case is generated based on the interface symbol and its location in the software. Embodiments of the invention thus facilitate the testing of software at interfaces between layers in the software.

Abstract: Embodiments of the invention provide a device and a method for automatically testing embedded software, and more specifically for testing interfaces between layers of the embedded software. In one embodiment, the device includes: an emulator; a server including embedded software; an evaluation board configured to download the embedded software from the server and controlled by the emulator; and a host system configured to receive the embedded software from the server and automatically generate test cases for testing the embedded software using the emulator.

Abstract: The present invention features an operational system test method, comprising defining a fault model, inserting a test agent, hooking a test location, collecting test information, and removing the test agent. The invention also features an operational system test method, comprising defining a fault model, inserting a test agent, identifying a memory area according to a test location, hooking the identified memory area, collecting test information, and removing the test agent.

Abstract: Embodiments of the invention provide a device and a method for automatically testing embedded software, and more specifically for testing interfaces between layers of the embedded software. In one embodiment, the device includes: an emulator; a server including embedded software; an evaluation board configured to download the embedded software from the server and controlled by the emulator; and a host system configured to receive the embedded software from the server and automatically generate test cases for testing the embedded software using the emulator.

Abstract: Provided is an apparatus and method for automatically extracting an interface of embedded software. The method defines an interface of embedded software as a test item for test of the interface of the embedded software, and generates an interface symbol corresponding to the defined test item. The location of the interface symbol is determined, and a test case is generated based on the interface symbol and its location in the software. Embodiments of the invention thus facilitate the testing of software at interfaces between layers in the software.

Abstract: An automatic test data generating apparatus for automatically generating test data based on the input items of a user in order to test a digital TV application software environment (DASE) system and a method therefor. The automatic test data generating apparatus includes a database for storing at least information on raw data and the MPEG transport stream standard and a test data generator for generating test data corresponding to the input items of the user based on the input items of the user and information on the raw data and the MPEG transport stream standard. Accordingly, the time and expenses spent on generating test data for testing the DASE system are reduced and those who do not have special knowledge can generate the test data.