Patents by Inventor Byron L. Meadows

Byron L. Meadows has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Forward voltage short-pulse technique for measuring high power laser array junction temperture
    Patent number: 8112243
    Abstract: The present invention relates to a method of measuring the temperature of the P-N junction within the light-emitting region of a quasi-continuous-wave or pulsed semiconductor laser diode device. A series of relatively short and low current monitor pulses are applied to the laser diode in the period between the main drive current pulses necessary to cause the semiconductor to lase. At the sufficiently low current level of the monitor pulses, the laser diode device does not lase and behaves similar to an electronic diode. The voltage across the laser diode resulting from each of these low current monitor pulses is measured with a high degree of precision. The junction temperature is then determined from the measured junction voltage using their known linear relationship.
    Type: Grant
    Filed: May 9, 2008
    Date of Patent: February 7, 2012
    Assignee: The United States of America as represented by the Administrator of the National Aeronautics and Space Administration
    Inventors: Byron L. Meadows, Frazin Amzajerdian, Bruce W. Barnes, Nathaniel R. Baker
  • Forward Voltage Short-Pulse Technique for Measuring High Power Laser Diode Array Junction Temperature
    Publication number: 20080319690
    Abstract: The present invention relates to a method of measuring the temperature of the P-N junction within the light-emitting region of a quasi-continuous-wave or pulsed semiconductor laser diode device. A series of relatively short and low current monitor pulses are applied to the laser diode in the period between the main drive current pulses necessary to cause the semiconductor to lase. At the sufficiently low current level of the monitor pulses, the laser diode device does not lase and behaves similar to an electronic diode. The voltage across the laser diode resulting from each of these low current monitor pulses is measured with a high degree of precision. The junction temperature is then determined from the measured junction voltage using their known linear relationship.
    Type: Application
    Filed: May 9, 2008
    Publication date: December 25, 2008
    Applicant: USA as represented by the Administrator of the National Aeronautics & Space Administration
    Inventors: Byron L. Meadows, Frazin Amzajerdian, Bruce W. Barnes, Nathaniel R. Baker