Abstract: A method utilizing spatially selective laser doping for irradiating predetermined portions of a substrate of a semiconductor material is disclosed. Dopants are deposited onto the surface of a substrate. A pulsed, visible beam is directed to and preferentially absorbed by the substrate only in those regions requiring doping. Spatial modes of the incoherent beam are overlapped and averaged, providing uniform irradiation requiring fewer laser shots. The beam is then focused to the predetermined locations of the substrate for implantation or activation of the dopants. The method provides for scanning and focusing of the beam across the substrate surface, and irradiation of multiple locations using a plurality of beams. The spatial selectivity, combined with visible laser wavelengths, provides greater efficiency in doping only desired substrate regions, while reducing the amount of irradiation required.

Abstract: A method for forming electrically conductive patterns to provide an electrically conductive path on a polymer tube is provided. The method includes the steps of establishing a polymer tube and mounting such in a displaceable and rotatable mounting that is adapted to provide both axial and rotational motion. This is followed by forming at least one channel having a predetermined pattern in the polymer tube with a focused energy beam, the channel then being filled with an electrically conductive paste or electrically conductive slurry material. The polymer tube is then heated to temperatures less than 250° C. to cure the electrically conductive paste or electrically conductive slurry material. The electrically conductive paste or electrically conductive slurry material is then covered with a polymer layer.

Abstract: A method for forming electrically conductive patterns to provide an electrically conductive path on a polymer tube is provided. The method includes the steps of establishing a polymer tube and mounting such in a displaceable and rotatable mounting that is adapted to provide both axial and rotational motion. This is followed by forming at least one channel having a predetermined pattern in the polymer tube with a focused energy beam, the channel then being filled with an electrically conductive paste or electrically conductive slurry material. The polymer tube is then heated to temperatures less than 250° C. to cure the electrically conductive paste or electrically conductive slurry material. The electrically conductive paste or electrically conductive slurry material is then covered with a polymer layer.

Abstract: Pulse-position synchronized deposition of a material in miniature structure manufacturing processes is carried out in a fabrication tool including a material carrier element, a source of energy generating pulses of energy, a substrate, and a control unit operatively coupled to the source of energy, substrate, and the material carrier element. The control unit exposes a first area of the material carrier element to a first pulse of energy, pauses the exposure while initiating relative motion between the source of energy and the substrate at a predetermined first speed and relative motion between the material carrier element and the energy source at a predetermined second speed which is a function of the first speed, and slowing (or stopping) relative motion between the energy source, material carrier element, and the substrate, while exposing the unablated area of the material carrier element adjacent to previously ablated area to a second pulse of energy.

Abstract: A system for laser marking a gemstone (10) is provided. A pulsed laser (20) generates a laser pulse (40) which is then directed towards a focusing element (60) through optical means (30). Lens (60) focuses the laser pulse into focused pulse (70). The focused pulse (70) is projected onto a surface of gemstone (80) which is mounted in fixture (90). A computer control system (110) allows a user to input and control a predetermined path of displacement between the gemstone (80) and the focused laser pulse (70).

Abstract: A system for laser marking a gemstone (10) is provided. A pulsed laser (20) generates a laser pulse (40) which is then directed towards a focusing element (60) through optical means (30). Lens (60) focuses the laser pulse into focused pulse (70). The focused pulse (70) is projected onto a surface of gemstone (80) which is mounted in fixture (90). A computer control system (110) allows a user to input and control a predetermined path of displacement between the gemstone (80) and the focused laser pulse (70).

Abstract: Pulse-position synchronized deposition of a material in miniature structure manufacturing processes is carried out in a fabrication tool including a material carrier element, a source of energy generating pulses of energy, a substrate, and a control unit operatively coupled to the source of energy, substrate, and the material carrier element. The control unit exposes a first area of the material carrier element to a first pulse of energy, pauses the exposure while initiating relative motion between the source of energy and the substrate at a predetermined first speed and relative motion between the material carrier element and the energy source at a predetermined second speed which is a function of the first speed, and slowing (or stopping) relative motion between the energy source, material carrier element, and the substrate, while exposing the unablated area of the material carrier element adjacent to previously ablated area to a second pulse of energy.

Abstract: A system and method for marking a surface of a gemstone employs an optical passage member positioned in the resonant cavity of an excimer laser in proximity to the front laser mirror, so that to pattern the generated laser beam in a predetermined fashion and to expose the gemstone to the patterned laser beam for evaporating the material of the gemstone from the surface of the gemstone at locations predetermined by the optical passage member. The system is operated in two marking modes. At the first mode, when the optical passage member is an aperture, a simple spot is projected onto the surface of the gemstone, and in order to inscribe the marks and characters on the surface of the gemstone, the gemstone is moved with respect to the laser beam by a precision motion system in accordance with a pre-set pattern.

Abstract: A system for laser marking a gemstone (10) is provided. A pulsed laser (20) generates a laser pulse (40) which is then directed towards a focusing element (60) through optical means (30). Lens (60) focuses the laser pulse into focused pulse (70). The focused pulse (70) is projected onto a surface of gemstone (80) which is mounted in fixture (90). A computer control system (110) allows a user to input and control a predetermined path of displacement between the gemstone (80) and the focused laser pulse (70).

Abstract: Discharge tubes formed of metal fluoride gases are used in apparatus for emitting high frequency laser and fluorescent light. The discharge tubes are resistant to corrosion from halogen-containing gas mixtures subjected to high frequency excitation in the apparatus.

Abstract: A high-power, high-frequency discharge apparatus is disclosed. An electrical wave is guided toward the discharge region by a hollow waveguide that is coupled to a discharge electrode via a waveguide transition element. The waveguide transition element can be formed of various shapes. Obstacles placed in the waveguide provide impedance matching and minimize power reflected back toward the source. The obstacles may be movable to optimize impedance matching.

Abstract: In a high-frequency discharge apparatus utilizing a discharge tube positioned between an electrode and a ground plane, the electrode is shaped so as to increase the uniformity of the electric field across the discharge tube. Furthermore, a transmission line is formed between a conductor connected to the electrode and the ground plane, and impedance matching in the transmission line is provided by metal and/or dielectric tuning slugs inserted between the conductor and the ground plane.

Abstract: An optical harmonic microscope assembly and an examination method which provides for focusing lased coherent light as an incident beam onto a specimen, disposing the optical path of a microscope and the incident beam at a relative angle in a range which is at least as broad as 0.degree.-90.degree., blocking the fundamental frequency of the lased light and viewing light of a harmonic of said fundamental frequency generated by nonlinear diffraction by said specimen.