Patents by Inventor Chang-Hoon Choi
Chang-Hoon Choi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20170026432Abstract: A transmitting apparatus is provided. The transmitting apparatus includes: an L1 signaling generator configured to generate L1 signaling including first information and second information; a frame generator configured to generate a frame including a payload including a plurality of sub frames; and a signal processor configured to insert a preamble including the L1 signaling in the frame and transmit the frame. The first information includes information required for decoding a first sub frame among the plurality of sub frames. Therefore, a processing delay in a receiving apparatus is reduced.Type: ApplicationFiled: July 22, 2016Publication date: January 26, 2017Applicant: SAMSUNG ELECTRONICS CO., LTD.Inventors: Jung-hyun PARK, Min-ho KIM, Sung-woo PARK, Sung-kyu JUNG, Chang-hoon CHOI, Doo-chan HWANG
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Publication number: 20160334389Abstract: The present invention relates to a method for screening an anticancer agent or a cancer preventive agent, comprising the steps of: (a) isolating mutant luterial or normal luterial from a body fluid extracted from a patient or a normal person; (b) treating the isolated mutant luterial with anticancer agent candidates or cancer preventive agent candidates; and (c) either selecting, as the anticancer agent, a candidate that reduces the size or changes the shape or increases the mobility of the mutant luterial, compared to the control mutant luterial upon treatment with the candidate, or selecting, as the cancer preventive agent, a candidate that suppresses the increase in size, minimizes the change in shape or maintains the mobility of luterial, compared to the control luterial, upon treatment with the candidate.Type: ApplicationFiled: January 14, 2015Publication date: November 17, 2016Inventors: Won Cheol CHOI, Young Ah KWON, Suk Hoon CHOI, Chang Hoon CHOI
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Publication number: 20160324896Abstract: The present invention relates to blood-derived luterial and a method for isolating and culturing the same. The luterial according to the present invention is a cell or cell-like structure having the following characteristics: (1) it is present in body fluids, including blood, sperm, intestinal juices, saliva, and cellular fluids; (2) it shows a positive staining with Janus green B, Acridine Orange and Rhodamine 123 in an immunofluorescence test; (3) in an optimal environment (pH 7.2-7.Type: ApplicationFiled: May 9, 2014Publication date: November 10, 2016Inventors: Won Cheol CHOI, Young Ah KWON, Suk Hoon Choi, Chang Hoon Choi
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Publication number: 20160169870Abstract: The present invention relates to a method for diagnosis of diseases using morphological characteristics of luterial which exists in blood. According to the present invention, morphological characteristics of luterial, such as the number, size or shape, and movement (nano-tracking speed) thereof change according to the kind and progress of a disease, and thus diagnosis and prognosis of a disease (particularly, cancer) can be effectively determined by observing and measuring the characteristics of luterial in the blood.Type: ApplicationFiled: January 14, 2014Publication date: June 16, 2016Inventors: Young Ah KWON, Won Cheol CHOI, Suk Hoon CHOI, Chang Hoon CHOI
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Publication number: 20160153918Abstract: An optical inspecting apparatus includes a first light source, a beam splitter, a first lens, a first light detector, and pinhole plates. The first light source emits a first light beam. The beam splitter transmits or reflects the first light beam. The first lens provides the first light beam to transmit through a transparent substrate of a photomask and forms a first focusing spot on a first surface of the transparent substrate or a top surface of a photomask pattern formed on the transparent substrate. The first light detector detects a first reflection light beam generated by reflecting the first light beam from the first surface of the transparent substrate or the top surface of the photomask pattern. The pinhole plates are disposed in front of the first light detector to filter noise in the reflection light beam.Type: ApplicationFiled: August 11, 2015Publication date: June 2, 2016Inventors: TAE-JOONG KIM, YOUNG-KYU PARK, Kl-JUNG SON, BYEONG-HWAN JEON, CHANG-HOON CHOI
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Publication number: 20160113622Abstract: Provided are a catheter for detection of ultrasound and photoacoustic signals and an image acquisition system using the catheter. The catheter for detection of ultrasound and photoacoustic signals includes a lens optical fiber where a lens is attached to an end of an optical fiber, an ultrasound transducer, a catheter main body where the lens optical fiber and the cable are disposed to pass through an inner portion thereof, a catheter head which is connected to an end of the catheter main body, and a membrane which surrounds a surface of the catheter head. The catheter is configured so as to irradiate condensed light by using the lens optical fiber and to receive the photoacoustic signal or to receive and transmit the ultrasound signal. Accordingly, it is possible to simultaneously acquire an ultrasound image and a high-resolution photoacoustic image.Type: ApplicationFiled: October 8, 2015Publication date: April 28, 2016Inventors: Chul Hong KIM, Sung Jo PARK, Chang Hoon CHOI
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Publication number: 20160077017Abstract: A method of inspecting a surface of an object includes providing a laser beam irradiated in a first direction substantially parallel to the surface of the object, adjusting a diameter of the annular laser beam, reflecting the annular laser beam toward the surface of the object in a second direction substantially perpendicular to the first direction, in a primary reflection, and reflecting the primarily reflected laser toward an inspection region of the object, in a secondary reflection. An incident angle of the annular laser beam with respect to the surface of the object may be determined by the diameter of the annular laser beam.Type: ApplicationFiled: June 26, 2015Publication date: March 17, 2016Inventors: KOHEI HASHIMOTO, WOOK-RAE KIM, BYEONG-HWAN JEON, CHANG-HOON CHOI
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Publication number: 20150369588Abstract: According to example embodiments, an optical measurement apparatus may include: a station configured to support a measurement target; an image acquisition unit configured to acquire a one-dimensional (1D) line image of the measurement target; a driver configured to move the station and the image acquisition unit; and a controller. The controller may be configured to control the driver and the image acquisition unit to acquire a plurality of 1D line images of the measurement target while varying a distance between the image acquisition unit and the measurement target to generate a two-dimensional (2D) scan image from combining the plurality of 1D line images; and to detect a pattern of the measurement target based on comparing a plurality of 2D reference images and the 2D scan image. The optical measurement apparatus may measure critical dimensions of non-repeating ultrafine patterns at high speed.Type: ApplicationFiled: August 28, 2015Publication date: December 24, 2015Applicant: SAMSUNG ELECTRONICS CO., LTD.Inventors: Kwang Soo KIM, Hyun Jae LEE, Byeong Hwan JEON, Chang Hoon CHOI
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Patent number: 9151962Abstract: An autofocus control apparatus includes a beam splitter, a condenser lens and a detector. The beam splitter directs light beams from a light source toward a sample and passes light beams reflected from the sample to the condenser lens. The condenser lens condenses the light beams, and the detector detects a focal point deviation of the sample relative to a focal point of the condenser lens. The focal point deviation is detected based on an intersection of a focal line passing through different focal points of the condenser lens and a light receiving plane configured to receive the light beams passing through the condenser lens.Type: GrantFiled: February 22, 2013Date of Patent: October 6, 2015Assignee: Samsung Electronics Co., Ltd.Inventors: Hyun Jae Lee, Myoung Ki Ahn, Kwang Soo Kim, In Ho Seo, Chang Hoon Choi
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Patent number: 9123503Abstract: Microelectronic substrate inspection equipment includes a gas container which contains helium gas, a helium ion generator which is disposed in the gas container and converts the helium gas into helium ions and a wafer stage which is disposed under the gas container and on which a substrate to be inspected is placed. The equipment further includes a secondary electron detector which is disposed above the wafer stage and detects electrons generated from the substrate, a compressor which receives first gaseous nitrogen from a continuous nitrogen supply device and compresses the received first gaseous nitrogen into liquid nitrogen, a liquid nitrogen dewar which is connected to the compressor and stores the liquid nitrogen, and a cooling device that is coupled to the helium ion generator. The cooling device is disposed on the gas container, and cools the helium ion generator by vaporizing the liquid nitrogen received from the liquid nitrogen dewar into second gaseous nitrogen. Related methods are also disclosed.Type: GrantFiled: April 21, 2014Date of Patent: September 1, 2015Assignee: Samsung Electronics Co., Ltd.Inventors: Min-Kook Kim, Woo-Seok Ko, Yu-Sin Yang, Sang-Kil Lee, Chang-Hoon Choi
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Publication number: 20150218705Abstract: A conversion coating composition comprising 0.01 wt % to 0.2 wt % of phosphorous (P); 0.01 wt % to 0.2 wt % of magnesium (Mg); 0.005 wt % to 0.15 wt % of zirconium (Zr); 0.005 wt % to 0.15 wt % of titanium (Ti); 0.005 wt % to 0.15 wt % of vanadium (V); 0.05 wt % to 1 wt % of phenol resin; the balance of water and other unavoidable impurities is provided. A surface treated steel sheet comprising a base steel sheet; a zinc or zinc alloy plated layer formed on the base steel sheet; a blackening layer formed on the zinc or zinc alloy plated layer; and an organic and inorganic complex conversion coating layer formed on the blackening layer, wherein the organic and inorganic complex conversion coating layer may satisfy the weight ratio of P:Mg:Zr:Ti:V=1:0.045 to 2:0.035 to 1.5:0.035 to 1.3:0.035 to 1.5 (based on the weight of P) is also provided. A method for manufacturing a steel sheet treated with the conversion coating composition is also provided.Type: ApplicationFiled: December 21, 2012Publication date: August 6, 2015Inventors: Yeon-Ho Kim, Young-Jin Kwak, Yon-Kyun Song, Yang-Ho Choi, Tae-Yeob Kim, Kyoung-Pil Ko, Chang-Hoon Choi, Jong-Sang Kim
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Patent number: 8956734Abstract: Provided is a black resin steel plate having superior drawing ability and glossiness and particularly to a black resin steel plate in which the coefficient of friction of a black resin film is adjusted so as to block the transfer of a resin layer due to a reduction in thickness of the resin layer, thereby improving blackness and drawing ability, and to a method of manufacturing the same.Type: GrantFiled: November 4, 2011Date of Patent: February 17, 2015Assignee: PoscoInventors: Yon Kyun Song, Chang Hoon Choi, Yeon Ho Kim, Jae Dong Cho
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Publication number: 20150012804Abstract: Apparatuses and methods for encoding, transmitting, receiving and decoding signal frames are provided. A transmitting apparatus includes: a frame encoder configured to perform Reed Solomon (RS) encoding on a plurality of frames in a vertical direction, wherein the frame encoder divides the plurality of frames into a plurality of groups, performs RS encoding for each group so that parties are added after the last frame of each group, and generates the RS-encoded frames. A receiver includes: a frame decoder configured to perform RS decoding on a plurality of received frames in a vertical direction, wherein the frame decoder divides the plurality of received frames into a plurality of groups, and performs RS decoding for each group to obtain information words without the parities.Type: ApplicationFiled: June 19, 2014Publication date: January 8, 2015Applicant: SAMSUNG ELECTRONICS CO., LTD.Inventors: Jung-pil YU, Joo-sung PARK, Soon-chan KWON, Sung-il PARK, Chang-hoon CHOI, Jung-Il HAN
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Patent number: 8873138Abstract: A focusing device for an optical microscope may include a light emitting unit configured to emit laser light having a specific wavelength, a wedge mirror configured to enable the emitted laser light to be incident on a plurality of locations of a surface of a specimen, first and second light receiving units configured to detect an amount of laser light reflected from the surface of the specimen, a spatial filter configured to eliminate out-of-focus light from light beams reflected from the surface of the specimen and to detect an amount of in-focus light, and a control unit configured to generate a control signal used to carry out focus adjustment of the optical microscope using a plurality of light-amount information detected by the first and second light receiving units and the spatial filter.Type: GrantFiled: September 10, 2012Date of Patent: October 28, 2014Assignee: Samsung Electronics Co., Ltd.Inventors: Kwang Soo Kim, Chang Hoon Choi, In Ho Seo, Hyun Jae Lee, Myoung Ki Ahn, Byeong Hwan Jeon, Sung Jin Lee
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Publication number: 20140246584Abstract: Provided is a scanning electron microscope capable of collecting electric charges accumulated on a sample. The scanning electron microscope includes a column unit configured to generate an electron beam and scan a sample with the electron beam, a chamber unit combined with the column unit, and including a sample stage spaced apart from an end of the column unit to accommodate the sample therein, a detection unit configured to detect signals emitted from the sample, a charge collecting unit disposed between the end of the column unit and the sample stage to collect electric charges, and a voltage supply unit configured to apply an optimum or, alternatively, desirable voltage to the charge collecting unit.Type: ApplicationFiled: October 23, 2013Publication date: September 4, 2014Applicant: SAMSUNG ELECTRONICS CO., LTD.Inventors: Jeong-Woo HYUN, Won-Guk SEO, Chang-Hoon CHOI, Byeong-Hwan JEON
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Publication number: 20140224987Abstract: Microelectronic substrate inspection equipment includes a gas container which contains helium gas, a helium ion generator which is disposed in the gas container and converts the helium gas into helium ions and a wafer stage which is disposed under the gas container and on which a substrate to be inspected is placed. The equipment further includes a secondary electron detector which is disposed above the wafer stage and detects electrons generated from the substrate, a compressor which receives first gaseous nitrogen from a continuous nitrogen supply device and compresses the received first gaseous nitrogen into liquid nitrogen, a liquid nitrogen dewar which is connected to the compressor and stores the liquid nitrogen, and a cooling device that is coupled to the helium ion generator. The cooling device is disposed on the gas container, and cools the helium ion generator by vaporizing the liquid nitrogen received from the liquid nitrogen dewar into second gaseous nitrogen. Related methods are also disclosed.Type: ApplicationFiled: April 21, 2014Publication date: August 14, 2014Applicant: Samsung Electronics Co., Ltd.Inventors: Min-Kook KIM, Woo-Seok Ko, Yu-Sin Yang, Sang-Kil Lee, Chang-Hoon Choi
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Patent number: 8736839Abstract: An optical measuring apparatus may include a light source, linear polarizer, polarized beam splitter, quarter wave plate, objective lens, and/or light receiver. The polarized beam splitter may be configured to transmit linearly polarized light from the linear polarizer to any one of a first and second optical path. The quarter wave plate may be configured to circularly polarize light transmitted through the first optical path from the polarized beam splitter and transmit the circularly polarized light to an object to be measured, and the quarter wave plate may be configured to linearly polarize the circularly polarized light reflected from the object to be measured and transmit the linearly polarized reflected light to the second optical path of the polarized beam splitter. The objective lens may be configured to generate light having different wavelengths by generating chromatic aberration in the circularly polarized light from the quarter wave plate.Type: GrantFiled: October 26, 2011Date of Patent: May 27, 2014Assignee: Samsung Electronics Co., Ltd.Inventors: Young Heo, Chang Hoon Choi, Byung Seon Chun, Kwang Soo Kim, Tae Joong Kim
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Patent number: 8729468Abstract: Microelectronic substrate inspection equipment includes a gas container which contains helium gas, a helium ion generator which is disposed in the gas container and converts the helium gas into helium ions and a wafer stage which is disposed under the gas container and on which a substrate to be inspected is placed. The equipment further includes a secondary electron detector which is disposed above the wafer stage and detects electrons generated from the substrate, a compressor which receives first gaseous nitrogen from a continuous nitrogen supply device and compresses the received first gaseous nitrogen into liquid nitrogen, a liquid nitrogen dewar which is connected to the compressor and stores the liquid nitrogen, and a cooling device that is coupled to the helium ion generator. The cooling device is disposed on the gas container, and cools the helium ion generator by vaporizing the liquid nitrogen. Related methods are also disclosed.Type: GrantFiled: August 28, 2012Date of Patent: May 20, 2014Assignee: Samsung Electronics Co., Ltd.Inventors: Min-Kook Kim, Woo-Seok Ko, Yu-Sin Yang, Sang-Kil Lee, Chang-Hoon Choi
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Publication number: 20140002829Abstract: According to example embodiments, an optical measurement apparatus may include: a station configured to support a measurement target; an image acquisition unit configured to acquire a one-dimensional (1D) line image of the measurement target; a driver configured to move the station and the image acquisition unit; and a controller. The controller may be configured to control the driver and the image acquisition unit to acquire a plurality of 1D line images of the measurement target while varying a distance between the image acquisition unit and the measurement target to generate a two-dimensional (2D) scan image from combining the plurality of 1D line images; and to detect a pattern of the measurement target based on comparing a plurality of 2D reference images and the 2D scan image. The optical measurement apparatus may measure critical dimensions of non-repeating ultrafine patterns at high speed.Type: ApplicationFiled: June 26, 2013Publication date: January 2, 2014Applicant: Samsung Electronics Co., Ltd.Inventors: Kwang Soo KIM, Hyun Jae Lee, Byeong Hwan Jeon, Chang Hoon Choi
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Publication number: 20130247589Abstract: A position measurement device includes a light source, a reflector coupled to a test object, a light detector between the light source and reflector, and a controller to measure a position of the test object based on an interference pattern generated by a reference beam and a measurement beam output from the light detector. The controller also controls a temperature of the light detector by generating signals for a heat exchanger having a Peltier region coupled to the light detector. The signals including a first signal to cause the heat exchanger to remove heat from the light receiver and a second signal to cause the heat exchanger to apply heat to the light receiver.Type: ApplicationFiled: March 22, 2013Publication date: September 26, 2013Applicant: SAMSUNG ELECTRONICS CO., LTD.Inventors: In Ho SEO, Jin Sung KNO, Jae Chol JOO, Yong Ho CHOI, Seung Min CHOI, Chang Hoon CHOI