Patents by Inventor Chang-ick Shin

Chang-ick Shin has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7243043
    Abstract: A method of testing a plurality of devices, such as hard disk drives, in response to a random request by checking whether hard disk drive have been loaded, and sequentially allocating one test thread for each loaded hard disk drive. Each allocated thread performs a series of test job operations one by one when called and required for testing the loaded hard disk drive, and records a test status of each hard disk drive whenever one job operation of the test by the test thread is terminated to allow a next test thread to refer to the recorded test status. Each hard disk drive is tested according to a time required to test that hard disk drive.
    Type: Grant
    Filed: May 14, 2004
    Date of Patent: July 10, 2007
    Assignee: Samsung Electronics Co., Ltd.
    Inventor: Chang-ick Shin
  • Publication number: 20040230399
    Abstract: A method of testing a plurality of devices, such as hard disk drives, in response to a random request by checking whether hard disk drive have been loaded, and sequentially allocating one test thread for each loaded hard disk drive. Each allocated thread performs a series of test job operations one by one when called and required for testing the loaded hard disk drive, and records a test status of each hard disk drive whenever one job operation of the test by the test thread is terminated to allow a next test thread to refer to the recorded test status. Each hard disk drive is tested according to a time required to test that hard disk drive.
    Type: Application
    Filed: May 14, 2004
    Publication date: November 18, 2004
    Applicant: Samsung Electronics Co., Ltd.
    Inventor: Chang-ick Shin