Patents by Inventor Changting Wang

Changting Wang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10324896
    Abstract: A method and an apparatus for acquiring a resource. An embodiment of the present invention provides a method for acquiring a resource, including receiving, by a storage server, a resource check request sent by a first client, where the resource check request carries resource information of a resource to be uploaded by the first client, an identifier of an external link created by a second client, and storage location information corresponding to the external link; searching, by the storage server, according to the identifier, a database configured to store external-link information for an attribute of the external link corresponding to the identifier of the external link, and checking the resource information according to a value of the found attribute; and if the check succeeds, storing, by the storage server the acquired resource or acquired resource location information according to the storage location information.
    Type: Grant
    Filed: December 23, 2014
    Date of Patent: June 18, 2019
    Assignee: HUAWEI TECHNOLOGIES CO., LTD.
    Inventors: Jin Zhang, Changting Wang
  • Patent number: 9759686
    Abstract: Inspection systems provided herein include drive coils capable of being excited to generate a substantially uniform magnetic field about an object. The object includes a ferromagnetic adhesive adhered thereto. The inspection systems may also include an array of sensor coils adapted to detect the magnetic field from the drive coils after the magnetic field interacts with the ferromagnetic adhesive and to produce a voltage output corresponding to the detected magnetic field.
    Type: Grant
    Filed: January 28, 2014
    Date of Patent: September 12, 2017
    Assignee: General Electric Company
    Inventors: Mandar Diwakar Godbole, Changting Wang, Andrzej Michal May, Nilesh Tralshawala, Waseem Ibrahim Faidi
  • Publication number: 20150113015
    Abstract: A method and an apparatus for acquiring a resource. An embodiment of the present invention provides a method for acquiring a resource, including receiving, by a storage server, a resource check request sent by a first client, where the resource check request carries resource information of a resource to be uploaded by the first client, an identifier of an external link created by a second client, and storage location information corresponding to the external link; searching, by the storage server, according to the identifier, a database configured to store external-link information for an attribute of the external link corresponding to the identifier of the external link, and checking the resource information according to a value of the found attribute; and if the check succeeds, storing, by the storage server the acquired resource or acquired resource location information according to the storage location information.
    Type: Application
    Filed: December 23, 2014
    Publication date: April 23, 2015
    Inventors: Jin Zhang, Changting Wang
  • Patent number: 8884614
    Abstract: Present embodiments include eddy current array probes having differential coils capable of detecting both long and short flaws in a test specimen and, additionally or alternatively, multiplexed drive coils. For example, an eddy current array probe may include a first plurality of eddy current channels disposed in a first row and a second plurality of eddy current channels disposed in a second row. The first plurality and second plurality of eddy current channels overlap in a first direction but do not overlap in a second direction. The probe also includes a semi-circular drive coil disposed proximate to the first plurality and second plurality of eddy current channels and configured to generate a probing magnetic field for each sense coil of the eddy current channels.
    Type: Grant
    Filed: October 31, 2011
    Date of Patent: November 11, 2014
    Assignee: General Electric Company
    Inventors: Changting Wang, Yuri Alexeyevich Plotnikov, Mandar Diwakar Godbole, Aparna Chakrapani Sheila-Vadde
  • Publication number: 20140139211
    Abstract: Inspection systems provided herein include drive coils capable of being excited to generate a substantially uniform magnetic field about an object. The object includes a ferromagnetic adhesive adhered thereto. The inspection systems may also include an array of sensor coils adapted to detect the magnetic field from the drive coils after the magnetic field interacts with the ferromagnetic adhesive and to produce a voltage output corresponding to the detected magnetic field.
    Type: Application
    Filed: January 28, 2014
    Publication date: May 22, 2014
    Applicant: General Electric Company
    Inventors: Mandar Diwakar Godbole, Changting Wang, Andrzej Michal May, Nilesh Tralshawala, Waseem Ibrahim Faidi
  • Patent number: 8710834
    Abstract: The invention provides a drive coil and measurement probe comprising the drive coil. The measurement probes can be used, for example, in in-situ, non-destructive testing methods, also provided herein.
    Type: Grant
    Filed: August 28, 2010
    Date of Patent: April 29, 2014
    Assignee: General Electric Company
    Inventors: Andrzej Michal May, Waseem Ibrahim Faidi, Changting Wang, Nilesh Tralshawala, Aparna Chakrapani Sheila-Vadde, Mandar Diwakar Godbole, Jamie Thomas Livingston, Steven Haines Olson, Howard Daniel Driver
  • Patent number: 8436608
    Abstract: A multi-frequency eddy current (MFEC) inspection system is provided for inspection of case hardening depth on a part. The MFEC inspection system comprises a generator configured to generate one or more multi-frequency excitation signals and an eddy current probe configured to be disposed at one side of the part. The eddy current probe comprises one or more drivers and one or more pickup sensors. The one or more drivers are configured to receive the one or more multi-frequency excitation signals to induce eddy currents in the part. The one or more pickup sensors are configured to detect the induced eddy currents within a local area of the part to generate one or more multi-frequency response signals. The MFEC system further comprises a processor configured to receive the one or more multi-frequency response signals for processing to determine a case hardening depth of the local area of the part. A pulse eddy current inspection system and an eddy current inspection method are also presented.
    Type: Grant
    Filed: September 21, 2009
    Date of Patent: May 7, 2013
    Assignee: General Electric Company
    Inventors: Haiyan Sun, Yuri Alexeyevich Plotnikov, Changting Wang, Shridhar Champaknath Nath, Aparna Chakrapani Sheila-Vadde
  • Publication number: 20130106409
    Abstract: Present embodiments include eddy current array probes having differential coils capable of detecting both long and short flaws in a test specimen and, additionally or alternatively, multiplexed drive coils. For example, an eddy current array probe may include a first plurality of eddy current channels disposed in a first row and a second plurality of eddy current channels disposed in a second row. The first plurality and second plurality of eddy current channels overlap in a first direction but do not overlap in a second direction. The probe also includes a semi-circular drive coil disposed proximate to the first plurality and second plurality of eddy current channels and configured to generate a probing magnetic field for each sense coil of the eddy current channels.
    Type: Application
    Filed: October 31, 2011
    Publication date: May 2, 2013
    Applicant: General Electric Company
    Inventors: Changting Wang, Yuri Alexeyevich Plotnikov, Mandar Diwakar Godbole, Aparna Chakrapani Sheila-Vadde
  • Patent number: 8378668
    Abstract: A method of non-destructive testing that employs composite systems that include a curable resin and detectable particles that have a property that can be distinguished from a property of the resin is disclosed. Array probes useful in the method also are disclosed.
    Type: Grant
    Filed: November 29, 2008
    Date of Patent: February 19, 2013
    Assignee: General Electric Company
    Inventors: Waseem Ibrahim Faidi, Changting Wang, Stephane Renou, Shu Ching Quek, Nilesh Tralshawala, Aparna Chakrapani Sheila-Vadde, Peter J. Fritz
  • Patent number: 8269489
    Abstract: An inspection system for inspecting a part is provided. The inspection system includes a multi-dimensional array of eddy current sensors that conforms to a contour of a three dimensional shape of the part. The inspection system also includes a controller coupled to the multi-dimensional array, wherein the controller is configured to electronically scan the part via an electrical connection of the eddy current sensors to an eddy current instrument. The inspection system further includes a processor coupled to the eddy current instrument, wherein the processor is configured to analyze output from the eddy current instrument and the controller to accomplish inspection of the part.
    Type: Grant
    Filed: November 25, 2008
    Date of Patent: September 18, 2012
    Assignee: General Electric Company
    Inventors: Changting Wang, Yury Alexeyevich Plotnikov, Ui Won Suh, William Stewart McKnight
  • Patent number: 8179132
    Abstract: A method for integrating a measurement device for use in measuring a machine component includes providing a coordinate measuring machine (CMM) and combining eddy current (EC) capabilities and CMM capabilities to form an inspection probe. The method further includes installing the inspection probe on the CMM so that the inspection probe measures external boundaries of the machine component with the CMM capabilities and substantially simultaneously measures at least one of internal boundaries, internal defects, surface defects, and material properties of the machine component with the EC capabilities, which are directly linked to actual component dimensional information provided by CMM. The inspection data can be simultaneously linked to and/or displayed with a CAD model to enable a direct comparison between the inspection data and the nominal requirements specified on the CAD model.
    Type: Grant
    Filed: February 18, 2009
    Date of Patent: May 15, 2012
    Assignee: General Electric Company
    Inventors: Yanyan Wu, Thomas James Batzinger, Nicholas Joseph Kray, Changting Wang, Haiyan Sun, Francis Howard Little, David Paul Lappas, David Michael Dombrowski
  • Publication number: 20120043962
    Abstract: A method for determining a case depth of a hardened layer in a surface of a metal object includes: (a) placing an eddy current probe at a location adjacent the surface; (b) using the eddy current probe, generating a time-varying eddy current in the object; (c) using the eddy current probe, outputting a measured eddy current and providing a signal representative of the measured eddy current to a computer; (d) using the computer, comparing the time-varying measured eddy current to a correlation of measured eddy currents to known case depths; and (e) determining the case depth at the location of the probe based on the correlation.
    Type: Application
    Filed: August 20, 2010
    Publication date: February 23, 2012
    Inventors: Changting WANG, Haiyan Sun, Anthony Giammarise, Thomas Batzinger, Mandar Godbole, Nilesh Tralshawala, Aparna Sheila-Vadde, Michael Sirak, Shubin Liu
  • Publication number: 20110215799
    Abstract: Inspection systems provided herein may include a drive coil capable of being excited to generate a substantially uniform magnetic field about an object. The object includes a ferromagnetic adhesive adhered thereto. The inspection systems may also include an array of sensor coils adapted to detect the magnetic field from the drive coil after the magnetic field interacts with the ferromagnetic adhesive and to produce a voltage output corresponding to the detected magnetic field.
    Type: Application
    Filed: May 13, 2011
    Publication date: September 8, 2011
    Applicant: General Electric Company
    Inventors: Mandar Diwakar Godbole, Changting Wang, Andrzej Michal May, Nilesh Tralshawala, Waseem Ibrahim Faidi
  • Patent number: 7994780
    Abstract: An inspection system for detecting a flaw in a part is provided. The inspection system includes a generally C-shaped core having an opening for receiving the part. The system also includes a driver coil wrapped around the core for creating a magnetic field in the opening. The system further includes at least one single element or multiple element eddy current sensor disposed in the opening.
    Type: Grant
    Filed: September 14, 2007
    Date of Patent: August 9, 2011
    Assignee: General Electric Company
    Inventors: Haiyan Sun, Changting Wang, William Stewart McKnight
  • Patent number: 7952348
    Abstract: A method of assembling an eddy current probe for use in nondestructive testing of a sample is described. The method includes positioning at least one substantially planar spiral drive coil within the eddy current probe, such that the drive coil is at least one of adjacent to and at least partially within a flexible material. The method further includes coupling at least one unpackaged solid-state magnetic field sensor to the at least one drive coil.
    Type: Grant
    Filed: November 5, 2007
    Date of Patent: May 31, 2011
    Assignee: General Electric Company
    Inventors: Haiyan Sun, Yuri Plotnikov, Changting Wang, William Stewart McKnight, Ui Suh
  • Patent number: 7948233
    Abstract: Omnidirectional eddy current array probes for detecting flaws in a conductive test object generally includes semi-circular wave shaped continuous drive lines in two rows disposed in two layers that are multiplexed for omnidirectional inspection without blind spots. The semicircular wave shaped continuous drive lines are superimposed to form pseudo-circular drive lines, wherein each row of drive lines is offset laterally by a distance preferably equal to a quarter wavelength of the wave pattern. For only parallel and perpendicular flaws, the drive multiplexing is not needed and each row will have only one set of drive lines. In alternate embodiments, there can be square-shaped, oval shaped, rectangular-shaped or other shaped wave patterns as well. Also disclosed are methods for sensing surface flaws and compensating their response.
    Type: Grant
    Filed: October 7, 2008
    Date of Patent: May 24, 2011
    Assignee: General Electric Company
    Inventors: Aparna Chakrapani Sheila-Vadde, Ui Won Suh, Changting Wang
  • Publication number: 20110068784
    Abstract: A multi-frequency eddy current (MFEC) inspection system is provided for inspection of case hardening depth on a part. The MFEC inspection system comprises a generator configured to generate one or more multi-frequency excitation signals and an eddy current probe configured to be disposed at one side of the part. The eddy current probe comprises one or more drivers and one or more pickup sensors. The one or more drivers are configured to receive the one or more multi-frequency excitation signals to induce eddy currents in the part. The one or more pickup sensors are configured to detect the induced eddy currents within a local area of the part to generate one or more multi-frequency response signals. The MFEC system further comprises a processor configured to receive the one or more multi-frequency response signals for processing to determine a case hardening depth of the local area of the part. A pulse eddy current inspection system and an eddy current inspection method are also presented.
    Type: Application
    Filed: September 21, 2009
    Publication date: March 24, 2011
    Applicant: GENERAL ELECTRIC COMPANY
    Inventors: Haiyan Sun, Yuri Alexeyevich Plotnikov, Changting Wang, Shridhar Champaknath Nath, Aparna Chakrapani Sheila-Vadde
  • Patent number: 7888932
    Abstract: A method of assembling an eddy current array probe to facilitate nondestructive testing of a sample is provided. The method includes positioning a plurality of differential side mount coils at least partially within a flexible material. The method also includes coupling the flexible material within a tip portion of the eddy current array probe, such that the flexible material has a contour that substantially conforms to a portion of a surface of the sample to be tested.
    Type: Grant
    Filed: November 5, 2007
    Date of Patent: February 15, 2011
    Assignee: General Electric Company
    Inventors: William Stewart McKnight, Ui Suh, Yuri Plotnikov, Changting Wang, Ralph Gerald Isaacs
  • Publication number: 20110004452
    Abstract: A method of inspecting a component using an eddy current array probe (ECAP) is provided. The method includes scanning a surface of the component with the ECAP, collecting, with the ECAP, a plurality of partial defect responses, transferring the plurality of partial defect responses to a processor, modeling the plurality of partial defect responses as mathematical functions based on at least one of a configuration of elements of the ECAP and a resolution of the elements, and producing a single maximum defect response from the plurality of partial defect responses.
    Type: Application
    Filed: December 31, 2007
    Publication date: January 6, 2011
    Inventors: Sanghamithra Korukonda, Sandeep Dewangan, Preeti Pisupati, William Stewart McKnight, Gigi Gambrell, Ui Suh, Changting Wang
  • Publication number: 20100321012
    Abstract: The invention provides a drive coil and measurement probe comprising the drive coil. The measurement probes can be used, for example, in in-situ, non-destructive testing methods, also provided herein.
    Type: Application
    Filed: August 28, 2010
    Publication date: December 23, 2010
    Applicant: GENERAL ELECTRIC COMPANY
    Inventors: Andrzej Michal May, Waseem Ibrahim Faidi, Changting Wang, Nilesh Tralshawala, Aparna Chakrapani Sheila-Vadde, Mandar Diwakar Godbole, Jamie Thomas Livingston, Steven Haines Olson, Howard Daniel Driver