Patents by Inventor Changting Wang
Changting Wang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 10324896Abstract: A method and an apparatus for acquiring a resource. An embodiment of the present invention provides a method for acquiring a resource, including receiving, by a storage server, a resource check request sent by a first client, where the resource check request carries resource information of a resource to be uploaded by the first client, an identifier of an external link created by a second client, and storage location information corresponding to the external link; searching, by the storage server, according to the identifier, a database configured to store external-link information for an attribute of the external link corresponding to the identifier of the external link, and checking the resource information according to a value of the found attribute; and if the check succeeds, storing, by the storage server the acquired resource or acquired resource location information according to the storage location information.Type: GrantFiled: December 23, 2014Date of Patent: June 18, 2019Assignee: HUAWEI TECHNOLOGIES CO., LTD.Inventors: Jin Zhang, Changting Wang
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Patent number: 9759686Abstract: Inspection systems provided herein include drive coils capable of being excited to generate a substantially uniform magnetic field about an object. The object includes a ferromagnetic adhesive adhered thereto. The inspection systems may also include an array of sensor coils adapted to detect the magnetic field from the drive coils after the magnetic field interacts with the ferromagnetic adhesive and to produce a voltage output corresponding to the detected magnetic field.Type: GrantFiled: January 28, 2014Date of Patent: September 12, 2017Assignee: General Electric CompanyInventors: Mandar Diwakar Godbole, Changting Wang, Andrzej Michal May, Nilesh Tralshawala, Waseem Ibrahim Faidi
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Publication number: 20150113015Abstract: A method and an apparatus for acquiring a resource. An embodiment of the present invention provides a method for acquiring a resource, including receiving, by a storage server, a resource check request sent by a first client, where the resource check request carries resource information of a resource to be uploaded by the first client, an identifier of an external link created by a second client, and storage location information corresponding to the external link; searching, by the storage server, according to the identifier, a database configured to store external-link information for an attribute of the external link corresponding to the identifier of the external link, and checking the resource information according to a value of the found attribute; and if the check succeeds, storing, by the storage server the acquired resource or acquired resource location information according to the storage location information.Type: ApplicationFiled: December 23, 2014Publication date: April 23, 2015Inventors: Jin Zhang, Changting Wang
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Patent number: 8884614Abstract: Present embodiments include eddy current array probes having differential coils capable of detecting both long and short flaws in a test specimen and, additionally or alternatively, multiplexed drive coils. For example, an eddy current array probe may include a first plurality of eddy current channels disposed in a first row and a second plurality of eddy current channels disposed in a second row. The first plurality and second plurality of eddy current channels overlap in a first direction but do not overlap in a second direction. The probe also includes a semi-circular drive coil disposed proximate to the first plurality and second plurality of eddy current channels and configured to generate a probing magnetic field for each sense coil of the eddy current channels.Type: GrantFiled: October 31, 2011Date of Patent: November 11, 2014Assignee: General Electric CompanyInventors: Changting Wang, Yuri Alexeyevich Plotnikov, Mandar Diwakar Godbole, Aparna Chakrapani Sheila-Vadde
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Publication number: 20140139211Abstract: Inspection systems provided herein include drive coils capable of being excited to generate a substantially uniform magnetic field about an object. The object includes a ferromagnetic adhesive adhered thereto. The inspection systems may also include an array of sensor coils adapted to detect the magnetic field from the drive coils after the magnetic field interacts with the ferromagnetic adhesive and to produce a voltage output corresponding to the detected magnetic field.Type: ApplicationFiled: January 28, 2014Publication date: May 22, 2014Applicant: General Electric CompanyInventors: Mandar Diwakar Godbole, Changting Wang, Andrzej Michal May, Nilesh Tralshawala, Waseem Ibrahim Faidi
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Patent number: 8710834Abstract: The invention provides a drive coil and measurement probe comprising the drive coil. The measurement probes can be used, for example, in in-situ, non-destructive testing methods, also provided herein.Type: GrantFiled: August 28, 2010Date of Patent: April 29, 2014Assignee: General Electric CompanyInventors: Andrzej Michal May, Waseem Ibrahim Faidi, Changting Wang, Nilesh Tralshawala, Aparna Chakrapani Sheila-Vadde, Mandar Diwakar Godbole, Jamie Thomas Livingston, Steven Haines Olson, Howard Daniel Driver
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Patent number: 8436608Abstract: A multi-frequency eddy current (MFEC) inspection system is provided for inspection of case hardening depth on a part. The MFEC inspection system comprises a generator configured to generate one or more multi-frequency excitation signals and an eddy current probe configured to be disposed at one side of the part. The eddy current probe comprises one or more drivers and one or more pickup sensors. The one or more drivers are configured to receive the one or more multi-frequency excitation signals to induce eddy currents in the part. The one or more pickup sensors are configured to detect the induced eddy currents within a local area of the part to generate one or more multi-frequency response signals. The MFEC system further comprises a processor configured to receive the one or more multi-frequency response signals for processing to determine a case hardening depth of the local area of the part. A pulse eddy current inspection system and an eddy current inspection method are also presented.Type: GrantFiled: September 21, 2009Date of Patent: May 7, 2013Assignee: General Electric CompanyInventors: Haiyan Sun, Yuri Alexeyevich Plotnikov, Changting Wang, Shridhar Champaknath Nath, Aparna Chakrapani Sheila-Vadde
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Publication number: 20130106409Abstract: Present embodiments include eddy current array probes having differential coils capable of detecting both long and short flaws in a test specimen and, additionally or alternatively, multiplexed drive coils. For example, an eddy current array probe may include a first plurality of eddy current channels disposed in a first row and a second plurality of eddy current channels disposed in a second row. The first plurality and second plurality of eddy current channels overlap in a first direction but do not overlap in a second direction. The probe also includes a semi-circular drive coil disposed proximate to the first plurality and second plurality of eddy current channels and configured to generate a probing magnetic field for each sense coil of the eddy current channels.Type: ApplicationFiled: October 31, 2011Publication date: May 2, 2013Applicant: General Electric CompanyInventors: Changting Wang, Yuri Alexeyevich Plotnikov, Mandar Diwakar Godbole, Aparna Chakrapani Sheila-Vadde
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Patent number: 8378668Abstract: A method of non-destructive testing that employs composite systems that include a curable resin and detectable particles that have a property that can be distinguished from a property of the resin is disclosed. Array probes useful in the method also are disclosed.Type: GrantFiled: November 29, 2008Date of Patent: February 19, 2013Assignee: General Electric CompanyInventors: Waseem Ibrahim Faidi, Changting Wang, Stephane Renou, Shu Ching Quek, Nilesh Tralshawala, Aparna Chakrapani Sheila-Vadde, Peter J. Fritz
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Patent number: 8269489Abstract: An inspection system for inspecting a part is provided. The inspection system includes a multi-dimensional array of eddy current sensors that conforms to a contour of a three dimensional shape of the part. The inspection system also includes a controller coupled to the multi-dimensional array, wherein the controller is configured to electronically scan the part via an electrical connection of the eddy current sensors to an eddy current instrument. The inspection system further includes a processor coupled to the eddy current instrument, wherein the processor is configured to analyze output from the eddy current instrument and the controller to accomplish inspection of the part.Type: GrantFiled: November 25, 2008Date of Patent: September 18, 2012Assignee: General Electric CompanyInventors: Changting Wang, Yury Alexeyevich Plotnikov, Ui Won Suh, William Stewart McKnight
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Patent number: 8179132Abstract: A method for integrating a measurement device for use in measuring a machine component includes providing a coordinate measuring machine (CMM) and combining eddy current (EC) capabilities and CMM capabilities to form an inspection probe. The method further includes installing the inspection probe on the CMM so that the inspection probe measures external boundaries of the machine component with the CMM capabilities and substantially simultaneously measures at least one of internal boundaries, internal defects, surface defects, and material properties of the machine component with the EC capabilities, which are directly linked to actual component dimensional information provided by CMM. The inspection data can be simultaneously linked to and/or displayed with a CAD model to enable a direct comparison between the inspection data and the nominal requirements specified on the CAD model.Type: GrantFiled: February 18, 2009Date of Patent: May 15, 2012Assignee: General Electric CompanyInventors: Yanyan Wu, Thomas James Batzinger, Nicholas Joseph Kray, Changting Wang, Haiyan Sun, Francis Howard Little, David Paul Lappas, David Michael Dombrowski
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Publication number: 20120043962Abstract: A method for determining a case depth of a hardened layer in a surface of a metal object includes: (a) placing an eddy current probe at a location adjacent the surface; (b) using the eddy current probe, generating a time-varying eddy current in the object; (c) using the eddy current probe, outputting a measured eddy current and providing a signal representative of the measured eddy current to a computer; (d) using the computer, comparing the time-varying measured eddy current to a correlation of measured eddy currents to known case depths; and (e) determining the case depth at the location of the probe based on the correlation.Type: ApplicationFiled: August 20, 2010Publication date: February 23, 2012Inventors: Changting WANG, Haiyan Sun, Anthony Giammarise, Thomas Batzinger, Mandar Godbole, Nilesh Tralshawala, Aparna Sheila-Vadde, Michael Sirak, Shubin Liu
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Publication number: 20110215799Abstract: Inspection systems provided herein may include a drive coil capable of being excited to generate a substantially uniform magnetic field about an object. The object includes a ferromagnetic adhesive adhered thereto. The inspection systems may also include an array of sensor coils adapted to detect the magnetic field from the drive coil after the magnetic field interacts with the ferromagnetic adhesive and to produce a voltage output corresponding to the detected magnetic field.Type: ApplicationFiled: May 13, 2011Publication date: September 8, 2011Applicant: General Electric CompanyInventors: Mandar Diwakar Godbole, Changting Wang, Andrzej Michal May, Nilesh Tralshawala, Waseem Ibrahim Faidi
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Patent number: 7994780Abstract: An inspection system for detecting a flaw in a part is provided. The inspection system includes a generally C-shaped core having an opening for receiving the part. The system also includes a driver coil wrapped around the core for creating a magnetic field in the opening. The system further includes at least one single element or multiple element eddy current sensor disposed in the opening.Type: GrantFiled: September 14, 2007Date of Patent: August 9, 2011Assignee: General Electric CompanyInventors: Haiyan Sun, Changting Wang, William Stewart McKnight
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Patent number: 7952348Abstract: A method of assembling an eddy current probe for use in nondestructive testing of a sample is described. The method includes positioning at least one substantially planar spiral drive coil within the eddy current probe, such that the drive coil is at least one of adjacent to and at least partially within a flexible material. The method further includes coupling at least one unpackaged solid-state magnetic field sensor to the at least one drive coil.Type: GrantFiled: November 5, 2007Date of Patent: May 31, 2011Assignee: General Electric CompanyInventors: Haiyan Sun, Yuri Plotnikov, Changting Wang, William Stewart McKnight, Ui Suh
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Patent number: 7948233Abstract: Omnidirectional eddy current array probes for detecting flaws in a conductive test object generally includes semi-circular wave shaped continuous drive lines in two rows disposed in two layers that are multiplexed for omnidirectional inspection without blind spots. The semicircular wave shaped continuous drive lines are superimposed to form pseudo-circular drive lines, wherein each row of drive lines is offset laterally by a distance preferably equal to a quarter wavelength of the wave pattern. For only parallel and perpendicular flaws, the drive multiplexing is not needed and each row will have only one set of drive lines. In alternate embodiments, there can be square-shaped, oval shaped, rectangular-shaped or other shaped wave patterns as well. Also disclosed are methods for sensing surface flaws and compensating their response.Type: GrantFiled: October 7, 2008Date of Patent: May 24, 2011Assignee: General Electric CompanyInventors: Aparna Chakrapani Sheila-Vadde, Ui Won Suh, Changting Wang
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Publication number: 20110068784Abstract: A multi-frequency eddy current (MFEC) inspection system is provided for inspection of case hardening depth on a part. The MFEC inspection system comprises a generator configured to generate one or more multi-frequency excitation signals and an eddy current probe configured to be disposed at one side of the part. The eddy current probe comprises one or more drivers and one or more pickup sensors. The one or more drivers are configured to receive the one or more multi-frequency excitation signals to induce eddy currents in the part. The one or more pickup sensors are configured to detect the induced eddy currents within a local area of the part to generate one or more multi-frequency response signals. The MFEC system further comprises a processor configured to receive the one or more multi-frequency response signals for processing to determine a case hardening depth of the local area of the part. A pulse eddy current inspection system and an eddy current inspection method are also presented.Type: ApplicationFiled: September 21, 2009Publication date: March 24, 2011Applicant: GENERAL ELECTRIC COMPANYInventors: Haiyan Sun, Yuri Alexeyevich Plotnikov, Changting Wang, Shridhar Champaknath Nath, Aparna Chakrapani Sheila-Vadde
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Patent number: 7888932Abstract: A method of assembling an eddy current array probe to facilitate nondestructive testing of a sample is provided. The method includes positioning a plurality of differential side mount coils at least partially within a flexible material. The method also includes coupling the flexible material within a tip portion of the eddy current array probe, such that the flexible material has a contour that substantially conforms to a portion of a surface of the sample to be tested.Type: GrantFiled: November 5, 2007Date of Patent: February 15, 2011Assignee: General Electric CompanyInventors: William Stewart McKnight, Ui Suh, Yuri Plotnikov, Changting Wang, Ralph Gerald Isaacs
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Publication number: 20110004452Abstract: A method of inspecting a component using an eddy current array probe (ECAP) is provided. The method includes scanning a surface of the component with the ECAP, collecting, with the ECAP, a plurality of partial defect responses, transferring the plurality of partial defect responses to a processor, modeling the plurality of partial defect responses as mathematical functions based on at least one of a configuration of elements of the ECAP and a resolution of the elements, and producing a single maximum defect response from the plurality of partial defect responses.Type: ApplicationFiled: December 31, 2007Publication date: January 6, 2011Inventors: Sanghamithra Korukonda, Sandeep Dewangan, Preeti Pisupati, William Stewart McKnight, Gigi Gambrell, Ui Suh, Changting Wang
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Publication number: 20100321012Abstract: The invention provides a drive coil and measurement probe comprising the drive coil. The measurement probes can be used, for example, in in-situ, non-destructive testing methods, also provided herein.Type: ApplicationFiled: August 28, 2010Publication date: December 23, 2010Applicant: GENERAL ELECTRIC COMPANYInventors: Andrzej Michal May, Waseem Ibrahim Faidi, Changting Wang, Nilesh Tralshawala, Aparna Chakrapani Sheila-Vadde, Mandar Diwakar Godbole, Jamie Thomas Livingston, Steven Haines Olson, Howard Daniel Driver