Abstract: An intraocular pressure inspection device includes an intraocular pressure detection unit, a high-precision positioning system and a wide-area positioning system, wherein according to the position of the intraocular pressure detection unit, a set of high-precision coordinates output by the high-precision positioning system and a set of wide-area coordinates output by the wide-area positioning system are integrated in appropriate weights to obtain a set of more precise integrated coordinate. The above-mentioned intraocular pressure inspection device can prevent the intraocular pressure detection unit from failing to operate once it is not in the working area of the high-precision positioning system.

Abstract: A method and apparatus is provided for stress testing integrated circuits to determine their susceptibility to hot carrier charge injection damage. The system includes a hot carrier injection source formed on a semiconductor wafer carrying the ICs under test. The carrier source comprises an adjustable, voltage controlled oscillator having a variable frequency AC output test signal, and a modulator circuit for varying the duty cycle of the test signal applied to the ICs.

Abstract: A method and apparatus is provided for stress testing integrated circuits to determine their susceptibility to hot carrier charge injection damage. The system includes a hot carrier injection source formed on a semiconductor wafer carrying the ICs under test. The carrier source comprises an adjustable, voltage controlled oscillator having a variable frequency AC output test signal, and a modulator circuit for varying the duty cycle of the test signal applied to the ICs.