Patents by Inventor Charles Honek

Charles Honek has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Probe card system and method
    Patent number: 5506498
    Abstract: A semiconductor wafer probe test interface system (2) and method of operating the system. The wafer probe system includes a plurality of cassettes (302) adapted to hold wafer probe test cards (304). The cassettes are loaded into position for testing of semiconductor wafers with a transport assembly system (6). A memory device (316) on the cassette is used to store data regarding usage of the card such as number of wafer touchdowns. A smart controller (220) has the capability to "talk" to the prober and tester.
    Type: Grant
    Filed: March 9, 1995
    Date of Patent: April 9, 1996
    Assignee: Xandex, Inc.
    Inventors: James C. Anderson, Brian P. Phillips, Charles Honek
  • Probe card system
    Patent number: 5254939
    Abstract: A semiconductor wafer probe test interface system (2) and method of operating the system. The wafer probe system includes a plurality of cassettes (302) adapted to hold wafer probe test cards (304). The cassettes are loaded into position for testing of semiconductor wafers with a transport assembly system (6). A memory device (316) on the cassette is used to store data regarding usage of the card such as number of wafer touchdowns. A smart controller (220) has the capability to "talk" to the prober and tester.
    Type: Grant
    Filed: March 20, 1992
    Date of Patent: October 19, 1993
    Assignee: Xandex, Inc.
    Inventors: James C. Anderson, Brian P. Phillips, Charles Honek