Abstract: An electroluminescent (EL) subpixel, such as an organic light-emitting diode (OLED) subpixel, is compensated for aging effects such as threshold voltage Vth shift, EL voltage Voled shift, and OLED efficiency loss. The drive current of the subpixel is measured at one or more measurement reference gate voltages to form a status signal representing the characteristics of the drive transistor and EL emitter of the subpixel. Current measurements are taken in the linear region of drive transistor operation to improve signal-to-noise ratio in systems such as modern LTPS PMOS OLED displays, which have relatively small Voled shift over their lifetimes and thus relatively small current change due to channel-length modulation. Various sources of noise are also suppressed to further increase signal-to-noise ratio.

Abstract: An electroluminescent (EL) subpixel driven by a digital-drive scheme has a readout transistor driven by a current source when the drive transistor is non-conducting. This produces an emitter-voltage signal from which an aging signal representing the efficiency of the EL emitter can be computed. The aging signal is used to determine the loss in current of the subpixel when active, and an input signal is adjusted to provide increased on-time to compensate for voltage rise and efficiency loss of the EL emitter. Variations due to temperature can also be compensated for.

Abstract: Compensation is performed for initial nonuniformity or aging of drive transistors and electroluminescent (EL) emitters in 3T1C EL subpixels of an EL display, such as an organic light-emitting diode (OLED) display. A readout transistor connected to the EL emitter is used to readout the voltage of the emitter and compensation for ?Vth, ?VEL, and OLED efficiency loss is performed using a model. Measurements are taken during a frame by driving a target subpixel at a higher luminance for a shorter time, then using the remaining time in the frame to measure. Measurements can be taken with an A/D converter or with a ramp generator and comparator. Compensation is performed for each subpixel individually.

Abstract: A method of compensating for differences in characteristics of a plurality of electroluminescent (EL) subpixels having readout transistors, includes providing a first voltage source connected through a first switch to each subpixel's drive transistor and a second voltage source connected through a second switch to each subpixel's EL emitter; providing a current source connected through a third switch, and a current sink connected through a fourth switch, to the readout transistor; providing a test voltage to a subpixel; closing only the first and fourth switches and measuring the readout transistor voltage to provide a first signal representative of characteristics of the drive transistor; closing only the second and third switches and measuring the voltage to provide a second signal representative of characteristics of the EL emitter; repeating for each subpixel; and using the first and second signals for each subpixel to compensate for differences in characteristics of the EL subpixels.

Abstract: A method of determining characteristics of transistors and electroluminescent devices, includes: providing an electroluminescent display; providing for pairs of electroluminescent devices drive circuits and a single readout line, each drive circuit including a readout transistor electrically connected to the readout line; providing a first voltage source; providing a second voltage source; providing a current source; providing a current sink; providing a test voltage source; providing a voltage measurement circuit; sequentially testing the drive transistors to provide a first signal representative of characteristics of the drive transistor of the first drive circuit and a second signal representative of characteristics of the drive transistor of the second drive circuit, whereby the characteristics of each drive transistor are determined; and simultaneously testing the first and second electroluminescent devices to provide a third signal representative of characteristics of the pair of electroluminescent devi

Abstract: A method of compensating for changes in the characteristics of transistors and electroluminescent devices in an electroluminescent display, includes: providing an electroluminescent display having a two-dimensional array of subpixels arranged forming each pixel having at least three subpixels of different colors, with each having an electroluminescent device and a drive transistor, wherein each electroluminescent device is driven by the corresponding drive transistor; providing in each pixel a readout circuit for one of the subpixels of a specific color having a first readout transistor and a second readout transistor connected in series; using the readout circuit to derive a correction signal based on the characteristics of at least one of the transistors in the specific color subpixel, or the electroluminescent device in the specific color subpixel, or both; and using the correction signal to adjust the drive signals.

Abstract: A method of determining characteristics of transistors and electroluminescent devices, includes: providing an electroluminescent display; providing for pairs of electroluminescent devices drive circuits and a single readout line, each drive circuit including a readout transistor electrically connected to the readout line; providing a first voltage source; providing a second voltage source; providing a current source; providing a current sink; providing a test voltage source; providing a voltage measurement circuit; sequentially testing the drive transistors to provide a first signal representative of characteristics of the drive transistor of the first drive circuit and a second signal representative of characteristics of the drive transistor of the second drive circuit, whereby the characteristics of each drive transistor are determined; and simultaneously testing the first and second electroluminescent devices to provide a third signal representative of characteristics of the pair of electroluminescent devi

Abstract: A method for resetting drive transistors associated with subpixels in an electroluminescent display, comprising providing an electroluminescent display having a plurality of subpixels, each subpixel including an electroluminescent device and a drive circuit having a drive transistor for providing current through its associated electroluminescent device; providing a separate aging signal for each subpixel during operation of the electroluminescent display after a predetermined operating time period by responding as a function of the current passing through each of the subpixels or as a function of a voltage associated with each drive circuit; comparing each of the separate aging signals with a corresponding threshold level to produce a separate staleness signal for each subpixel representing whether or not the associated drive transistor should be reset; and resetting the associated drive transistors in response to staleness signals that indicate such drive transistors should be reset.

Abstract: A method of compensating for changes in the characteristics of transistors and EL devices in an EL display, includes providing an EL display having a two-dimensional array of EL devices arranged in rows and columns, wherein each EL device is driven by a drive circuit in response to a drive signal; providing a first drive circuit for an EL device having three transistors and providing a second drive circuit for an EL device having only two transistors, and wherein a first column in the display includes at least one first drive circuit and an adjacent second column includes at least one second drive circuit; deriving a correction signal based on the characteristics of a transistor in a first drive circuit, or the EL device; and using the correction signal to adjust the drive signals applied to the first drive circuit and one or more adjacent second drive circuits.

Abstract: A method of compensating for changes in an OLED drive circuit, includes: providing a drive transistor; providing a first voltage source and a first switch; providing an OLED device connected to the drive transistor. Voltages are measured and used to compensate for changes in the OLED drive transistor.

Abstract: A method of compensating for changes in the threshold voltage of the drive transistor of an OLED drive circuit, comprising: providing the drive transistor with a first electrode, second electrode, and gate electrode; connecting a first voltage source to the first electrode, and an OLED device to the second electrode and to a second voltage source; providing a test voltage to the gate electrode of the drive transistor and connecting to the OLED drive circuit a test circuit that includes an adjustable current mirror that causes the voltage applied to the current mirror to be at a first test level; providing a test voltage to the gate electrode of the drive transistor and connecting the test circuit to the OLED device to produce a second test level after the drive transistor and the OLED device have aged; and using the first and second test levels to calculate a change in the voltage applied to the gate electrode of the drive transistor to compensate for aging of the drive transistor.

Abstract: A method of compensating for changes in the threshold voltage of the drive transistor of an OLED drive circuit, comprising: providing the drive transistor with a first electrode, second electrode, and gate electrode; connecting a first voltage source to the first electrode, and an OLED device to the second electrode and to a second voltage source; providing a test voltage to the gate electrode of the drive transistor and connecting to the OLED drive circuit a test circuit that includes an adjustable current mirror that causes the voltage applied to the current mirror to be at a first test level; providing a test voltage to the gate electrode of the drive transistor and connecting the test circuit to the OLED device to produce a second test level after the drive transistor and the OLED device have aged; and using the first and second test levels to calculate a change in the voltage applied to the gate electrode of the drive transistor to compensate for aging of the drive transistor.

Abstract: A tamper resistant electronic flash unit comprising a pair of first and second flash circuit boards arranged parallel to one another in order to have respective inner sides that face towards each other and respective outer sides that face away from each other, an electrical component positioned on the outer side of the first flash circuit board, conductive connections connecting the electrical component to the first flash circuit board and having respective portions exposed on the inner side of the first flash circuit board, and a plurality of spacers holding the first and second flash circuit boards spaced from one another to maintain a narrow gap between the inner sides of the flash circuit boards that is narrow enough to discourage access to the portions of the conductive connections exposed on the inner side of the first flash circuit board, whereby it is difficult to reach the portions of the conductive connection in an attempt to short-circuit the electrical component.