Patents by Inventor Charles Jaffe

Charles Jaffe has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Global quantitative characterization of patterns using fractal analysis
    Patent number: 9008452
    Abstract: Various systems, methods, and programs embodied in computer-readable mediums are provided for the global quantitative characterization of patterns. In one representative embodiment, a method is provided in which fractal analysis is performed on a pattern to generate a global quantitative characterization of the pattern in a computer system.
    Type: Grant
    Filed: November 14, 2006
    Date of Patent: April 14, 2015
    Assignee: West Virginia University
    Inventors: Charles Jaffe, Alfred H. Stiller
  • Pattern matching based on global quantitative characterization of patterns
    Patent number: 8983208
    Abstract: Various systems, methods, and programs embodied in computer-readable mediums are provided for detecting a match in patterns. In one embodiment, a method is provided that comprises performing a fractal analysis on a first pattern in a computer system to generate a first global quantitative characterization of the first pattern. The method further comprises comparing the first global quantitative characterization with a second global quantitative characterization associated with a second pattern in the computer system to determine whether the first pattern matches the second pattern. The second global quantitative characterization is generated from the second pattern.
    Type: Grant
    Filed: November 14, 2006
    Date of Patent: March 17, 2015
    Assignee: West Virginia University
    Inventors: Charles Jaffe, Alfred H. Stiller
  • Pattern detection based on fractal analysis
    Patent number: 8965136
    Abstract: Various systems, methods, and programs embodied in computer-readable mediums are provided for the detection of patterns. In one embodiment, a pattern detection method is provided that comprises the step of performing a fractal analysis of a pattern to generate a plurality of scaling parameters from a fractal associated with the pattern in a computer system. In addition, the method further comprises the step of detecting a degree of organization in the pattern by examining a degree of equality among the scaling parameters of the fractal in the computer system.
    Type: Grant
    Filed: November 14, 2006
    Date of Patent: February 24, 2015
    Assignee: West Virginia University
    Inventors: Charles Jaffe, Alfred H. Stiller
  • Global Quantitative Characterization of Patterns Using Fractal Analysis
    Publication number: 20080112633
    Abstract: Various systems, methods, and programs embodied in computer-readable mediums are provided for the global quantitative characterization of patterns. In one representative embodiment, a method is provided in which fractal analysis is performed on a pattern to generate a global quantitative characterization of the pattern in a computer system.
    Type: Application
    Filed: November 14, 2006
    Publication date: May 15, 2008
    Applicant: WEST VIRGINIA UNIVERSITY
    Inventors: Charles Jaffe, Alfred H. Stiller
  • Pattern Matching Based on Global Quantitative Characterization of Patterns
    Publication number: 20080112623
    Abstract: Various systems, methods, and programs embodied in computer-readable mediums are provided for detecting a match in patterns. In one embodiment, a method is provided that comprises performing a fractal analysis on a first pattern in a computer system to generate a first global quantitative characterization of the first pattern. The method further comprises comparing the first global quantitative characterization with a second global quantitative characterization associated with a second pattern in the computer system to determine whether the first pattern matches the second pattern. The second global quantitative characterization is generated from the second pattern.
    Type: Application
    Filed: November 14, 2006
    Publication date: May 15, 2008
    Applicant: WEST VIRGINIA UNIVERSITY
    Inventors: Charles Jaffe, Alfred H. Stiller
  • Pattern Detection Based on Fractal Analysis
    Publication number: 20080112624
    Abstract: Various systems, methods, and programs embodied in computer-readable mediums are provided for the detection of patterns. In one embodiment, a pattern detection method is provided that comprises the step of performing a fractal analysis of a pattern to generate a plurality of scaling parameters from a fractal associated with the pattern in a computer system. In addition, the method further comprises the step of detecting a degree of organization in the pattern by examining a degree of equality among the scaling parameters of the fractal in the computer system.
    Type: Application
    Filed: November 14, 2006
    Publication date: May 15, 2008
    Applicant: WEST VIRGINIA UNIVERSITY
    Inventors: Charles Jaffe, Alfred H. Stiller