Abstract: An optical system affixed to an electronic apparatus is provided, including a first optical module, a second optical module, and a third optical module. The first optical module is configured to adjust the moving direction of a first light from a first moving direction to a second moving direction, wherein the first moving direction is not parallel to the second moving direction. The second optical module is configured to receive the first light moving in the second moving direction. The first light reaches the third optical module via the first optical module and the second optical module in sequence. The third optical module includes a first photoelectric converter configured to transform the first light into a first image signal.

Abstract: An optical system affixed to an electronic apparatus is provided, including a first optical module, a second optical module, and a third optical module. The first optical module is configured to adjust the moving direction of a first light from a first moving direction to a second moving direction, wherein the first moving direction is not parallel to the second moving direction. The second optical module is configured to receive the first light moving in the second moving direction. The first light reaches the third optical module via the first optical module and the second optical module in sequence. The third optical module includes a first photoelectric converter configured to transform the first light into a first image signal.

Abstract: A transformer failure analysis system using a programmable chip in conjunction with a shock response spectrum analysis method to distinguish inrush current and fault current of a transformer and to monitor the phase of an AC power source inputting to the transformer by a phase detector. When an inrush current occurs, the programmable chip provides a control signal to delay the phase of the AC power source being inputted into the transformer, thereby suppressing the occurrence of the inrush current. When a fault current occurs, the control signal cuts off the AC power source from the transformer until the operator has tested the whole circuit architecture to debug and correct circuit application and eliminated the internal fault.

Abstract: A transformer failure analysis system using a programmable chip in conjunction with a shock response spectrum analysis method to distinguish inrush current and fault current of a transformer and to monitor the phase of an AC power source inputting to the transformer by means of a phase detector. When an inrush current occurs, the programmable chip provides a control signal to delay the phase of the AC power source being inputted into the transformer, thereby suppressing the occurrence of the inrush current. When a fault current occurs, the control signal cuts off the AC power source from the transformer until the operator has tested the whole circuit architecture to debug and correct circuit application and eliminated the internal fault.