Abstract: An optical device is provided. The optical device includes a substrate that has a top surface and a bottom surface. The optical device also includes a cover layer disposed on the substrate, and the cover layer has a top surface and a bottom surface. The top surface of the cover layer faces the bottom surface of the substrate. The optical device further includes a first meta structure disposed on the bottom surface of the substrate and a second meta structure disposed on the top surface of the cover layer. Moreover, the optical device includes a detector disposed on the bottom surface of the cover layer.

Abstract: Provided is a conductive structure and a method for forming such a structure. The method includes forming a treatable layer by depositing a layer comprising a metal over a structure; performing a directional treatment process on a targeted portion of the treatable layer to convert the targeted portion to a material different from a non-targeted portion of the treatable layer, wherein the directional treatment process is selected from the group consisting of nitridation, oxidation, chlorination, carbonization; and selectively removing the non-targeted portion from the structure, wherein the targeted portion remains over the structure.

Abstract: Methods of forming a semiconductor device structure are described. In some embodiments, the method includes forming a contact opening in an interlayer dielectric (ILD) layer disposed over an epitaxy source/drain region and forming a metal layer in the contact opening. The metal layer includes top portions, side portions, and a bottom portion, and a space is defined between the top portions of the metal layer. The method further includes performing a gradient metal removal process on the metal layer to enlarge the space, forming a sacrificial layer in the contact opening, recessing the sacrificial layer in the contact opening to expose a portion of the sidewall portions, removing the top portions and the exposed portion of the sidewall portions, removing the sacrificial layer, and forming a bulk metal layer on the bottom portion of the metal layer.

Abstract: A method of fabricating a contact structure includes the following steps. An opening is formed in a dielectric layer. A conductive material layer is formed within the opening and on the dielectric layer, wherein the conductive material layer includes a bottom section having a first thickness and a top section having a second thickness, the second thickness is greater than the first thickness. A first treatment is performed on the conductive material layer to form a first oxide layer on the bottom section and on the top section of the conductive material layer. A second treatment is performed to remove at least portions of the first oxide layer and at least portions of the conductive material layer, wherein after performing the second treatment, the bottom section and the top section of the conductive material layer have substantially equal thickness.

Abstract: A method includes forming a dielectric layer over an epitaxial source/drain region. An opening is formed in the dielectric layer. The opening exposes a portion of the epitaxial source/drain region. A barrier layer is formed on a sidewall and a bottom of the opening. An oxidation process is performing on the sidewall and the bottom of the opening. The oxidation process transforms a portion of the barrier layer into an oxidized barrier layer and transforms a portion of the dielectric layer adjacent to the oxidized barrier layer into a liner layer. The oxidized barrier layer is removed. The opening is filled with a conductive material in a bottom-up manner. The conductive material is in physical contact with the liner layer.

Abstract: The disclosure provides a semiconductor chip suit for driving a display panel. The semiconductor chip includes a first pad group and a second pad group. The first pad group and the second pad group are disposed at a first long side of the semiconductor chip. The first distance from the first pad group to the edge of the first long side is different from the second distance from the second pad group to the edge of the first long side. The first pad group and the second pad group belong to a first pad row disposed at the first long side. The first pad group comprises a plurality of pads which are closer to the middle of the first pad row than the second pad group.

Abstract: A package structure includes a first chip and a second chip. The first chip is connected to a pair of first signal lines and a plurality of first power lines. The second chip is connected to a pair of second signal lines and a plurality of second power lines. The first chip and the second chip belong to a common wafer. A separated street is between the first chip and the second chip.

Abstract: A tool detector including a right-angle triangular base and an automatic controller is revealed. A light source of the right-angle triangular base emits a main light ray to a plane mirror to generate a reflected light ray which is incident to a quadrant detector to create a light receiving area. The automatic controller is for measuring a tool length and a tool radius. A control device of a computer numerical control machine tool sets up a standard value by a standard bar and drives an unfinished tool and a processed tool to set up an original value set and a measured value set. The automatic controller performs an error analysis on the original and measured value sets to get a relative difference of a tool length and radius of the processed tool for measuring the tool length and radius and compensation of thermal variables of the CNC machine tool.

Abstract: A package structure includes a first chip and a second chip. The first chip is connected to a pair of first signal lines and a plurality of first power lines. The second chip is connected to a pair of second signal lines and a plurality of second power lines. The first chip and the second chip belong to a common wafer. A separated street is between the first chip and the second chip.

Abstract: A chip having a debug memory interface includes a processing unit, an internal storage unit, a debug memory interface, and a detection unit. The internal storage unit is used to record status data during operation of the processing unit. The detection unit is used to detect whether the debug memory interface is electrically connected to an external memory device. When the debug memory interface is judged to be electrically connected to the external memory device, a control signal is transmitted to the processing unit in order to trigger the processing unit to read a debug program from the external memory device and execute the debug program to run a debug mode based on the status data.

Abstract: Various examples of the present disclosure provide a multi-node fan control switch and systems and methods for controlling one or more cooling fans of a node using a fan control switch and a specific controller (e.g., BMC or a specific processor) of the node. The node also includes a watch dog circuit. The watch dog circuit can monitor health of the specific controller and, in response to determining that the specific controller has failed, enable the fan control switch to an external mode to allow a controller of a neighboring node in the rack system to control the one or more cooling fans of the node.

Abstract: A chip on film package includes a base film, a patterned circuit layer, a chip and a heat dissipation sheet. The base film includes a first surface and a mounting region located on the first surface. The patterned circuit layer is disposed on the first surface. The chip is disposed on the mounting region and electrically connected to the patterned circuit layer. The heat dissipation sheet includes a first adhesive layer disposed over the base film, a second adhesive layer disposed over the first adhesive layer, and a graphite layer disposed between the first adhesive layer and the second adhesive layer, wherein at least one of the first adhesive layer and the second adhesive layer is a double-sided adhesive with carrier, which comprises two adhesives and a carrier disposed between the two adhesives.

Abstract: A chip on film package includes a base film, a patterned circuit layer, a chip and a heat dissipation sheet. The base film includes a first surface and a mounting region located on the first surface. The patterned circuit layer is disposed on the first surface. The chip is disposed on the mounting region and electrically connected to the patterned circuit layer. The heat dissipation sheet includes a first adhesive layer disposed over the base film, a second adhesive layer disposed over the first adhesive layer, and a graphite layer disposed between the first adhesive layer and the second adhesive layer, wherein at least one of the first adhesive layer and the second adhesive layer is a double-sided adhesive with carrier, which comprises two adhesives and a carrier disposed between the two adhesives.

Abstract: A chip on film package including a base film, a patterned circuit layer, a chip, an underfill portion, and a water resistant layer. The base film includes a first surface and a second surface opposite to the first surface, and the first surface includes a mounting region. The patterned circuit layer is disposed on the first surface. The chip is mounted on the mounting region and electrically connected to the patterned circuit layer. The underfill portion covers a connecting portion where the chip and the pattern circuit layer are connected. The water resistant layer at least coves an outer surface of the underfill, wherein the material of the water resistant layer includes resin and metal particles.

Abstract: A chip on film package includes a base film, a patterned circuit layer, a chip and a heat dissipation sheet. The base film includes a first surface and a mounting region located on the first surface. The patterned circuit layer is disposed on the first surface. The chip is disposed on the mounting region and electrically connected to the patterned circuit layer. The heat dissipation sheet includes a first adhesive layer disposed over the base film, a second adhesive layer disposed over the first adhesive layer, and a graphite layer disposed between the first adhesive layer and the second adhesive layer, wherein at least one of the first adhesive layer and the second adhesive layer is a double-sided adhesive with carrier, which comprises two adhesives and a carrier disposed between the two adhesives.

Abstract: A chip on film package includes a base film, a patterned circuit layer, a chip and a heat dissipation sheet. The base film includes a first surface and a mounting region located on the first surface. The patterned circuit layer is disposed on the first surface. The chip is disposed on the mounting region and electrically connected to the patterned circuit layer. The heat dissipation sheet includes a first adhesive layer disposed over the base film, a second adhesive layer disposed over the first adhesive layer, and a graphite layer disposed between the first adhesive layer and the second adhesive layer, wherein at least one of the first adhesive layer and the second adhesive layer is a double-sided adhesive with carrier, which comprises two adhesives and a carrier disposed between the two adhesives.

Abstract: A chip on film package includes a base film, a patterned circuit layer, a solder resist layer, a chip and a graphite sheet. The base film includes a first surface and a mounting region located on the first surface. The patterned circuit layer is disposed on the first surface. The solder resist layer partially covers the patterned circuit layer. The chip is disposed on the mounting region and electrically connected to the patterned circuit layer. The graphite sheet covers at least a part of the solder resist layer, wherein an outer edge of the graphite sheet is substantially aligned with an outer edge of the solder resist layer.

Abstract: Various examples of the present disclosure provide a multi-node fan control switch and systems and methods for controlling one or more cooling fans of a node using a fan control switch and a specific controller (e.g., BMC or a specific processor) of the node. The node also includes a watch dog circuit. The watch dog circuit can monitor health of the specific controller and, in response to determining that the specific controller has failed, enable the fan control switch to an external mode to allow a controller of a neighboring node in the rack system to control the one or more cooling fans of the node.

Abstract: A chip on film package includes a base film, a patterned circuit layer, a solder resist layer, a chip and a graphite sheet. The base film includes a first surface and a mounting region located on the first surface. The patterned circuit layer is disposed on the first surface. The solder resist layer partially covers the patterned circuit layer. The chip is disposed on the mounting region and electrically connected to the patterned circuit layer. The graphite sheet covers at least a part of the solder resist layer, wherein an outer edge of the graphite sheet is substantially aligned with an outer edge of the solder resist layer.

Abstract: A chip on film package includes a base film, a patterned circuit layer, a solder resist layer, a chip and a graphite sheet. The base film includes a first surface and a mounting region located on the first surface. The patterned circuit layer is disposed on the first surface. The solder resist layer partially covers the patterned circuit layer. The chip is disposed on the mounting region and electrically connected to the patterned circuit layer. The graphite sheet covers at least a part of the solder resist layer, wherein an outer edge of the graphite sheet is substantially aligned with an outer edge of the solder resist layer.