Patents by Inventor Chen Ku CHIANG

Chen Ku CHIANG has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Alignment mark and method of manufacturing the same
    Patent number: 8994197
    Abstract: An alignment mark includes a plurality of mark units. Each mark unit includes a first element and a plurality of second elements. Each second element includes opposite first and second end portions. The plurality of second elements are arranged along a direction. The first element extends adjacent to the first end portions of the plurality of second elements and parallel to the direction of the plurality of second elements.
    Type: Grant
    Filed: March 21, 2014
    Date of Patent: March 31, 2015
    Assignee: Nanya Technology Corporation
    Inventors: Chen Ku Chiang, Yuan Hsun Wu
  • ALIGNMENT MARK AND METHOD OF MANUFACTURING THE SAME
    Publication number: 20140206172
    Abstract: An alignment mark includes a plurality of mark units. Each mark unit includes a first element and a plurality of second elements. Each second element includes opposite first and second end portions. The plurality of second elements are arranged along a direction. The first element extends adjacent to the first end portions of the plurality of second elements and parallel to the direction of the plurality of second elements.
    Type: Application
    Filed: March 21, 2014
    Publication date: July 24, 2014
    Applicant: NANYA TECHNOLOGY CORPORATION
    Inventors: CHEN KU CHIANG, YUAN HSUN WU
  • Alignment mark and method of manufacturing the same
    Patent number: 8723341
    Abstract: An alignment mark includes a plurality of mark units. Each mark unit includes a first element and a plurality of second elements. Each second element includes opposite first and second end portions. The plurality of second elements are arranged along a direction. The first element extends adjacent to the first end portions of the plurality of second elements and parallel to the direction of the plurality of second elements.
    Type: Grant
    Filed: December 21, 2011
    Date of Patent: May 13, 2014
    Assignee: Nan Ya Technology Corporation
    Inventors: Chen Ku Chiang, Yuan Hsun Wu
  • ALIGNMENT MARK AND METHOD OF MANUFACTURING THE SAME
    Publication number: 20130161841
    Abstract: An alignment mark includes a plurality of mark units. Each mark unit includes a first element and a plurality of second elements. Each second element includes opposite first and second end portions. The plurality of second elements are arranged along a direction. The first element extends adjacent to the first end portions of the plurality of second elements and parallel to the direction of the plurality of second elements.
    Type: Application
    Filed: December 21, 2011
    Publication date: June 27, 2013
    Applicant: Nan Ya Technology Corporation
    Inventors: Chen Ku CHIANG, Yuan Hsun Wu