Abstract: An apparatus for inspecting wafer carriers is disclosed. In one example, the apparatus includes: a housing; a load port; a robot arm inside the housing; and a processor. The load port is configured to load a wafer carrier into the housing. The robot arm is configured to move a first camera connected to the robot arm. The first camera is configured to capture a plurality of images of the wafer carrier. The processor is configured to process the plurality of images to inspect the wafer carrier.

Abstract: The present disclosure provides an interactive simulation device which can cooperate with media devices to provide a user experience of interaction between the user and a target object. An interactive simulation device of the present disclosure may exchange data with another interactive simulation device for enabling simulated interaction of senses such as tactile sense and feedback between their users across different locations. The interactive simulation device may receive motion data from other interactive simulation devices as an input of its actuator and sense the user's feedback to the motion data and send back to the interactive simulation devices. The present disclosure also provides a method and a system performing the method for simulating interaction or providing simulated interaction as a service by applying the interactive simulation device. The present disclosure further provides the application of sexual interaction and sexual stimulation of the interactive stimulation devices.