Abstract: A wave-driven power generation device of converting gravity work is illustrated, which has two power generation modules, a pulley module and two transmission mechanism structures. The pulley module has a rail and a counterweight part, wherein the counterweight part moves back and forth along the rail in a first direction or a second direction due to wave fluctuation, and the first direction and the second direction are two opposite directions. The transmission mechanism structure has a driving part and a gear module rotating with the driving part, wherein the driving part moves along the first direction or the second direction accompanying with movement of the counterweight part, the gear module rotates with the shaft of the rotator set, and the shaft of the rotator set is kept to rotate in respect to a rotating direction to continue to generate the electrical energy due to transmission of the gear module.

Abstract: A circuit testing apparatus for testing a device under test is disclosed. The device under test includes a first terminal end and second terminal end for generating a first output signal and a second output signal, respectively. The circuit testing apparatus determines whether the device under test has passed the test according to the first and second output signals.

Abstract: The invention provides a handler and a method for testing the same. The handler comprises a sorter and a testing module. The testing module further comprises a signal generator, a sensor, and a signal comparator. The signal generator generates and sends out a first handling signal. The sorter receives the first handling signal and correspondingly places a first electronic component on a first region according to the first handling signal. The sensor senses the first electronic component on the first region, and then correspondingly generates and sends out a second handling signal. The signal comparator is electrically connected to the sensor and the signal generator, and receives the first handling signal and the second handling signal. The signal comparator determines whether the first handling signal is equivalent to the second handling signal, and correspondingly sends out a comparing signal.

Abstract: A method for measuring transconductance of an oscillating circuit is provided. The oscillating circuit includes an inverter. When an input terminal and an output terminal of the inverter are floated, the bias voltage of the inverter is obtained by measuring the output terminal thereof. Based on floating the input terminal and respectively providing a first voltage and a second voltage to the output terminal, a first current corresponding to the first voltage and a second current corresponding to the second voltage are measured from the output terminal. The first voltage and the bias voltage have the same voltage levels. An output resistor value of the inverter is obtained according to the first and second voltages and the first and second currents. The transconductance of the oscillating circuit is obtained according to the output resistor value.

Abstract: The invention discloses a circuit testing apparatus for testing a device under test. The circuit testing apparatus includes a filtering circuit, an amplifying circuit, a comparing module, and a result-examining module. The filtering circuit filters an analog output signal generated from the device under test to generate a filtered signal. The amplifying circuit amplifies the filtered signal to generate an amplified signal. The comparing module compares the amplified signal with at least one reference level to generate at least one result signal accordingly. The result-examining module examines the result signal to determine a test result for the device under test.

Abstract: A circuit testing apparatus for testing capacitance of a capacitor of a device under test is provided. The circuit testing apparatus includes a measuring module, a first converting module, a processing module and a second converting module. The measuring module provides a testing signal, and determines the capacitance of the capacitor according to a signal measuring result of the testing signal. The first converting module is coupled to the measuring module for converting the testing signal to generate a testing input signal. The processing module is coupled to the first converting module and the device under test for transmitting the testing input signal to the capacitor, and amplifies an output signal generated by the capacitor to generate an amplified signal. The second converting module is coupled to the processing module and the measuring module for converting the amplified signal to generate the signal measuring result.

Abstract: The invention discloses a circuit testing apparatus for testing a device under testing. The circuit testing apparatus includes a logic tester and a signal-measuring module. The logic tester is coupled to the device under testing for providing a testing signal and a trigger signal, and then determining a testing result for the device under testing according to a digital measuring result. The signal-measuring module coupled to the device under testing and the logic tester, is utilized for measuring a DC signal generated by the device under testing according to the testing signal after receiving the trigger signal, and generating the digital measuring result.

Abstract: An audio generating module is disclosed comprising a transmitting medium, a power unit and a transmitting unit. The power unit is used for providing power. The transmitting unit, situated in the transmitting medium, connects to the power unit for receiving power, and generating an audio in the transmitting medium according to a preset mechanism.

Abstract: A test system for testing a plurality of devices under test is disclosed. The test system includes a tester and a plurality of processors. The tester is used for providing a plurality of control signals and determining a plurality of test results for the devices under test according to a plurality of measurement results. Each processor coupled to the tester is used for generating a plurality of test signals according to the plurality of control signals. The plurality of devices under test respectively generates the plurality of test results according to the plurality of test signals.

Abstract: A circuit testing apparatus for testing a device under test is disclosed. The device under test comprises a first output end and second output end for generating a first output signal and a second output signal, respectively. The circuit testing apparatus determines a test result for the device under test according to the first output signal and the second output signal.

Abstract: A testing circuit board used in a testing system with a tester and a handler is disclosed. The testing circuit board is used for transmitting a plurality of testing signals provided by the tester to test at least two devices under test located on the handler. The testing circuit board includes a connecting board, a load board and at least two connecting interfaces. The connecting board coupled to the handler has at least two connecting sockets for respectively connecting to the devices under testing. The load board coupled to the tester has two joining sockets located corresponding to the connecting sockets. The at least two connecting interfaces are coupled between the connecting sockets and the joining sockets for transmitting the testing signals for testing the devices under testing.

Abstract: The invention discloses a testing circuit board for placing a device under test and further testing the device under test according to a plurality of testing signals generated by a tester. The testing circuit board includes a circuit board and a plurality of sets of sockets. The circuit board includes a plurality of connecting holes. The plurality of sets of sockets are located on a plurality of connecting holes and electrically connects to the device under test via a plurality of connecting interfaces for transferring the plurality of testing signals to test the device under test.

Abstract: A method for measuring transconductance of an oscillating circuit is provided. The oscillating circuit includes an inverter. When an input terminal and an output terminal of the inverter are floated, the bias voltage of the inverter is obtained by measuring the output terminal thereof. Based on floating the input terminal and respectively providing a first voltage and a second voltage to the output terminal, a first current corresponding to the first voltage and a second current corresponding to the second voltage are measured from the output terminal. The first voltage and the bias voltage have the same voltage levels. An output resistor value of the inverter is obtained according to the first and second voltages and the first and second currents. The transconductance of the oscillating circuit is obtained according to the output resistor value.

Abstract: A product verification system with at least two machines that communicate with each other by an inferred mechanism is provided. The first machine is a handler and the second machine is a tester. The second machine is coupled to a product, and performs a test procedure on the product according to a test command from the first machine. The test result is collected and transmitted back to the first machine by the second machine.

Abstract: The invention provides a handler and a method for testing the same. The handler comprises a sorter and a testing module. The testing module further comprises a signal generator, a sensor, and a signal comparator. The signal generator generates and sends out a first handling signal. The sorter receives the first handling signal and correspondingly places a first electronic component on a first region according to the first handling signal. The sensor senses the first electronic component on the first region, and then correspondingly generates and sends out a second handling signal. The signal comparator is electrically connected to the sensor and the signal generator, and receives the first handling signal and the second handling signal. The signal comparator determines whether the first handling signal is equivalent to the second handling signal, and correspondingly sends out a comparing signal.

Abstract: The invention discloses a circuit testing apparatus for testing a device under test. The circuit testing apparatus includes a precision measurement unit, a signal transformation module, and a microprocessor. The precision measurement unit is coupled to the device under test for providing a testing signal and receiving a measurement signal generated according to the testing signal. The signal transformation module is coupled to the precision measurement unit for receiving the measurement signal and transforming the measurement signal to a signal measurement result according to a predetermined manner. The microprocessor is coupled to the precision measurement unit and the signal transformation module for examining the signal measurement result to determine a test result for the device under test.

Abstract: A circuit testing apparatus for testing a device under test is disclosed. The circuit testing apparatus includes a function generator, a signal measuring module and a determining module. The function generator is coupled to the device under test for providing a plurality of testing signals according to a predetermined manner. The signal measuring module is coupled to the device under test and the function module for measuring a plurality of measuring signals generated by the device under test according to the plurality of testing signals and generating a plurality of measuring results according to the predetermined manner. The determining module is coupled to the signal measuring module for determining a testing result for the device under test according to the plurality of measuring results.

Abstract: A circuit testing apparatus for testing capacitance of a capacitor of a device under test is provided. The circuit testing apparatus includes a measuring module, a first converting module, a processing module and a second converting module. The measuring module provides a testing signal, and determines the capacitance of the capacitor according to a signal measuring result of the testing signal. The first converting module is coupled to the measuring module for converting the testing signal to generate a testing input signal. The processing module is coupled to the first converting module and the device under test for transmitting the testing input signal to the capacitor, and amplifies an output signal generated by the capacitor to generate an amplified signal. The second converting module is coupled to the processing module and the measuring module for converting the amplified signal to generate the signal measuring result.

Abstract: A circuit testing apparatus for testing a device under test is disclosed. The device under test includes a first terminal end and second terminal end for generating a first output signal and a second output signal, respectively. The circuit testing apparatus determines whether the device under test has passed the test according to the first and second output signals.

Abstract: A testing device for testing a device under test is disclosed. The testing device includes a microprocessor, a measuring module and a computing module. The microprocessor provides a testing signal to the device under test and determines a testing result for the device under test according to at least one signal measurement result. The device under test further generates at least one measuring signal after receiving the testing signal. The measuring module is coupled to the device under test, and measures the at least one measuring signal and generates at least one voltage measurement result and at least one period measurement result. The computing module obtains the at least one voltage measurement result and the at least one period measurement result according to a predetermined manner and generates the at least one signal measurement result.