Patents by Inventor Chia H. Chen

Chia H. Chen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 4867908
    Abstract: A method for calibrating an instrument for using that instrument to obtain at least one light-related signal from particles under analysis comprises directing an incident beam of light at calibration particles having one or more known characteristics related to the particles expected to be analyzed. Both a light signal and a noise signal from the calibration particles are detected. A measurement is made of the ratio of the detected light signal to the detected noise signal, and that measurement is reported. The measured ratio is then compared to a predetermined ratio which represents a threshold for minimum instrument performance. This method further includes adjusting, if the predetermined ratio has not been attained, the operation of the instrument, while the calibration particles are within the incident beam of light, until the measured ratio reaches the predetermined ratio whereby the instrument is calibrated for subsequently obtaining the light signal from particles to be analyzed.
    Type: Grant
    Filed: June 4, 1987
    Date of Patent: September 19, 1989
    Assignee: Becton, Dickinson and Company
    Inventors: Diether J. Recktenwald, Rickie S. Kerndt, Michael R. Loken, Chia H. Chen
  • Patent number: 4745285
    Abstract: A method for determining one or more characteristics of particles using multiple fluorescence analysis comprises directing an incident light beam at the particles under analysis. The particles include at least three fluorescent markers each having different emission spectra. The incident light beam causes the excitation of the markers by light at a single wavelength whereby different wavelengths of fluorescence are emitted from the particles. Different fluorescence emissions associated with the particles under analysis are simultaneously detected. This method further includes associating the detected fluorescence with one or more characteristics of the particles. An apparatus is also part of the present invention for carrying out the aforementioned method.
    Type: Grant
    Filed: August 21, 1986
    Date of Patent: May 17, 1988
    Assignee: Becton Dickinson and Company
    Inventors: Diether J. Recktenwald, Chia H. Chen
  • Patent number: 4704891
    Abstract: A method for calibrating an instrument for using that instrument to obtain at least one light-related signal from particles under analysis comprises directing an incident beam of light at calibration particles having one or more known characteristics related to the particles expected to be analyzed. Both a light signal and a noise signal from the calibration particles are detected. A measurement is made of the ratio of the detected light signal to the detected noise signal, and that measurement is reported. The measured ratio is then compared to a predetermined ratio which represents a threshold for minimum instrument performance. This method further includes adjusting, if the predetermined ratio has not been attained, the operation of the instrument, while the calibration particles are within the incident beam of light, until the measured ratio reaches the predetermined ratio whereby the instrument is calibrated for subsequently obtaining the light signal from particles to be analyzed.
    Type: Grant
    Filed: August 29, 1986
    Date of Patent: November 10, 1987
    Assignee: Becton, Dickinson and Company
    Inventors: Diether J. Recktenwald, Rickie S. Kerndt, Michael R. Loken, Chia H. Chen