Abstract: Disclosed are a conductive film and a test component. A conductive film includes a supporting layer, a circuit layer and a protective layer. The supporting layer has a first surface and a second surface opposite to the first surface. The supporting layer supports the circuit layer. The circuit layer includes a first protruding part, a second protruding part and a connecting part. The first protruding part is disposed on the first surface. The second protruding part is disposed on the second surface. The connecting part is disposed between the first protruding part and the second protruding part. The first protruding part is connected to the second protruding part through the connecting part. The protective layer covers the first protruding part. The conductive film and the test component of the disclosed embodiments may have a buffering effect or increase the service life.

Abstract: An optical system affixed to an electronic apparatus is provided, including a first optical module, a second optical module, and a third optical module. The first optical module is configured to adjust the moving direction of a first light from a first moving direction to a second moving direction, wherein the first moving direction is not parallel to the second moving direction. The second optical module is configured to receive the first light moving in the second moving direction. The first light reaches the third optical module via the first optical module and the second optical module in sequence. The third optical module includes a first photoelectric converter configured to transform the first light into a first image signal.

Abstract: A method for optimizing an inspection recipe of a defect inspection tool is described. A substrate having thereon intentional defects and locating patterns beside the intentional defects is provided. The defect inspection tool is used to detect the intentional defects with an inspection recipe and obtain the distribution of undetected or partially detected intentional defects. The locating patterns are utilized to locate the undetected or partially detected intentional defects and thereby determine the type(s) of the undetected or partially detected intentional defects. The inspection recipe is modified according to the type(s) of the undetected or partially detected intentional defects in a manner such that there is a minimal number of undetected or partially detected intentional defects under the inspection of the defect inspection tool.

Abstract: A method for optimizing an inspection recipe of a defect inspection tool is described. A substrate having thereon intentional defects and locating patterns beside the intentional defects is provided. The defect inspection tool is used to detect the intentional defects with an inspection recipe and obtain the distribution of undetected or partially detected intentional defects. The locating patterns are utilized to locate the undetected or partially detected intentional defects and thereby determine the type(s) of the undetected or partially detected intentional defects. The inspection recipe is modified according to the type(s) of the undetected or partially detected intentional defects in a manner such that there is a minimal number of undetected or partially detected intentional defects under the inspection of the defect inspection tool.

Abstract: A transmission cable coiler device is disclosed. The device has an internal module which has more than one cavity. The two lateral sides of the cavity are provided with a protruded edge and the center of the cavity is a resilient gap and the transmission cable connector is provided at the cavity. A winding body passes through the through hole at the top section of the external housing, it is tied to the upper section of the internal module. The external housing is mounted at the external of the internal module and the protruded urges the inner side of the external housing. The resilient gap is reduced to generate a reaction force such that the external housing and the internal module are closely matched in securing.

Abstract: An external casing includes a housing housed with a data storage device and formed with an opening. An interface module is disposed in the housing, and is connected electrically to the data storage device disposed in the housing. An external electrical connector is connected electrically to the interface module. A foldable cover member includes a fixing portion secured to a first housing part of the housing, an engaging portion opposite to the fixing portion, and an intermediate covering portion interconnecting the fixing portion and the engaging portion and covering over the external electrical connector. A lock unit is provided on a second housing part of the housing and the engaging portion of the cover member for selectively anchoring the engaging portion of the cover member to the second housing part of the housing.

Abstract: An external casing includes a housing housed with a data storage device and formed with an opening. An interface module is disposed in the housing, and is connected electrically to the data storage device disposed in the housing. An external electrical connector is connected electrically to the interface module. A foldable cover member includes a fixing portion secured to a first housing part of the housing, an engaging portion opposite to the fixing portion, and an intermediate covering portion interconnecting the fixing portion and the engaging portion and covering over the external electrical connector. A lock unit is provided on a second housing part of the housing and the engaging portion of the cover member for selectively anchoring the engaging portion of the cover member to the second housing part of the housing.