Patents by Inventor Chiaki Mochizuki
Chiaki Mochizuki has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 7541801Abstract: A probe card transfer assist apparatus for assisting an operation of transferring a probe card used in an electrical inspection apparatus includes a holder for holding the probe card; a support for supporting the holder in a freely-rotate manner about a point; and an elevation unit for moving the support up and down. Further, an inspection equipment includes an electrical inspection apparatus; and a probe card transfer assist apparatus for assisting an operation of transferring a probe card used in the electrical inspection apparatus, the assist apparatus including a holder for holding the probe card; a support for supporting the holder in a freely-rotating manner about a point; and an elevation unit for moving the support up and down.Type: GrantFiled: September 20, 2006Date of Patent: June 2, 2009Assignee: Tokyo Electron LimitedInventors: Munetoshi Nagasaka, Chiaki Mochizuki
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Patent number: 7528620Abstract: A probe card transfer assist apparatus for assisting an operation of transferring a probe card employed in an electrical inspection apparatus includes a holding unit for holding a pair of grips of the probe card wherein the grips are supported by being placed onto or suspended by the holding unit; a supporting unit for movably supporting the holding unit; and an elevation mechanism for moving the supporting unit up and down. Further, an inspecting equipment is provided with the probe card transfer assist apparatus having a holding unit for holding a pair of grips of the probe card wherein the grips are supported by being placed onto or suspended by the holding unit; a supporting unit for movably supporting the holding unit; and an elevation mechanism for moving the supporting unit up and down.Type: GrantFiled: November 27, 2006Date of Patent: May 5, 2009Assignee: Tokyo Electron LimitedInventors: Chiaki Mochizuki, Munetoshi Nagasaka
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Publication number: 20070126441Abstract: A probe card transfer assist apparatus for assisting an operation of transferring a probe card employed in an electrical inspection apparatus includes a holding unit for holding a pair of grips of the probe card wherein the grips are supported by being placed onto or suspended by the holding unit; a supporting unit for movably supporting the holding unit; and an elevation mechanism for moving the supporting unit up and down. Further, an inspecting equipment is provided with the probe card transfer assist apparatus having a holding unit for holding a pair of grips of the probe card wherein the grips are supported by being placed onto or suspended by the holding unit; a supporting unit for movably supporting the holding unit; and an elevation mechanism for moving the supporting unit up and down.Type: ApplicationFiled: November 27, 2006Publication date: June 7, 2007Applicant: TOKYO ELECTRON LIMITEDInventors: Chiaki Mochizuki, Munetoshi Nagasaka
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Publication number: 20070063720Abstract: A probe card transfer assist apparatus for assisting an operation of transferring a probe card used in an electrical inspection apparatus includes a holder for holding the probe card; a support for supporting the holder in a freely-rotate manner about a point; and an elevation unit for moving the support up and down. Further, an inspection equipment includes an electrical inspection apparatus; and a probe card transfer assist apparatus for assisting an operation of transferring a probe card used in the electrical inspection apparatus, the assist apparatus including a holder for holding the probe card; a support for supporting the holder in a freely-rotating manner about a point; and an elevation unit for moving the support up and down.Type: ApplicationFiled: September 20, 2006Publication date: March 22, 2007Applicant: TOKYO ELECTRON LIMITEDInventors: Munetoshi Nagasaka, Chiaki Mochizuki
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Patent number: 6262570Abstract: A probe apparatus comprising an apparatus body fitted with a probing card having a probe connected electrically with an electrode of an object of inspection, a test head operatively mounted on the apparatus body and electrically continuous with the probe of the probing card, rotating mechanism for rotating the test head, and vertical moving mechanism for vertically raising or lowering the test head.Type: GrantFiled: March 24, 1999Date of Patent: July 17, 2001Assignee: Tokyo Electron LimitedInventors: Yutaka Akaike, Chiaki Mochizuki, Isao Kono, Haruhiko Yoshioka
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Patent number: 5912555Abstract: A probe apparatus comprising an apparatus body fitted with a probing card having a probe connected electrically with an electrode of an object of inspection, a test head operatively mounted on the apparatus body and electrically continuous with the probe of the probing card, rotating mechanism for rotating the test head, and vertical moving mechanism for vertically raising or lowering the test head.Type: GrantFiled: April 5, 1996Date of Patent: June 15, 1999Assignee: Tokyo Electron LimitedInventors: Yutaka Akaike, Chiaki Mochizuki, Isao Kono, Haruhiko Yoshioka
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Patent number: 5679857Abstract: L-amino acid amides are converted to the corresponding D-amino acid amides. An amide formed from an L-amino acid and an optically active (S)-.alpha.-alkylbenzylamine is subjected to dehydration condensation with an aryl aldehyde to form a Schiff's base, which is racemized at the amino acid moiety in the presence of a base to yield an N-allylidene-D-amino acid-(S)-amide. The less-soluble diastereomer N-allylidene-D-amino acid-(S)-amide is crystallized from the reaction mixture and recovered by means of solid/liquid separation. The N-allylidene form is readily hydrolyzed into the amino acid-(S)-amide and the starting aldehyde.Type: GrantFiled: November 16, 1995Date of Patent: October 21, 1997Assignee: Ajinomoto Co., Inc.Inventors: Toyoto Hijiya, Chiaki Mochizuki, Tadashi Takemoto
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Patent number: 5616766Abstract: The present invention provides crystals of L-phenylalanine monomethyl sulfate which have low solubility compared to L-tyrosine and D-phenylalanine. The L-phenylalanine monomethylsulfate crystals are obtained by subjecting a solution containing monomethyl sulfuric acid and phenylalanine to crystallization.Further, the present invention also provides a process for recovering L-phenylalanine from a water layer by neutralizing the esterified reaction, extracting an ester of L-phenylalanine therefrom with an organic solvent, and recovering remaining L-phenylalanine in the water layer as L-phenylalanine monomethylsulfate. L-phenylalanine monomethyl sulfate is obtained by esterifying L-phenylalanine and methanol in the presence of sulfuric acid, neutralizing the esterified solution with a base in the presence of water, extracting the produced L-phenylalanine methyl ester from the neutralized solution with an organic solvent, and then crystallized the resultant water layer under acidic condition.Type: GrantFiled: May 16, 1995Date of Patent: April 1, 1997Assignee: Ajinomoto Co., Inc.Inventors: Tadashi Takemoto, Toyoto Hijiya, Teruo Yonekawa, Chiaki Mochizuki
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Patent number: 5530155Abstract: Addition of a reaction mixture obtained by the mineral acid hydrolysis of at least one side flow generated from the production of .alpha.-L-aspartyl-L-phenylalanine methyl ester to a crystallization slurry containing L-phenylalanine while maintaining the pH of the slurry at 3-8 by adding aqueous alkali affords crystallized L-phenylalanine having a low water content in a high yield.Type: GrantFiled: March 24, 1995Date of Patent: June 25, 1996Assignee: Ajinomoto Co., Inc.Inventors: Toyoto Hijiya, Chiaki Mochizuki, Tadashi Takemoto, Kazutaka Nagashima
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Patent number: 5521523Abstract: A probe card assembly thermal influenced from a wafer with which a probe makes contact during a probe test. The assembly includes a probe card unit having a great number of probes to be brought into contact with the wafer to be tested, and a holder for holding the probe card unit at a center portion thereof. The holder includes a ring member, supported by another member, for supporting the probe card unit from a low side, and a cutout stepped member and a slot hole for relaxing stress due to thermal expansion concentrated on the ring member.Type: GrantFiled: December 14, 1993Date of Patent: May 28, 1996Assignees: Tokyo Electron Limited, Tokyo Electron Yamanashi LimitedInventors: Hidetoshi Kimura, Tetsuya Utsunomiya, Chiaki Mochizuki
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Patent number: 5466864Abstract: The present invention provides crystals of L-phenylalanine monomethyl sulfate which have low solubility compared to L-tyrosine and D-phenylalanine. The L-phenylalanine monomethylsulfate crystals are obtained by subjecting a solution containing monomethyl sulfuric acid and phenylalanine to crystallization.Further, the present invention also provides a process for recovering L-phenylalanine from a water layer by neutralizing the esterified reaction, extracting an ester of L-phenylalanine therefrom with an organic solvent, and recovering remaining L-phenylalanine in the water layer as L-phenylalanine monomethylsulfate. L-phenylalanine monomethyl sulfate is obtained by esterifying L-phenylalanine and methanol in the presence of sulfuric acid, neutralizing the esterified solution with a base in the presence of water, extracting the produced L-phenylalanine methyl ester from the neutralized solution with an organic solvent, and then crystallized the resultant water layer under acidic condition.Type: GrantFiled: February 2, 1994Date of Patent: November 14, 1995Assignee: Ajinomoto Co., Inc.Inventors: Tadashi Takemoto, Toyoto Hijiya, Teruo Yonekawa, Chiaki Mochizuki