Abstract: A method for managing defect blocks in a non-volatile memory essentially comprises the steps of detecting defect blocks in the non-volatile memory, storing addresses of the defect blocks in a table block of the non-volatile memory, and setting the non-volatile memory to be read-only if the quantity of defect blocks in the non-volatile memory exceeds a threshold and no free blocks remain in the non-volatile memory. In a preferred embodiment, the free pages in the defect block continue to be programmed before setting the non-volatile memory to be read-only.

Abstract: A method of memory management for an apparatus having a non-volatile memory and a volatile memory includes the steps of forming a tree structure of entries in the volatile memory, in which the tree structure has a left branch and a right branch, and a difference of heights of the left branch and the right branch is equal to or less than one; and accessing an entry in the volatile memory through the tree structure.

Abstract: A wear leveling limit and/or an overall erase count threshold used for activating wear leveling in a non-volatile memory may be adjusted by determining a stage according to a highest erase count, and determining the wear leveling limit and/or the overall erase count threshold corresponding to the stage. Wear leveling may then be performed according to the wear leveling limit and/or the overall erase count threshold.

Abstract: An operation method of a memory includes the steps of calculating an offset of sequential write commands and the beginning of pages of a block of a non-volatile memory; shifting the block by the offset; and directly writing data from a host to the pages except the first and last pages of the block by the sequential write commands. In an embodiment, the pages are logical pages providing optimal writing efficiency and are determined before calculating the offset. The step of shifting the block by the offset is to increase corresponding logical block addresses (LBA) in the pages by the offset.

Abstract: A flash memory system includes a path selector to determine to write to a non-volatile memory, a volatile memory or both the non-volatile memory and the volatile memory when the flash memory system is to write data. A record is stored in the non-volatile memory which is updated the status of the non-volatile memory after each one or more writing operations. When the flash memory system is powered on after a power loss, it could be recovered to a command executed prior to the power loss or to any checkpoint prior to the power loss by using the record.

Abstract: A secured storage device uses a user key set by user to encrypt a primary key that is for encryption or decryption of user data, to produce a first encrypted data. In the secured storage device, neither the primary key nor the user key is stored, but the first encrypted data, and a secondary key and a second encrypted data produced from the secondary key encrypted with the user key for verifying the password inputted by user are stored. Therefore, even though a storage medium in the secured storage device is detached and read, the primary key and the user key cannot be obtained by a third party for reading out any encrypted user data from the secured storage device.

Abstract: A method is employed to manage a memory, e.g., a flash memory, including a plurality of paired pages. Each paired page includes a page and a respective risk zone. For each write command, at least one unwritten page is selected for writing new data. For each unwritten page whose risk zone includes at least one written page, each written page is copied or backed up, and the new data is written to the unwritten page. For each unwritten page whose risk zone lacks a written page, the new data is written to the unwritten page. In an embodiment, the written page is copied only if the unwritten page and the written page are operated by different write commands.

Abstract: A method of wear leveling for a non-volatile memory is performed as follows. First, the non-volatile memory is divided into a plurality of zones including at least a first zone and a second zone. The first zone is written and/or erased in which one or more logical blocks have higher writing hit rate, and therefore the corresponding physical blocks in the first zone will be written more often. The next step is to find one or more free physical blocks in second zone. The physical blocks of the first zone are replaced by the physical blocks of the second zone if the number of write and/or erase to the first zone exceeds a threshold number. The replacement of physical blocks in the first zone by the physical blocks in the second zone may include the steps of copying data from the physical blocks in the first zone to the physical block in the second zone, and changing the pointer of logical blocks to point to the physical blocks in the second zone.

Abstract: According to the method of wear leveling for a non-volatile memory of the present invention, the non-volatile memory is divided into a plurality of windows, and a mapping table is built in which the logical block addresses having frequently accessed data are allocated equally to the plurality of windows. The logical block addresses may store a File Allocation Table (FAT) or a directory table; therefore the windows they locate will be written or erased more frequently. In an embodiment, the logical block addresses having frequently accessed data are allocated on a one-to-one basis to the plurality of windows. For example, the plurality of windows may comprise Windows 0, 1, 2 and 3, the logical block addresses comprise logical block addresses 0, 1, 2 and 3, and logical block addresses 0, 1, 2 and 3 point to Windows 0, 1, 2 and 3, respectively.

Abstract: A method for managing defect blocks in a non-volatile memory essentially comprises the steps of detecting defect blocks in the non-volatile memory, storing addresses of the defect blocks in a table block of the non-volatile memory, and setting the non-volatile memory to be read-only if the quantity of defect blocks in the non-volatile memory exceeds a threshold and no free blocks remain in the non-volatile memory. In a preferred embodiment, the free pages in the defect block continue to be programmed before setting the non-volatile memory to be read-only.

Abstract: An adaptive semiconductor memory device is used for being inserted into a host for storage. The semiconductor memory device comprises a non-volatile memory and a switch. The switch can be a logical switch or a physical switch that controls the semiconductor memory device to be in compliance with either a first specification version or a second specification version of the semiconductor memory device. The second specification version in comparison with the first specification version is used for higher capacity applications.

Abstract: A non-volatile memory device, and a method for accessing the non-volatile memory device are provided. The non-volatile memory device is connected to a host via a bus. The non-volatile memory device comprises an MCU. By independently processing the particular commands using only the auxiliary circuit, the MCU can cease to operate, thus saving power. By setting the bus into power saving mode when the non-volatile memory device is busy, the host and the non-volatile memory device would not communicate mutually, thus, saving power.

Abstract: A method of wear leveling for a non-volatile memory is disclosed. A non-volatile memory is divided into windows and gaps, with each gap between two adjacent windows. The windows comprise physical blocks mapped to logical addresses, and the gaps comprise physical blocks not mapped to logical addresses. The windows are shifted through the non-volatile memory in which the mapping to the physical blocks in the window to be shifted is changed to the physical blocks in the gap.