Abstract: A charge/discharge protection circuit protects a battery from inadvertent shorting on a charger node that can connect to a charger or to a power supply of a portable electronic device. A single n-channel power transistor has a gate that controls a channel between the battery and the charger node. The gate is connected to the charger node by a gate-coupling transistor to turn off the power transistor, providing battery isolation. The gate is driven by a voltage-boosted clock through a switch activated by an enable signal. The enable signal also activates a grounding transistor to ground a gate of the gate-coupling transistor. A comparator compares voltages of the charger and battery nodes, and the compare output is latched to generate the enable signal. An inverse enable signal activates a second switch that drives the voltage-boosted clock to the gate of the gate-coupling transistor to turn off the power transistor.

Abstract: A feedback controller comprises first and second feedback circuits. The first feedback circuit is connected between an input node and an output node and has an error node. The first feedback circuit comprising a feedback amplifier for comparing a feedback signal to a reference signal and providing an error signal, and a comparator for comparing the error signal to a second reference signal and providing an output signal. The second feedback circuit is connected between the input node and the error node and comprises a current source coupled to the error node and a controller coupled to the input node for controlling the current source in response to a value of the feedback signal being above or below a threshold value.

Abstract: An electro-static-discharge (ESD) protection circuit protects core transistors. An internal node to the gate of an n-channel output transistor connects to the drain of an n-channel gate-grounding transistor to ground. The gate of the gate-grounding transistor is a coupled-gate node that is coupled by an ESD coupling capacitor to the output and to ground by an n-channel disabling transistor and a leaker resistor. The gate of the n-channel disabling transistor is connected to power and disables the ESD protection circuit when powered. An ESD pulse applied to the output is coupled through the ESD coupling capacitor to pulse high the coupled-gate node and turn on the gate-grounding transistor to ground the gate of the n-channel output transistor, which breaks down to shunt ESD current. The ESD pulse is prevented from coupling through a parasitic Miller capacitor of the n-channel output transistor by the gate-grounding transistor.

Abstract: A charge/discharge protection circuit protects a battery from inadvertent shorting on a charger node that can connect to a charger or to a power supply of a portable electronic device. A single n-channel power transistor has a gate that controls a channel between the battery and the charger node. The gate is connected to the charger node by a gate-coupling transistor to turn off the power transistor, providing battery isolation. The gate is driven by a voltage-boosted clock through a switch activated by an enable signal. The enable signal also activates a grounding transistor to ground a gate of the gate-coupling transistor. A comparator compares voltages of the charger and battery nodes, and the compare output is latched to generate the enable signal. An inverse enable signal activates a second switch that drives the voltage-boosted clock to the gate of the gate-coupling transistor to turn off the power transistor.

Abstract: A bandgap reference voltage generator has a first stage that generates a first current that is complementary-to-absolute-temperature (Ictat) and a second stage that generates a current that is proportional-to-absolute-temperature (Iptat). The Ictat and Iptat currents are both forced through a summing resistor to generate a voltage that is relatively independent of temperature, since the Ictat and Iptat currents cancel out each other's temperature dependencies. A PMOS output transistor drives current to an output load to maintain the load at the reference voltage. An op amp drives the gate of the PMOS output transistor and has inputs connected to emitters of PNP transistors in the second stage. A series of resistors generate the reference voltage between the PMOS output transistor and ground and drives bases of the PNP transistors and includes the summing resistor. Parasitic PNP transistors in an all-CMOS process are used. The generator operates with a 1-volt power supply.

Abstract: Systems and methods which provide an oscillator circuit outputting non-overlapping trigger signals throughout a range of operating voltages using a reset-set (RS) flip-flop type circuit configuration are shown. Embodiments utilize output driver buffers internal to the RS flip-flop circuit configuration to provide oscillator feedback delay. Feedback control circuitry may be implemented to ensure that the delay associated with any one driver buffer does not solely provide the feedback delay. Embodiments further implement input delay circuitry adapted to maintain a relatively constant reset and set input feedback delay ratio throughout a large range of operating conditions.

Abstract: An oscillator operates at a very low voltage yet has a duty cycle that is set by a ratio of capacitors that are charged and discharged. Sub-threshold p-channel transistors conduct sub-threshold currents below the normal threshold voltage, and drive set and reset inputs of a set-reset S-R latch. The S-R latch drives the oscillator outputs. The oscillator outputs feed back to charging p-channel transistors that charge one plate of the capacitors. During half of the cycle, the charging p-channel transistor is off, allowing one plate of the capacitors to discharge through an n-channel discharge transistor. After a period of discharge determined by the capacitance of the capacitor, the gate of a sub-threshold p-channel transistor falls enough for sub-threshold current to flow, triggering the set or reset input of the S-R latch. Since sub-threshold currents are needed to toggle the S-R latch, the oscillator begins to oscillate below the threshold voltage.

Abstract: The fuse cell architecture 371 for the presently claimed invention employs a multiple fuse structure 301, 302 architecture in lieu of a single fuse structure. As such, the terminals of these fuse structures that couple to other on-chip devices are always at ground potential throughout the application of programming voltage to the fuse pads 311. This approach overcomes previous single fuse problems owing to the fact that a sufficiently high programming voltage can be applied to blow fuse structures with unexpectedly high resistance without damaging nearby on-chip devices. Furthermore, even if one of the fuse structures 301, 302 possessed an abnormally high resistance which would not be blown under typical conditions, the desired circuit trimming result can still be achieved owing to the blowing of the other fuse structure in the fuse cell 371.

Abstract: Systems and methods which provide an oscillator circuit outputting non-overlapping trigger signals throughout a range of operating voltages using a reset-set (RS) flip-flop type circuit configuration are shown. Embodiments utilize output driver buffers internal to the RS flip-flop circuit configuration to provide oscillator feedback delay. Feedback control circuitry may be implemented to ensure that the delay associated with any one driver buffer does not solely provide the feedback delay. Embodiments further implement input delay circuitry adapted to maintain a relatively constant reset and set input feedback delay ratio throughout a large range of operating conditions.

Abstract: The fuse cell architecture 371 for the presently claimed invention employs a multiple fuse structure 301, 302 architecture in lieu of a single fuse structure. As such, the terminals of these fuse structures that couple to other on-chip devices are always at ground potential throughout the application of programming voltage to the fuse pads 311. This approach overcomes previous single fuse problems owing to the fact that a sufficiently high programming voltage can be applied to blow fuse structures with unexpectedly high resistance without damaging nearby on-chip devices. Furthermore, even if one of the fuse structures 301, 302 possessed an abnormally high resistance which would not be blown under typical conditions, the desired circuit trimming result can still be achieved owing to the blowing of the other fuse structure in the fuse cell 371.

Abstract: A feedback controller comprises first and second feedback circuits. The first feedback circuit is connected between an input node and an output node and has an error node. The first feedback circuit comprising a feedback amplifier for comparing a feedback signal to a reference signal and providing an error signal, and a comparator for comparing the error signal to a second reference signal and providing an output signal. The second feedback circuit is connected between the input node and the error node and comprises a current source coupled to the error node and a controller coupled to the input node for controlling the current source in response to a value of the feedback signal being above or below a threshold value.