Patents by Inventor CHIKA HIRAKAWA

CHIKA HIRAKAWA has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240073505
    Abstract: An illumination system includes: an irradiation device that irradiates light to a subject located in front of a displayer that displays a background image; an information acquisition device that acquires subject information for identifying the subject; a storage that stores background image information on the background image displayed on the displayer; and a controller that controls irradiation by the irradiation device. The controller generates shape information of the subject on basis of a difference between the subject information acquired by the information acquisition device and the background image information stored in the storage, and sets an irradiation range where light is irradiated by the irradiation device on basis of the shape information.
    Type: Application
    Filed: August 11, 2023
    Publication date: February 29, 2024
    Inventors: Hidemasa KUBOTA, Kinya NOBORI, HIROSHI KAWAMURA, CHIKA HIRAKAWA
  • Patent number: 11397165
    Abstract: An analyzer according to the present invention includes an electron emission element, a detector, an electric field generator, an electrostatic gate electrode, and a controller, in which the electron emission element includes a lower electrode, a surface electrode, and an intermediate layer, and directly or indirectly generates anions by electrons emitted in an ionization region between the electron emission element and the electrostatic gate electrode, the electrostatic gate electrode controls injection of the anions into a drift region between the electrostatic gate electrode and the detector, the detector detects the anions move through the drift region by a potential gradient, and the controller applies a pulse voltage between the lower electrode and the surface electrode, and applies a voltage to the electrostatic gate electrode such that the electrostatic gate electrode injects the anions into the drift region during a time when the pulse voltage is on.
    Type: Grant
    Filed: June 4, 2020
    Date of Patent: July 26, 2022
    Assignee: SHARP KABUSHIKI KAISHA
    Inventors: Chika Hirakawa, Tadashi Iwamatsu
  • Publication number: 20200393409
    Abstract: An analyzer according to the present invention includes an electron emission element, a detector, an electric field generator, an electrostatic gate electrode, and a controller, in which the electron emission element includes a lower electrode, a surface electrode, and an intermediate layer, and directly or indirectly generates anions by electrons emitted in an ionization region between the electron emission element and the electrostatic gate electrode, the electrostatic gate electrode controls injection of the anions into a drift region between the electrostatic gate electrode and the detector, the detector detects the anions move through the drift region by a potential gradient, and the controller applies a pulse voltage between the lower electrode and the surface electrode, and applies a voltage to the electrostatic gate electrode such that the electrostatic gate electrode injects the anions into the drift region during a time when the pulse voltage is on.
    Type: Application
    Filed: June 4, 2020
    Publication date: December 17, 2020
    Inventors: CHIKA HIRAKAWA, TADASHI IWAMATSU
  • Patent number: 10782265
    Abstract: An analysis apparatus includes an ionization section, an ion separation section, and an ion detection section. The ionization section generates one or more sample component-derived ions. The ion separation section separates the ions in accordance with mobility of the ions. The ion detection section detects the ion which passes through the ion separation section. The ionization section includes a reaction chamber and an electron emission element. A sample is introduced to the reaction chamber. The electron emission element emits an electron to the reaction chamber.
    Type: Grant
    Filed: March 22, 2019
    Date of Patent: September 22, 2020
    Assignee: SHARP KABUSHIKI KAISHA
    Inventors: Shohei Komaru, Fumiaki Sugimori, Tadashi Iwamatsu, Chika Hirakawa, Mai Takasaki
  • Publication number: 20190302055
    Abstract: An analysis apparatus includes an ionization section, an ion separation section, and an ion detection section. The ionization section generates one or more sample component-derived ions. The ion separation section separates the ions in accordance with mobility of the ions. The ion detection section detects the ion which passes through the ion separation section. The ionization section includes a reaction chamber and an electron emission element. A sample is introduced to the reaction chamber. The electron emission element emits an electron to the reaction chamber.
    Type: Application
    Filed: March 22, 2019
    Publication date: October 3, 2019
    Inventors: SHOHEI KOMARU, FUMIAKI SUGIMORI, TADASHI IWAMATSU, CHIKA HIRAKAWA, MAI TAKASAKI