Abstract: The present invention presents an anti-meta trap (AMT) circuit for maintaining the data integrity of transmitted bit data in various applications. The anti-meta trap (AMT) circuit implement bit data integrity checks to prevent bit data from being misinterpreted at the bit level, that is, from being sampled at a data transition state. The invention also presents an anti-meta circuit combined with an auto-synchronization circuit to synchronize the phase of complete, bit-data verified cells, e.g., ATM data cells. The combined AMT-ASC is therefore able to verify the integrity of the data at the bit level, and synchronizing fixed-length data cells.