Patents by Inventor Chin-te Lin

Chin-te Lin has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11990167
    Abstract: A semiconductor device and a method of forming the same are provided. The method includes forming a bottom electrode layer over a substrate. A magnetic tunnel junction (MTJ) layers are formed over the bottom electrode layer. A top electrode layer is formed over the MTJ layers. The top electrode layer is patterned. After patterning the top electrode layer, one or more process cycles are performed on the MTJ layers and the bottom electrode layer. A patterned top electrode layer, patterned MTJ layers and a patterned bottom electrode layer form MTJ structures. Each of the one or more process cycles includes performing an etching process on the MTJ layers and the bottom electrode layer for a first duration and performing a magnetic treatment on the MTJ layers and the bottom electrode layer for a second duration.
    Type: Grant
    Filed: June 21, 2021
    Date of Patent: May 21, 2024
    Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
    Inventors: Bo-Jhih Shen, Kuang-I Liu, Joung-Wei Liou, Jinn-Kwei Liang, Yi-Wei Chiu, Chin-Hsing Lin, Li-Te Hsu, Han-Ting Tsai, Cheng-Yi Wu, Shih-Ho Lin
  • Publication number: 20240151707
    Abstract: A fabric feature predicting method includes following operations: measuring multiple first fabrics to generate multiple first fabric actual feature value groups; storing the first fabric actual feature value groups and multiple first fabric information groups of the first fabrics; selecting multiple third fabrics from the first fabrics according to a second fabric information group of a second fabric; generating at least one equation according to multiple third fabric actual feature value groups of the third fabrics and multiple third fabric information groups of the third fabrics; generating a second fabric predicted feature value group of the second fabric according to the at least one equation and the second fabric information group. The first fabric actual feature value groups include the third fabric actual feature value groups. The first fabric information groups include the third fabric information groups.
    Type: Application
    Filed: November 2, 2023
    Publication date: May 9, 2024
    Inventors: Hung-Yu LIN, Pei-Te SHEN, Chin-Lun CHU, Tzu-Yu CHIU, Yu-Sian CIOU
  • Patent number: 11972562
    Abstract: A method for determining a plant growth curve includes obtaining color images and depth images of a plant to be detected at different time points, performing alignment processing on each color image and each depth image to obtain an alignment image, detecting the color image through a pre-trained target detection model to obtain a target bounding box, calculating an area ratio of the target bounding box in the color image, determining a depth value of all pixel points in the target boundary frame according to the aligned image, performing denoising processing on each depth value to obtain a target depth value, generating a first growth curve of the plant to be detected according to the target depth values and corresponding time points, and generating a second growth curve of the plant to be detected according to the area ratios and the corresponding time points.
    Type: Grant
    Filed: January 7, 2022
    Date of Patent: April 30, 2024
    Assignee: HON HAI PRECISION INDUSTRY CO., LTD.
    Inventors: Chih-Te Lu, Chin-Pin Kuo, Tzu-Chen Lin
  • Publication number: 20240125776
    Abstract: Provided herein are encoded microcarriers for analyte detection in multiplex assays. The microcarriers are encoded with an analog code for identification and comprise a capture agent for analyte detection and a substantially transparent magnetic polymer. The analog code is generated by a two-dimensional shape of a substantially non-transparent layer. Also provided are methods of making the encoded microcarriers disclosed herein. Further provided are methods and kits for conducting a multiplex assay using the microcarriers described herein.
    Type: Application
    Filed: November 21, 2023
    Publication date: April 18, 2024
    Applicant: Plexbio Co., Ltd.
    Inventors: Dean TSAO, Chin-Shiou HUANG, Cheng-Tse LIN, Chien-Te WU, FengKan LU
  • Patent number: 11954875
    Abstract: A method for determining a height of a plant, an electronic device, and a storage medium are disclosed. In the method, a target image is obtained by mapping an obtained color image with an obtained depth image. The electronic device processes the color image by using a pre-trained mobilenet-ssd network, obtains a detection box appearance of the plant, and extracts target contours of the plant to be detected from the detection box. The electronic device determines a depth value of each of pixel points in the target contour according to the target image. Target depth values are obtained by performing a de-noising on depth values of the pixel points, and a height of the plant to be detected is determined according to the target depth value. The method improves accuracy of height determination of a plant.
    Type: Grant
    Filed: January 10, 2022
    Date of Patent: April 9, 2024
    Assignee: HON HAI PRECISION INDUSTRY CO., LTD.
    Inventors: Tzu-Chen Lin, Chih-Te Lu, Chin-Pin Kuo
  • Patent number: 11935894
    Abstract: An integrated circuit device includes a device layer having devices spaced in accordance with a predetermined device pitch, a first metal interconnection layer disposed above the device layer and coupled to the device layer, and a second metal interconnection layer disposed above the first metal interconnection layer and coupled to the first metal interconnection layer through a first via layer. The second metal interconnection layer has metal lines spaced in accordance with a predetermined metal line pitch, and a ratio of the predetermined metal line pitch to predetermined device pitch is less than 1.
    Type: Grant
    Filed: November 4, 2022
    Date of Patent: March 19, 2024
    Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
    Inventors: Fong-yuan Chang, Chun-Chen Chen, Po-Hsiang Huang, Lee-Chung Lu, Chung-Te Lin, Jerry Chang Jui Kao, Sheng-Hsiung Chen, Chin-Chou Liu
  • Patent number: 9956661
    Abstract: A feedback control numerical machine tool and a method thereof are provided. The machine tool includes at least two spindles, an acoustic frequency detecting module, at least two spindle position detecting modules, and a control module. The spindles machine a workpiece. The acoustic frequency detecting module detects an acoustic frequency of the spindles when machining the workpiece. The spindle position detecting modules detects position information of the spindles when machining the workpiece. The control module acquires the acoustic frequency and the position information of the spindles, monitors whether any of the spindles chatters according to the acoustic frequency of the spindles, and performs chattering avoidance to the spindle that chatters according to the position information of the spindles. As such, the present disclosure performs chattering monitoring to a plurality of spindles and avoids the chattering immediately.
    Type: Grant
    Filed: December 24, 2014
    Date of Patent: May 1, 2018
    Assignee: Industrial Technology Research Institute
    Inventors: Tsung-Ling Hwang, Tzuo-Liang Luo, Chin-Te Lin, Shuo-Peng Liang, Ta-Jen Peng
  • Patent number: 9833868
    Abstract: A chatter avoidance method and device is provided, including steps of: providing a stable operating condition plot; partially removing a first layer of a workpiece with a predetermined first removal depth according to a safe removal depth of the stable operating condition plot and sensing a chatter caused by the removal operation; if no chatter is sensed, completing the removal operation, otherwise, continuing to partially remove the first layer with a second removal depth less than the predetermined first removal depth; and determining a minimum removal depth according to the removal operation, and removing a last layer of the workpiece with a last removal depth less than or equal to the minimum removal depth, allowing the workpiece to have a target thickness. The disclosure prevents a chatter from continuously occurring without requiring a shut-down and thereby maintains a desired production rate.
    Type: Grant
    Filed: December 16, 2015
    Date of Patent: December 5, 2017
    Assignee: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
    Inventors: Tsung-Ling Hwang, Chin-Te Lin, Shuo-Peng Liang, Ta-Jen Peng, Jen-Ji Wang, Tzuo-Liang Luo
  • Publication number: 20170100810
    Abstract: A chatter avoidance method and device is provided, including steps of: providing a stable operating condition plot; partially removing a first layer of a workpiece with a predetermined first removal depth according to a safe removal depth of the stable operating condition plot and sensing a chatter caused by the removal operation; if no chatter is sensed, completing the removal operation, otherwise, continuing to partially remove the first layer with a second removal depth less than the predetermined first removal depth; and determining a minimum removal depth according to the removal operation, and removing a last layer of the workpiece with a last removal depth less than or equal to the minimum removal depth, allowing the workpiece to have a target thickness. The disclosure prevents a chatter from continuously occurring without requiring a shut-down and thereby maintains a desired production rate.
    Type: Application
    Filed: December 16, 2015
    Publication date: April 13, 2017
    Applicant: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
    Inventors: Tsung-Ling HWANG, Chin-Te LIN, Shuo-Peng LIANG, Ta-Jen PENG, Jen-Ji WANG, Tzuo-Liang LUO
  • Publication number: 20170060116
    Abstract: A machining path modification method includes the following steps: analyzing the machining path of a machining program to decide whether any point of the machining path is an avoidant point; obtaining an abnormal point of the machining path; and if the abnormal point exists, modifying the machining program to add an abnormality avoidant path on the avoidant point of the machining path.
    Type: Application
    Filed: December 8, 2015
    Publication date: March 2, 2017
    Applicant: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
    Inventors: Shu-Chung LIAO, Ta-Jen PENG, Chin-Te LIN, Ci-Rong HUANG
  • Publication number: 20160144474
    Abstract: A feedback control numerical machine tool and a method thereof are provided. The machine tool includes at least two spindles, an acoustic frequency detecting module, at least two spindle position detecting modules, and a control module. The spindles machine a workpiece. The acoustic frequency detecting module detects an acoustic frequency of the spindles when machining the workpiece. The spindle position detecting modules detects position information of the spindles when machining the workpiece. The control module acquires the acoustic frequency and the position information of the spindles, monitors whether any of the spindles chatters according to the acoustic frequency of the spindles, and performs chattering avoidance to the spindle that chatters according to the position information of the spindles. As such, the present disclosure performs chattering monitoring to a plurality of spindles and avoids the chattering immediately.
    Type: Application
    Filed: December 24, 2014
    Publication date: May 26, 2016
    Applicant: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
    Inventors: Tsung-Ling Hwang, Tzuo-Liang Luo, Chin-Te Lin, Shuo-Peng Liang, Ta-Jen Peng
  • Publication number: 20150294034
    Abstract: A machine tool design method includes: receiving a finite element model of tool-spindle system including a cutting tool, a working spindle speed range, and a target cutting depth; providing a simplified finite element model of main frames of machine tool and initializing its configuration parameters including an equivalent stiffness and an equivalent mass; combining the simplified finite element model of main frames of machine tool with the finite element model of tool-spindle system to construct an equivalent machine tool model; according to a response of the configuration parameters, proceeding a cutting stability prediction of the equivalent machine tool model, and computing an objective function value based on a predicted result; and determining whether the objective function value meets a preset design requirement, if yes, employing the configuration parameters to be references to design a machine tool, if not, updating the configuration parameters and proceeding the cutting stability prediction again.
    Type: Application
    Filed: October 30, 2014
    Publication date: October 15, 2015
    Applicant: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
    Inventors: Chien-Chih Liao, Chin-Te Lin, Pei-Yin Chen, Tzuo-Liang Luo
  • Patent number: 7341042
    Abstract: A rotary positive displacement control system and apparatus includes a transmission assembly, at least a compression assembly and buffer assembly, and an expansion assembly, the buffer assembly disposed between the compression and expansion assembly. The compression assembly includes multiple compression rotors with lobes intermeshing with each other, and the expansion assembly including expansion rotors with lobes intermeshing with each other. An intake and exhaust port respectively located at the compression assembly and expansion assembly. The buffer assembly has a buffer chamber being able to efficiently lead compressed gases to the expansion assembly; meanwhile, residual gases can be discharged from a first and second exhaust slots both disposed on the expansion assembly.
    Type: Grant
    Filed: October 25, 2006
    Date of Patent: March 11, 2008
    Assignee: Liung Feng Industrial Co., Ltd.
    Inventors: Tien-tung Chung, Heng-i Lin, Tsang-lin Hsu, Chin-te Lin